{"id":"https://openalex.org/W2763030692","doi":"https://doi.org/10.1109/isvdat.2016.8064851","title":"Guided shifting of test pattern to minimize test time in serial scan","display_name":"Guided shifting of test pattern to minimize test time in serial scan","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2763030692","doi":"https://doi.org/10.1109/isvdat.2016.8064851","mag":"2763030692"},"language":"en","primary_location":{"id":"doi:10.1109/isvdat.2016.8064851","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isvdat.2016.8064851","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://mpra.ub.uni-muenchen.de/73275/1/MPRA_paper_73275.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018584319","display_name":"Jaynarayan Tudu","orcid":"https://orcid.org/0000-0002-0329-3190"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Jaynarayan T Tudu","raw_affiliation_strings":["Computer Sci. & Automation Indian Institute of Science, Bangalore"],"affiliations":[{"raw_affiliation_string":"Computer Sci. & Automation Indian Institute of Science, Bangalore","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078604240","display_name":"Satyadev Ahlawat","orcid":"https://orcid.org/0000-0003-0186-1446"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Satyadev Ahlawat","raw_affiliation_strings":["Computer Sci. & Automation Indian Institute of Science, Bangalore"],"affiliations":[{"raw_affiliation_string":"Computer Sci. & Automation Indian Institute of Science, Bangalore","institution_ids":["https://openalex.org/I59270414"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5018584319"],"corresponding_institution_ids":["https://openalex.org/I59270414"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.25222579,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9776999950408936,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.9049298763275146},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8446862697601318},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6901688575744629},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5726644396781921},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5327064394950867},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.47444307804107666},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.47240394353866577},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.43261927366256714},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.25360023975372314},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2433546781539917},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.12634405493736267},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11211568117141724}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.9049298763275146},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8446862697601318},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6901688575744629},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5726644396781921},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5327064394950867},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.47444307804107666},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.47240394353866577},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.43261927366256714},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.25360023975372314},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2433546781539917},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.12634405493736267},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11211568117141724},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isvdat.2016.8064851","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isvdat.2016.8064851","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","raw_type":"proceedings-article"},{"id":"pmh:oai::73275","is_oa":true,"landing_page_url":null,"pdf_url":"https://mpra.ub.uni-muenchen.de/73275/1/MPRA_paper_73275.pdf","source":{"id":"https://openalex.org/S4306401429","display_name":"ePrints@IISc (Indian Institute of Science)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I59270414","host_organization_name":"Indian Institute of Science Bangalore","host_organization_lineage":["https://openalex.org/I59270414"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference Paper"}],"best_oa_location":{"id":"pmh:oai::73275","is_oa":true,"landing_page_url":null,"pdf_url":"https://mpra.ub.uni-muenchen.de/73275/1/MPRA_paper_73275.pdf","source":{"id":"https://openalex.org/S4306401429","display_name":"ePrints@IISc (Indian Institute of Science)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I59270414","host_organization_name":"Indian Institute of Science Bangalore","host_organization_lineage":["https://openalex.org/I59270414"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference Paper"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2763030692.pdf","grobid_xml":"https://content.openalex.org/works/W2763030692.grobid-xml"},"referenced_works_count":28,"referenced_works":["https://openalex.org/W1595368737","https://openalex.org/W1820769975","https://openalex.org/W2004015493","https://openalex.org/W2025550095","https://openalex.org/W2037587557","https://openalex.org/W2044323788","https://openalex.org/W2056672638","https://openalex.org/W2065838885","https://openalex.org/W2074302528","https://openalex.org/W2096036637","https://openalex.org/W2101900253","https://openalex.org/W2102178242","https://openalex.org/W2104118389","https://openalex.org/W2107154455","https://openalex.org/W2110634061","https://openalex.org/W2119328431","https://openalex.org/W2130149750","https://openalex.org/W2132752566","https://openalex.org/W2136066342","https://openalex.org/W2140868550","https://openalex.org/W2141787096","https://openalex.org/W2149852203","https://openalex.org/W2153336129","https://openalex.org/W2167428133","https://openalex.org/W3147567740","https://openalex.org/W4231945611","https://openalex.org/W6676498741","https://openalex.org/W6792536615"],"related_works":["https://openalex.org/W2789883751","https://openalex.org/W2147986372","https://openalex.org/W1979305473","https://openalex.org/W2274367941","https://openalex.org/W2543176856","https://openalex.org/W2075356617","https://openalex.org/W1974621628","https://openalex.org/W2143881398","https://openalex.org/W2154314512","https://openalex.org/W3088373974"],"abstract_inverted_index":{"Scan":[0],"test":[1,12,34,58,70],"time":[2,96],"has":[3],"always":[4],"been":[5],"one":[6],"of":[7,19,39,54,75],"the":[8,20,28,76,89,93,99],"priority":[9],"issues":[10],"for":[11,52,65],"researchers":[13],"because":[14],"it":[15],"directly":[16],"impact":[17],"cost":[18],"design.":[21],"In":[22],"this":[23],"work":[24],"we":[25],"have":[26,46],"addressed":[27],"issue":[29],"through":[30],"scan":[31,41,55,67,94],"chain":[32,56,68],"and":[33,57,69],"pattern":[35],"reordering.":[36,72],"The":[37,84],"idea":[38],"limited":[40],"shift":[42,95],"is":[43,63],"explored.":[44],"We":[45],"proposed":[47,90],"a":[48],"graph":[49],"theoretical":[50],"framework":[51],"reordering":[53],"pattern.":[59],"Graph":[60],"theoretic":[61],"problem":[62],"formulated":[64,77],"each,":[66],"pattern,":[71],"For":[73],"each":[74],"problems":[78],"corresponding":[79],"approximation":[80],"algorithms":[81],"are":[82],"proposed.":[83],"experimental":[85],"results":[86],"show":[87],"that":[88],"methodology":[91],"reduces":[92],"compared":[97],"to":[98],"ordering":[100],"provided":[101],"by":[102],"atpg":[103],"tool.":[104]},"counts_by_year":[],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}