{"id":"https://openalex.org/W4207074682","doi":"https://doi.org/10.1109/jssc.2022.3141782","title":"A Low-Jitter and Low-Fractional-Spur Ring-DCO-Based Fractional-<i>N</i> Digital PLL Using a DTC\u2019s Second-/Third-Order Nonlinearity Cancellation and a Probability-Density-Shaping \u0394\u03a3M","display_name":"A Low-Jitter and Low-Fractional-Spur Ring-DCO-Based Fractional-<i>N</i> Digital PLL Using a DTC\u2019s Second-/Third-Order Nonlinearity Cancellation and a Probability-Density-Shaping \u0394\u03a3M","publication_year":2022,"publication_date":"2022-01-24","ids":{"openalex":"https://openalex.org/W4207074682","doi":"https://doi.org/10.1109/jssc.2022.3141782"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2022.3141782","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2022.3141782","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028702589","display_name":"Chanwoong Hwang","orcid":"https://orcid.org/0000-0001-6062-9167"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chanwoong Hwang","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-6062-9167","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056835403","display_name":"Hangi Park","orcid":"https://orcid.org/0000-0003-3630-8720"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hangi Park","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-3630-8720","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068994388","display_name":"Yongsun Lee","orcid":"https://orcid.org/0000-0003-0654-9363"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yongsun Lee","raw_affiliation_strings":["Samsung Electronics, Hwaseong, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-0654-9363","affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029028989","display_name":"Taeho Seong","orcid":"https://orcid.org/0000-0002-3181-2744"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taeho Seong","raw_affiliation_strings":["School of Electrical Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-3181-2744","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004599468","display_name":"Jaehyouk Choi","orcid":"https://orcid.org/0000-0002-3055-8684"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyouk Choi","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-3055-8684","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.4981,"has_fulltext":false,"cited_by_count":61,"citation_normalized_percentile":{"value":0.9369945,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"57","issue":"9","first_page":"2841","last_page":"2855"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dither","display_name":"Dither","score":0.6301376223564148},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.6285318732261658},{"id":"https://openalex.org/keywords/dpll-algorithm","display_name":"DPLL algorithm","score":0.6282657384872437},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.4895668923854828},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4507099688053131},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.44563084840774536},{"id":"https://openalex.org/keywords/quantization","display_name":"Quantization (signal processing)","score":0.4369432330131531},{"id":"https://openalex.org/keywords/discrete-mathematics","display_name":"Discrete mathematics","score":0.4137808680534363},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3529273271560669},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2379574179649353},{"id":"https://openalex.org/keywords/noise-shaping","display_name":"Noise shaping","score":0.18797874450683594},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14692771434783936},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12129789590835571},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09612676501274109}],"concepts":[{"id":"https://openalex.org/C70451592","wikidata":"https://www.wikidata.org/wiki/Q376493","display_name":"Dither","level":3,"score":0.6301376223564148},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.6285318732261658},{"id":"https://openalex.org/C143936061","wikidata":"https://www.wikidata.org/wiki/Q2030088","display_name":"DPLL algorithm","level":4,"score":0.6282657384872437},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.4895668923854828},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4507099688053131},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.44563084840774536},{"id":"https://openalex.org/C28855332","wikidata":"https://www.wikidata.org/wiki/Q198099","display_name":"Quantization (signal processing)","level":2,"score":0.4369432330131531},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.4137808680534363},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3529273271560669},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2379574179649353},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.18797874450683594},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14692771434783936},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12129789590835571},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09612676501274109},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/jssc.2022.3141782","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2022.3141782","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:s-space.snu.ac.kr:10371/199377","is_oa":false,"landing_page_url":"https://hdl.handle.net/10371/199377","pdf_url":null,"source":{"id":"https://openalex.org/S4306401345","display_name":"Seoul