{"id":"https://openalex.org/W4415821555","doi":"https://doi.org/10.1109/itc58126.2025.00082","title":"Test Bin Entitlement: Yield Outlier Detection using Die Area and LLM based Bin-Grouping","display_name":"Test Bin Entitlement: Yield Outlier Detection using Die Area and LLM based Bin-Grouping","publication_year":2025,"publication_date":"2025-09-20","ids":{"openalex":"https://openalex.org/W4415821555","doi":"https://doi.org/10.1109/itc58126.2025.00082"},"language":null,"primary_location":{"id":"doi:10.1109/itc58126.2025.00082","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc58126.2025.00082","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5120235678","display_name":"Ragad Al-Huq","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104401","display_name":"Austin Independent School District","ror":"https://ror.org/01g9rp025","country_code":"US","type":"education","lineage":["https://openalex.org/I4210104401"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ragad Al-Huq","raw_affiliation_strings":["Yield Entitlement and Systems AMD,Austin,USA"],"affiliations":[{"raw_affiliation_string":"Yield Entitlement and Systems AMD,Austin,USA","institution_ids":["https://openalex.org/I4210104401"]}]},{"author_position":"last","author":{"id":null,"display_name":"Yuegui Zheng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104401","display_name":"Austin Independent School District","ror":"https://ror.org/01g9rp025","country_code":"US","type":"education","lineage":["https://openalex.org/I4210104401"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuegui Zheng","raw_affiliation_strings":["Yield Entitlement and Systems AMD,Austin,USA"],"affiliations":[{"raw_affiliation_string":"Yield Entitlement and Systems AMD,Austin,USA","institution_ids":["https://openalex.org/I4210104401"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5120235678"],"corresponding_institution_ids":["https://openalex.org/I4210104401"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.33992583,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"530","last_page":"533"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.46380001306533813,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.46380001306533813,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.3384999930858612,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.052799999713897705,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bin","display_name":"Bin","score":0.8198000192642212},{"id":"https://openalex.org/keywords/entitlement","display_name":"Entitlement (fair division)","score":0.5972999930381775},{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.5777999758720398},{"id":"https://openalex.org/keywords/die","display_name":"Die (integrated circuit)","score":0.5746999979019165},{"id":"https://openalex.org/keywords/sort","display_name":"sort","score":0.5674999952316284},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.5267000198364258},{"id":"https://openalex.org/keywords/box-plot","display_name":"Box plot","score":0.37459999322891235}],"concepts":[{"id":"https://openalex.org/C156273044","wikidata":"https://www.wikidata.org/wiki/Q4913766","display_name":"Bin","level":2,"score":0.8198000192642212},{"id":"https://openalex.org/C94982200","wikidata":"https://www.wikidata.org/wiki/Q5380545","display_name":"Entitlement (fair division)","level":2,"score":0.5972999930381775},{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.5777999758720398},{"id":"https://openalex.org/C111106434","wikidata":"https://www.wikidata.org/wiki/Q1072430","display_name":"Die (integrated circuit)","level":2,"score":0.5746999979019165},{"id":"https://openalex.org/C88548561","wikidata":"https://www.wikidata.org/wiki/Q347599","display_name":"sort","level":2,"score":0.5674999952316284},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.5267000198364258},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48590001463890076},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40299999713897705},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.39149999618530273},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3788999915122986},{"id":"https://openalex.org/C92560755","wikidata":"https://www.wikidata.org/wiki/Q895726","display_name":"Box plot","level":2,"score":0.37459999322891235},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.374099999666214},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.3691999912261963},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.3671000003814697},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.367000013589859},{"id":"https://openalex.org/C44445679","wikidata":"https://www.wikidata.org/wiki/Q2538844","display_name":"Wafer testing","level":3,"score":0.3181000053882599},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.30070000886917114},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.2782999873161316},{"id":"https://openalex.org/C2778029271","wikidata":"https://www.wikidata.org/wiki/Q5421931","display_name":"Extension (predicate logic)","level":2,"score":0.27459999918937683},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2705000042915344},{"id":"https://openalex.org/C148220186","wikidata":"https://www.wikidata.org/wiki/Q7111912","display_name":"Outcome (game theory)","level":2,"score":0.26010000705718994},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.2549000084400177}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc58126.2025.00082","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc58126.2025.00082","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2020286945","https://openalex.org/W2026037646","https://openalex.org/W2069948346","https://openalex.org/W2081916734","https://openalex.org/W2110621778","https://openalex.org/W2121331887","https://openalex.org/W2153631308","https://openalex.org/W2158959212","https://openalex.org/W2161229078","https://openalex.org/W4408565422"],"related_works":[],"abstract_inverted_index":{"Yield":[0],"entitlement":[1,41],"for":[2,27,65],"products":[3,58,94],"with":[4,59],"different":[5],"die":[6,48,70],"areas":[7],"is":[8,18],"well":[9],"understood":[10],"in":[11],"relation":[12],"to":[13,22,55,90],"defect":[14],"density.":[15],"However,":[16],"it":[17],"not":[19],"as":[20],"straightforward":[21],"determine":[23],"the":[24,37,44],"expected":[25],"loss":[26],"each":[28],"failure":[29,63,67],"mechanism":[30],"that":[31],"limits":[32],"yield.":[33],"This":[34,50],"can":[35,95],"hinder":[36],"attainment":[38],"of":[39,46],"yield":[40],"and":[42,72,84],"increase":[43],"cost":[45],"a":[47,53],"overtime.":[49],"paper":[51],"provides":[52],"method":[54],"quickly":[56],"identify":[57],"higher":[60],"than":[61],"anticipated":[62],"rates":[64],"all":[66],"modes":[68],"using":[69],"area":[71],"large":[73],"language":[74],"models":[75],"on":[76],"wafer":[77],"sort":[78],"bin":[79],"definitions.":[80],"Both":[81],"simulated":[82],"cases":[83],"actual":[85],"production":[86],"data":[87],"are":[88],"used":[89],"show":[91],"how":[92],"outlier":[93],"be":[96],"easily":[97],"identified.":[98]},"counts_by_year":[],"updated_date":"2026-04-17T18:11:37.981687","created_date":"2025-11-03T00:00:00"}