{"id":"https://openalex.org/W1966811973","doi":"https://doi.org/10.1109/isvdat.2014.6881089","title":"Particle Swarm Optimization guided multi-frequency power-aware System-on-Chip test scheduling using window-based peak power model","display_name":"Particle Swarm Optimization guided multi-frequency power-aware System-on-Chip test scheduling using window-based peak power model","publication_year":2014,"publication_date":"2014-07-01","ids":{"openalex":"https://openalex.org/W1966811973","doi":"https://doi.org/10.1109/isvdat.2014.6881089","mag":"1966811973"},"language":"en","primary_location":{"id":"doi:10.1109/isvdat.2014.6881089","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isvdat.2014.6881089","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"18th International Symposium on VLSI Design and Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030502691","display_name":"Rajit Karmakar","orcid":"https://orcid.org/0000-0001-7346-4955"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Rajit Karmakar","raw_affiliation_strings":["Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India","Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, , India"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]},{"raw_affiliation_string":"Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, , India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040847195","display_name":"Aditya Agarwal","orcid":null},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Aditya Agarwal","raw_affiliation_strings":["Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India","Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, , India"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]},{"raw_affiliation_string":"Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, , India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077947010","display_name":"Santanu Chattopadhyay","orcid":"https://orcid.org/0000-0002-1227-0732"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Santanu Chattopadhyay","raw_affiliation_strings":["Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India","Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, , India"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]},{"raw_affiliation_string":"Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, , India","institution_ids":["https://openalex.org/I145894827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5030502691"],"corresponding_institution_ids":["https://openalex.org/I145894827"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.04674472,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"13","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/particle-swarm-optimization","display_name":"Particle swarm optimization","score":0.7777435779571533},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6206640601158142},{"id":"https://openalex.org/keywords/scheduling","display_name":"Scheduling (production processes)","score":0.5808557271957397},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.535617470741272},{"id":"https://openalex.org/keywords/frequency-scaling","display_name":"Frequency scaling","score":0.4603092670440674},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3566223680973053},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.34593451023101807},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.33450326323509216},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.28180328011512756},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.24298173189163208},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2319912314414978},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09600946307182312}],"concepts":[{"id":"https://openalex.org/C85617194","wikidata":"https://www.wikidata.org/wiki/Q2072794","display_name":"Particle swarm optimization","level":2,"score":0.7777435779571533},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6206640601158142},{"id":"https://openalex.org/C206729178","wikidata":"https://www.wikidata.org/wiki/Q2271896","display_name":"Scheduling (production processes)","level":2,"score":0.5808557271957397},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.535617470741272},{"id":"https://openalex.org/C157742956","wikidata":"https://www.wikidata.org/wiki/Q3237776","display_name":"Frequency scaling","level":3,"score":0.4603092670440674},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3566223680973053},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.34593451023101807},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.33450326323509216},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.28180328011512756},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.24298173189163208},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2319912314414978},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09600946307182312},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isvdat.2014.6881089","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isvdat.2014.6881089","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"18th International Symposium on VLSI Design and Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6100000143051147}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1964792637","https://openalex.org/W2007614219","https://openalex.org/W2081828624","https://openalex.org/W2087146937","https://openalex.org/W2102462902","https://openalex.org/W2121818892","https://openalex.org/W2139318064","https://openalex.org/W2145521711","https://openalex.org/W2150492836","https://openalex.org/W2152195021","https://openalex.org/W2155288938","https://openalex.org/W2162086806","https://openalex.org/W2165642910","https://openalex.org/W2376767409","https://openalex.org/W4231435054","https://openalex.org/W4242912069","https://openalex.org/W6824325771"],"related_works":["https://openalex.org/W1967088250","https://openalex.org/W2054730497","https://openalex.org/W2161125731","https://openalex.org/W2805835013","https://openalex.org/W174337954","https://openalex.org/W2175591235","https://openalex.org/W1508186504","https://openalex.org/W4235874180","https://openalex.org/W1547679562","https://openalex.org/W3097154604"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"multi-frequency":[4,94],"test":[5,58,95,99],"scheduling":[6,59],"strategy":[7,60],"for":[8],"System-on-chip":[9],"(SoC)":[10],"under":[11],"power":[12,23,35,40,50,69,80],"constraint.":[13],"While":[14],"existing":[15],"approaches":[16],"consider":[17],"either":[18],"global":[19,38,78],"peak":[20,39,68,79],"or":[21],"cycle-accurate":[22,49],"model,":[24],"the":[25,34,45],"proposed":[26],"work":[27],"considers":[28],"an":[29],"intermediate":[30],"approach":[31],"to":[32,71],"reduce":[33,72],"overestimation":[36],"of":[37,48],"model":[41,70],"as":[42,44],"well":[43],"computational":[46],"complexity":[47],"model.":[51,81],"A":[52],"Particle":[53],"Swarm":[54],"Optimization":[55],"(PSO)":[56],"guided":[57],"has":[61],"been":[62],"integrated":[63],"with":[64],"our":[65],"new":[66],"window-based":[67],"Test":[73],"Application":[74],"Time":[75],"(TAT)":[76],"over":[77,97],"Experimental":[82],"results":[83],"show":[84],"that":[85],"further":[86],"improvement":[87],"in":[88],"TAT":[89],"can":[90],"be":[91],"achieved":[92],"using":[93],"environment":[96],"single-frequency":[98],"approach.":[100]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}