{"id":"https://openalex.org/W4200275773","doi":"https://doi.org/10.1109/lats53581.2021.9651798","title":"Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study","display_name":"Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study","publication_year":2021,"publication_date":"2021-10-27","ids":{"openalex":"https://openalex.org/W4200275773","doi":"https://doi.org/10.1109/lats53581.2021.9651798"},"language":"en","primary_location":{"id":"doi:10.1109/lats53581.2021.9651798","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats53581.2021.9651798","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 22nd Latin American Test Symposium (LATS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064020712","display_name":"Bernardo Borges Sandoval","orcid":"https://orcid.org/0000-0001-5769-2974"},"institutions":[{"id":"https://openalex.org/I4104125","display_name":"Universidade Federal de Santa Catarina","ror":"https://ror.org/041akq887","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Bernardo Borges Sandoval","raw_affiliation_strings":["Universidade Federal de Santa Catarina (UFSC),Departamento de Inform\u00e1tica e Estat\u00edstica"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal de Santa Catarina (UFSC),Departamento de Inform\u00e1tica e Estat\u00edstica","institution_ids":["https://openalex.org/I4104125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001630532","display_name":"Leonardo H. Brendler","orcid":"https://orcid.org/0000-0002-8055-9597"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]},{"id":"https://openalex.org/I4210147991","display_name":"Instituto de Informaci\u00f3n Cient\u00ed\ufb01ca y Tecnol\u00f3gica","ror":"https://ror.org/05m8k7t58","country_code":"CU","type":"facility","lineage":["https://openalex.org/I4210147991"]}],"countries":["BR","CU"],"is_corresponding":false,"raw_author_name":"Leonardo Heitich Brendler","raw_affiliation_strings":["Instituto de Informática, PGMICRO/PPGC - Universidade Federal do Rio Grande do Sul (UFRGS)","Instituto de Inform&#x00E1"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Informática, PGMICRO/PPGC - Universidade Federal do Rio Grande do Sul (UFRGS)","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Instituto de Inform&#x00E1","institution_ids":["https://openalex.org/I4210147991"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004138848","display_name":"Alexandra L. Zimpeck","orcid":"https://orcid.org/0000-0002-3583-1002"},"institutions":[{"id":"https://openalex.org/I110676245","display_name":"Universidade Cat\u00f3lica de Pelotas","ror":"https://ror.org/0376myh60","country_code":"BR","type":"education","lineage":["https://openalex.org/I110676245"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Alexandra L. Zimpeck","raw_affiliation_strings":["Centro de Ciências Sociais e Tecnológicas - Universidade Católica de Pelotas (UCPel)","Centro de Ci&#x00EA","lica de Pelotas (UCPel)","ncias Sociais e Tecnol&#x00F3"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro de Ciências Sociais e Tecnológicas - Universidade Católica de Pelotas (UCPel)","institution_ids":["https://openalex.org/I110676245"]},{"raw_affiliation_string":"Centro de Ci&#x00EA","institution_ids":[]},{"raw_affiliation_string":"lica de Pelotas (UCPel)","institution_ids":["https://openalex.org/I110676245"]},{"raw_affiliation_string":"ncias Sociais e Tecnol&#x00F3","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]},{"id":"https://openalex.org/I4210147991","display_name":"Instituto de Informaci\u00f3n Cient\u00ed\ufb01ca y Tecnol\u00f3gica","ror":"https://ror.org/05m8k7t58","country_code":"CU","type":"facility","lineage":["https://openalex.org/I4210147991"]}],"countries":["BR","CU"],"is_corresponding":false,"raw_author_name":"Fernanda L. Kastensmidt","raw_affiliation_strings":["Instituto de Informática, PGMICRO/PPGC - Universidade Federal do Rio Grande do Sul (UFRGS)","Instituto de Inform&#x00E1"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Informática, PGMICRO/PPGC - Universidade Federal do Rio Grande do Sul (UFRGS)","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Instituto de Inform&#x00E1","institution_ids":["https://openalex.org/I4210147991"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108043721","display_name":"Ricardo Reis","orcid":"https://orcid.org/0000-0001-5781-5858"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]},{"id":"https://openalex.org/I4210147991","display_name":"Instituto de Informaci\u00f3n Cient\u00ed\ufb01ca y Tecnol\u00f3gica","ror":"https://ror.org/05m8k7t58","country_code":"CU","type":"facility","lineage":["https://openalex.org/I4210147991"]}],"countries":["BR","CU"],"is_corresponding":false,"raw_author_name":"Ricardo Reis","raw_affiliation_strings":["Instituto de Informática, PGMICRO/PPGC - Universidade Federal do Rio Grande do Sul (UFRGS)","Instituto de Inform&#x00E1"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Informática, PGMICRO/PPGC - Universidade Federal do Rio Grande do Sul (UFRGS)","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Instituto de Inform&#x00E1","institution_ids":["https://openalex.org/I4210147991"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016825373","display_name":"Cristina Meinhardt","orcid":"https://orcid.org/0000-0003-1088-1000"},"institutions":[{"id":"https://openalex.org/I4104125","display_name":"Universidade