{"id":"https://openalex.org/W4404848983","doi":"https://doi.org/10.1109/itc51657.2024.00055","title":"Digital Scan and ATPG for Analog Circuits","display_name":"Digital Scan and ATPG for Analog Circuits","publication_year":2024,"publication_date":"2024-11-03","ids":{"openalex":"https://openalex.org/W4404848983","doi":"https://doi.org/10.1109/itc51657.2024.00055"},"language":"en","primary_location":{"id":"doi:10.1109/itc51657.2024.00055","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc51657.2024.00055","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063906167","display_name":"Stephen Sunter","orcid":null},"institutions":[{"id":"https://openalex.org/I2801914806","display_name":"Siemens (Canada)","ror":"https://ror.org/03cpzkh11","country_code":"CA","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I2801914806"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Stephen Sunter","raw_affiliation_strings":["Siemens Digital Industries Software,Ottawa,Canada"],"affiliations":[{"raw_affiliation_string":"Siemens Digital Industries Software,Ottawa,Canada","institution_ids":["https://openalex.org/I2801914806"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068603918","display_name":"Krzysztof Jurga","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Krzysztof Jurga","raw_affiliation_strings":["Siemens Digital Industries Software,Poznan,Poland"],"affiliations":[{"raw_affiliation_string":"Siemens Digital Industries Software,Poznan,Poland","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5063906167"],"corresponding_institution_ids":["https://openalex.org/I2801914806"],"apc_list":null,"apc_paid":null,"fwci":0.4449,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.64958713,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"339","last_page":"347"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9872999787330627,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7744976282119751},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6363376379013062},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4571187496185303},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4494129419326782},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.4440220296382904},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32237744331359863},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21858304738998413},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16675621271133423}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7744976282119751},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6363376379013062},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4571187496185303},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4494129419326782},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.4440220296382904},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32237744331359863},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21858304738998413},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16675621271133423}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc51657.2024.00055","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc51657.2024.00055","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7699999809265137}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1486817281","https://openalex.org/W1924227955","https://openalex.org/W1993765721","https://openalex.org/W2091276370","https://openalex.org/W2107867533","https://openalex.org/W2116080338","https://openalex.org/W2117917559","https://openalex.org/W2156213538","https://openalex.org/W2162231736","https://openalex.org/W2189035499","https://openalex.org/W2735061862","https://openalex.org/W2782226720","https://openalex.org/W2802818882","https://openalex.org/W2967805207","https://openalex.org/W3007644171","https://openalex.org/W3039413211","https://openalex.org/W3048170192","https://openalex.org/W3122148898","https://openalex.org/W3124483665","https://openalex.org/W3125147644","https://openalex.org/W4250742633","https://openalex.org/W4282972846","https://openalex.org/W4399120034","https://openalex.org/W4399143999"],"related_works":["https://openalex.org/W2188538914","https://openalex.org/W2110962837","https://openalex.org/W4235748303","https://openalex.org/W2796521923","https://openalex.org/W1603142061","https://openalex.org/W2139492631","https://openalex.org/W1592696310","https://openalex.org/W2913446198","https://openalex.org/W2296682797","https://openalex.org/W1985839125"],"abstract_inverted_index":{"Scan-based":[0],"automatic":[1,42],"test":[2,43,58],"pattern":[3],"generation":[4],"(ATPG)":[5],"is":[6,16,75],"commonly":[7],"used":[8],"for":[9,19,62,96,125],"\u2018random":[10,97],"logic\u2019":[11],"in":[12,73,157,165],"ICs,":[13],"but":[14],"there":[15],"no":[17],"equivalent":[18],"analog/mixed-signal":[20],"(AMS)":[21],"circuits":[22],"due":[23],"to":[24,154,170],"their":[25],"diversity":[26],"of":[27,55,70,147],"functions,":[28],"stimuli,":[29],"and":[30,57,78,93,103,114,137,151],"responses.":[31],"As":[32],"a":[33,88,126],"result,":[34],"tests":[35,72,107,124],"are":[36],"written":[37],"manually":[38],"on":[39],"the":[40,63,67],"intended":[41],"equipment":[44],"(ATE)":[45],"with":[46],"(possibly":[47],"defective)":[48],"\u2018first":[49],"silicon\u2019":[50],"devices,":[51],"typically":[52,76],"requiring":[53],"months":[54],"effort":[56],"times":[59],"higher":[60,145],"than":[61],"digital":[64,112],"circuitry.":[65],"Proving":[66],"defect":[68],"coverage":[69,146,161],"these":[71],"simulation":[74],"impractical,":[77],"<80%":[79],"when":[80],"it":[81],"can":[82,108,162],"be":[83,109,163],"simulated.":[84],"This":[85],"paper":[86],"describes":[87],"structural,":[89],"scan-based":[90],"design-for-test":[91],"(DfT)":[92],"ATPG":[94],"technique":[95],"analog\u2019":[98],"that":[99,121],"has":[100],"minimal":[101],"area":[102],"performance":[104],"impact.":[105],"The":[106],"applied":[110],"by":[111],"ATE":[113],"IEEE":[115,148],"1687":[116],"(IJTAG)":[117],"networks.":[118],"Results":[119],"show":[120],"automatically":[122],"generated":[123],"4<sup":[127],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[128],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">th</sup>-order":[129],"filter,":[130],"bandgap":[131],"+":[132],"voltage":[133],"regulator,":[134],"8-bit":[135],"DAC,":[136],"industrial":[138],"11-bit":[139],"SAR":[140],"ADC":[141],"achieve":[142],"comparable":[143],"or":[144],"P2427-specified":[149],"shorts":[150],"opens,":[152],"relative":[153],"specification":[155],"tests,":[156],"<1":[158,166],"ms.":[159],"Defect":[160],"simulated":[164],"hour,":[167],"fast":[168],"enough":[169],"verify":[171],"before":[172],"tape-out.":[173]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-12-19T19:40:27.379048","created_date":"2025-10-10T00:00:00"}