National University Open Repository (Seoul National University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139264467","host_organization_name":"Seoul National University","host_organization_lineage":["https://openalex.org/I139264467"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"},{"id":"pmh:oai:scholarworks.unist.ac.kr:201301/59231","is_oa":false,"landing_page_url":"https://scholarworks.unist.ac.kr/handle/201301/59231","pdf_url":null,"source":{"id":"https://openalex.org/S4306401118","display_name":"Scholarworks@UNIST (Ulsan National Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48566637","host_organization_name":"Ulsan National Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I48566637"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"ARTICLE"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3651609339","display_name":null,"funder_award_id":"2020R1A2C2004260","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G5376321029","display_name":null,"funder_award_id":"SRFC-IT1702-51","funder_id":"https://openalex.org/F4320332195","funder_display_name":"Samsung"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1948778041","https://openalex.org/W2030258400","https://openalex.org/W2106319312","https://openalex.org/W2120500930","https://openalex.org/W2128817857","https://openalex.org/W2142610168","https://openalex.org/W2144581882","https://openalex.org/W2150912637","https://openalex.org/W2170746474","https://openalex.org/W2410273639","https://openalex.org/W2605666562","https://openalex.org/W2768588921","https://openalex.org/W2797437671","https://openalex.org/W2800076889","https://openalex.org/W2952154040","https://openalex.org/W2960457490","https://openalex.org/W2972695498","https://openalex.org/W2974680395","https://openalex.org/W2984668191","https://openalex.org/W2996914186","https://openalex.org/W2996929733","https://openalex.org/W3090442715","https://openalex.org/W3108633694","https://openalex.org/W3139122155","https://openalex.org/W3154592321","https://openalex.org/W4229595843","https://openalex.org/W4240267682","https://openalex.org/W6749180199","https://openalex.org/W6791229067","https://openalex.org/W6791518388"],"related_works":["https://openalex.org/W1488060887","https://openalex.org/W2380467267","https://openalex.org/W1980525453","https://openalex.org/W2325206724","https://openalex.org/W2059960378","https://openalex.org/W2098358062","https://openalex.org/W2103754166","https://openalex.org/W2139484866","https://openalex.org/W2943997861","https://openalex.org/W1994059163"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,38,61,124,131],"low-jitter":[4],"and":[5,121,127,141,150],"low-spur,":[6],"fractional-$N$ring-oscillator-based":[7],"digital":[8],"phase-locked":[9],"loop":[10],"(RO-DPLL).":[11],"First,":[12],"to":[13,36,48,85,102],"suppress":[14,81],"fractional":[15,82,143],"spurs,":[16],"the":[17,27,31,53,72,76,86,93,104,110,137,142],"probability-density-shaping":[18],"delta\u2013sigma":[19],"modulator":[20],"(PDS-$\\Delta":[21],"\\Sigma":[22,33,78],"\\text{M}$)":[23],"is":[24,100],"presented.":[25],"Since":[26],"output":[28],"codes":[29],"of":[30,52,65,88],"PDS-$\\Delta":[32,77],"\\text{M}$are":[34],"designed":[35],"have":[37,45],"time-invariant":[39],"probability":[40],"density":[41],"function":[42],"(PDF),":[43],"they":[44],"spur":[46,144],"immunity":[47],"any":[49],"nonlinearity":[50,96],"(NL)":[51],"digital-to-time":[54],"converter":[55],"(DTC).":[56],"In":[57],"addition,":[58],"by":[59],"using":[60],"special":[62],"dither":[63],"consisting":[64],"uniform":[66],"random":[67],"numbers":[68],"(URNs)":[69],"based":[70],"on":[71],"dithered":[73],"quantization":[74,105],"theorems,":[75],"\\text{M}$can":[79],"also":[80],"spurs":[83],"due":[84],"NL":[87],"other":[89],"loop-building":[90],"circuits.":[91],"Second,":[92],"DTC\u2019s":[94],"second-/third-order":[95],"cancellation":[97],"(DST-NLC)":[98],"technique":[99],"presented":[101],"reduce":[103],"noise":[106],"(Q-noise),":[107],"thereby":[108],"reducing":[109],"rms":[111,139],"jitter.":[112],"The":[113],"proposed":[114],"RO-DPLL":[115],"was":[116],"fabricated":[117],"in":[118],"65-nm":[119],"CMOS,":[120],"it":[122],"used":[123],"0.146-mm2silicon":[125],"area":[126],"9.27-mW":[128],"power.":[129],"At":[130],"near-integer-$N$frequency,":[132],"i.e.,":[133],"near":[134],"5.3":[135],"GHz,":[136],"measured":[138],"jitter":[140],"were":[145],"less":[146],"than":[147],"365":[148],"fs":[149],"\u221263":[151],"dBc,":[152],"respectively.":[153]},"counts_by_year":[{"year":2026,"cited_by_count":14},{"year":2025,"cited_by_count":19},{"year":2024,"cited_by_count":17},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":2}],"updated_date":"2026-08-11T07:18:39.950985","created_date":"2025-10-10T00:00:00"}