Federal de Santa Catarina","ror":"https://ror.org/041akq887","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Cristina Meinhardt","raw_affiliation_strings":["Universidade Federal de Santa Catarina (UFSC),Departamento de Inform\u00e1tica e Estat\u00edstica"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal de Santa Catarina (UFSC),Departamento de Inform\u00e1tica e Estat\u00edstica","institution_ids":["https://openalex.org/I4104125"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.407,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.54572768,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.827778160572052},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6108377575874329},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5843281745910645},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5784772634506226},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5201747417449951},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4702519178390503},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4122697114944458},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3902493417263031},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3441894054412842},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24439066648483276}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.827778160572052},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6108377575874329},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5843281745910645},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5784772634506226},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5201747417449951},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4702519178390503},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4122697114944458},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3902493417263031},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3441894054412842},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24439066648483276},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lats53581.2021.9651798","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lats53581.2021.9651798","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 22nd Latin American Test Symposium (LATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322025","display_name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","ror":"https://ror.org/03swz6y49"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1500230652","https://openalex.org/W2002862525","https://openalex.org/W2030501553","https://openalex.org/W2046741141","https://openalex.org/W2103902557","https://openalex.org/W2138775943","https://openalex.org/W2150025103","https://openalex.org/W2160451204","https://openalex.org/W2346205343","https://openalex.org/W2884418067","https://openalex.org/W2894750213","https://openalex.org/W2975476159","https://openalex.org/W3095736041","https://openalex.org/W3147974605","https://openalex.org/W3175203936"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2170979950","https://openalex.org/W1900707063","https://openalex.org/W2588941787"],"abstract_inverted_index":{"Radiation":[0],"effects":[1,80],"still":[2],"present":[3],"a":[4,21,40,84],"challenge":[5],"even":[6],"with":[7],"the":[8,12,25,28,32,36,44,64,97,101,138,148,165,173,176,184,189,195],"increased":[9],"robustness":[10,38,131,178,196],"of":[11,18,31,71,78,83,137,169],"multigate":[13],"devices.":[14],"The":[15,122,135,151],"higher":[16],"density":[17],"devices":[19],"in":[20,87,172,188],"small":[22],"area":[23],"and":[24,128],"reduction":[26],"on":[27,43,81,112,147],"node":[29],"capacitance":[30],"trend":[33],"technologies":[34],"keep":[35],"radiation":[37,79,105,130],"evaluation":[39],"key":[41],"parameter":[42],"circuit":[45,65,102],"design,":[46],"mainly":[47],"targeting":[48],"aerospace":[49],"applications.":[50],"These":[51],"applications":[52],"may":[53],"also":[54],"demand":[55],"power-efficient":[56],"design.":[57],"Thus,":[58],"it":[59],"is":[60],"relevant":[61],"to":[62,94,104,119,161,198],"consider":[63],"behavior":[66],"at":[67],"different":[68,108],"voltage":[69],"levels":[70],"operation.":[72],"This":[73],"work":[74],"provides":[75],"an":[76],"analysis":[77],"variations":[82],"circuit-level":[85],"benchmark":[86],"7":[88],"nm":[89],"FinFET":[90],"device":[91],"technology,":[92],"intending":[93],"evaluate":[95],"how":[96],"gate":[98,156,167,171],"mapping":[99,157],"affects":[100],"susceptibility":[103],"faults.":[106],"Five":[107],"circuits":[109,127,139],"were":[110,133],"analyzed":[111],"supply":[113],"voltages":[114],"ranging":[115],"from":[116],"0.7":[117],"V":[118],"0.4":[120],"V.":[121],"LETth":[123],"for":[124],"all":[125],"five":[126],"their":[129],"ranking":[132],"determined.":[134],"operation":[136],"below":[140],"0.5V":[141],"introduces":[142],"over":[143,197],"75%":[144],"more":[145],"sensitivity":[146],"evaluated":[149],"circuits.":[150],"results":[152],"show":[153],"that":[154],"exploring":[155,183],"can":[158,193],"be":[159],"adopted":[160],"improve":[162,194],"robustness.":[163],"Adopting":[164],"NAND2":[166],"instead":[168],"NOR2":[170],"output":[174,177],"improves":[175],"by":[179],"about":[180],"38.6%.":[181],"Moreover,":[182],"transistor":[185],"sizing":[186],"only":[187],"most":[190],"sensitive":[191],"gates":[192],"69%.":[199]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}