{"id":"https://openalex.org/W4415821578","doi":"https://doi.org/10.1109/itc58126.2025.00047","title":"Full Enablement of Very-Low Voltage Testing to Deliver Zero Defect Quality Automotive Products","display_name":"Full Enablement of Very-Low Voltage Testing to Deliver Zero Defect Quality Automotive Products","publication_year":2025,"publication_date":"2025-09-20","ids":{"openalex":"https://openalex.org/W4415821578","doi":"https://doi.org/10.1109/itc58126.2025.00047"},"language":null,"primary_location":{"id":"doi:10.1109/itc58126.2025.00047","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc58126.2025.00047","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5120235688","display_name":"Srimaiyee Pentyala","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Srimaiyee Pentyala","raw_affiliation_strings":["NXP Semiconductor,Design Quality,Austin,USA"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductor,Design Quality,Austin,USA","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073710667","display_name":"Stephen Traynor","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stephen Traynor","raw_affiliation_strings":["NXP Semiconductor,Technology Enablement,Austin,USA"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductor,Technology Enablement,Austin,USA","institution_ids":["https://openalex.org/I4210123704"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5120235688"],"corresponding_institution_ids":["https://openalex.org/I4210123704"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.37055137,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"387","last_page":"391"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8137000203132629,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8137000203132629,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.15129999816417694,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.004800000227987766,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.7215999960899353},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5846999883651733},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.5684000253677368},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5667999982833862},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.5400000214576721},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.43050000071525574},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.38339999318122864},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.36980000138282776},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.313400000333786}],"concepts":[{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.7215999960899353},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5846999883651733},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.5684000253677368},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5667999982833862},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.5400000214576721},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5066999793052673},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5012000203132629},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4309000074863434},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.43050000071525574},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.38339999318122864},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.36980000138282776},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.35249999165534973},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3160000145435333},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.313400000333786},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3095000088214874},{"id":"https://openalex.org/C2780791683","wikidata":"https://www.wikidata.org/wiki/Q846785","display_name":"Action (physics)","level":2,"score":0.30649998784065247},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.2978000044822693},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.2937999963760376},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.29179999232292175},{"id":"https://openalex.org/C2983725658","wikidata":"https://www.wikidata.org/wiki/Q7705768","display_name":"Test equipment","level":2,"score":0.2851000130176544},{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.28220000863075256},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.2727000117301941},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.2687999904155731},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.26840001344680786},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.2590000033378601},{"id":"https://openalex.org/C2779665505","wikidata":"https://www.wikidata.org/wiki/Q1780079","display_name":"Power quality","level":3,"score":0.25769999623298645},{"id":"https://openalex.org/C2781106871","wikidata":"https://www.wikidata.org/wiki/Q1029015","display_name":"Overall equipment effectiveness","level":3,"score":0.25440001487731934},{"id":"https://openalex.org/C2779229675","wikidata":"https://www.wikidata.org/wiki/Q445235","display_name":"Time to market","level":2,"score":0.2542000114917755},{"id":"https://openalex.org/C158154518","wikidata":"https://www.wikidata.org/wiki/Q7310970","display_name":"Relevance (law)","level":2,"score":0.251800000667572}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc58126.2025.00047","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc58126.2025.00047","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1868388016","https://openalex.org/W2011433929","https://openalex.org/W2073273733","https://openalex.org/W2100827158","https://openalex.org/W2115908547","https://openalex.org/W2117139377","https://openalex.org/W2123124971","https://openalex.org/W2143656109","https://openalex.org/W2156661581","https://openalex.org/W2168227015"],"related_works":[],"abstract_inverted_index":{"Executing":[0],"scan":[1],"tests":[2,40,144],"at":[3,43,107,134,145],"very-low":[4],"voltage":[5,48,114],"is":[6,36],"a":[7,85,93,123],"long-known":[8],"industry":[9],"best":[10,59],"practice":[11],"to":[12,19,41,62,129,140],"screen":[13],"resistive":[14],"latent":[15],"defects":[16],"and":[17,55,109,137],"contribute":[18],"enabling":[20],"<":[21],"1":[22],"Defective":[23],"Part":[24],"Per":[25],"Million":[26],"(DPPM)":[27],"performance":[28],"for":[29,38],"Automotive":[30],"products.":[31],"To":[32],"be":[33],"effective,":[34],"it":[35],"necessary":[37],"these":[39],"run":[42],"near":[44],"the":[45,51,97,131,143],"intrinsic":[46],"low":[47,113],"capability":[49],"of":[50,112,125,127],"silicon.":[52],"Slowing":[53],"shift":[54],"capture":[56],"clocks":[57],"are":[58,71],"practices":[60],"deployed":[61],"overcome":[63],"Very-Low-Voltage":[64],"(VLV)":[65],"test":[66,132],"timing":[67],"limitations,":[68],"but":[69],"there":[70],"other":[72],"challenges.":[73],"This":[74],"paper":[75],"discusses":[76,92],"two":[77],"activities":[78],"that":[79,101],"enabled":[80],"true":[81],"VLV":[82,108,118,135,146],"testing":[83],"in":[84,96],"single":[86],"digit":[87],"FinFET":[88],"technology.":[89],"The":[90,120],"first":[91],"design":[94,126],"implementation":[95],"General-Purpose":[98],"IO":[99],"pads":[100],"supported":[102],"correct":[103],"signal":[104],"level":[105],"shifting":[106],"avoided":[110],"action":[111],"detect":[115],"circuitry":[116],"during":[117],"testing.":[119],"second":[121],"describes":[122],"series":[124],"experiments":[128],"characterize":[130],"instrumentation":[133],"conditions":[136],"optimize":[138],"settings":[139],"robustly":[141],"execute":[142],"conditions.":[147]},"counts_by_year":[],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-11-03T00:00:00"}