{"id":"https://openalex.org/W2593197747","doi":"https://doi.org/10.1109/isscc.2017.7870268","title":"4.6 A 1/2.3inch 20Mpixel 3-layer stacked CMOS Image Sensor with DRAM","display_name":"4.6 A 1/2.3inch 20Mpixel 3-layer stacked CMOS Image Sensor with DRAM","publication_year":2017,"publication_date":"2017-02-01","ids":{"openalex":"https://openalex.org/W2593197747","doi":"https://doi.org/10.1109/isscc.2017.7870268","mag":"2593197747"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2017.7870268","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2017.7870268","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086443303","display_name":"Haruta Tsutomu","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Tsutomu Haruta","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102378127","display_name":"Tsutomu Nakajima","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tsutomu Nakajima","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112452464","display_name":"Jun Hashizume","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jun Hashizume","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040968347","display_name":"Taku Umebayashi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Taku Umebayashi","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101529867","display_name":"Hiroshi Takahashi","orcid":"https://orcid.org/0000-0003-1122-2349"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hiroshi Takahashi","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110489030","display_name":"Kazuo Taniguchi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kazuo Taniguchi","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026625502","display_name":"Masami Kuroda","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Masami Kuroda","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014491668","display_name":"Sumihiro Hiroshi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hiroshi Sumihiro","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007192000","display_name":"Koji Enoki","orcid":"https://orcid.org/0000-0001-5158-864X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Koji Enoki","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102282144","display_name":"Yamasaki Takatsugu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Takatsugu Yamasaki","raw_affiliation_strings":["Sony Semiconductor Manufacturing, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Manufacturing, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037472173","display_name":"Katsuya Ikezawa","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Katsuya Ikezawa","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060634964","display_name":"Kitahara Atsushi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Atsushi Kitahara","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008976633","display_name":"Zen Masao","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Masao Zen","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014734135","display_name":"Oyama Masafumi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Masafumi Oyama","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104355666","display_name":"Hiroki Koga","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hiroki Koga","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054320091","display_name":"Hidenobu Tsugawa","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hidenobu Tsugawa","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086469538","display_name":"Tomoharu Ogita","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tomoharu Ogita","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015695732","display_name":"Takashi Nagano","orcid":"https://orcid.org/0000-0003-4531-4401"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Takashi Nagano","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110330365","display_name":"Satoshi Takano","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122684","display_name":"Sony Computer Science Laboratories","ror":"https://ror.org/02nc46417","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4210122684"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Takano","raw_affiliation_strings":["Sony LSI Design, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony LSI Design, Atsugi, Japan","institution_ids":["https://openalex.org/I4210122684"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103742915","display_name":"Tetsuo Nomoto","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tetsuo Nomoto","raw_affiliation_strings":["Sony Semiconductor Solutions, Atsugi, Japan"],"affiliations":[{"raw_affiliation_string":"Sony Semiconductor Solutions, Atsugi, Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":20,"corresponding_author_ids":["https://openalex.org/A5086443303"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.4504,"has_fulltext":false,"cited_by_count":90,"citation_normalized_percentile":{"value":0.97095801,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"76","last_page":"77"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.8976476192474365},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.691129207611084},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6512717008590698},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6221123337745667},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.6166641712188721},{"id":"https://openalex.org/keywords/frame","display_name":"Frame (networking)","score":0.5998207926750183},{"id":"https://openalex.org/keywords/frame-rate","display_name":"Frame rate","score":0.4986152648925781},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4579545259475708},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.4362525939941406},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4257062077522278},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.42462238669395447},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4232310354709625},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.41662928462028503},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34641778469085693},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.32858142256736755},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2870029807090759},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.17849546670913696},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.156002014875412}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.8976476192474365},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.691129207611084},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6512717008590698},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6221123337745667},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.6166641712188721},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.5998207926750183},{"id":"https://openalex.org/C3261483","wikidata":"https://www.wikidata.org/wiki/Q119565","display_name":"Frame rate","level":2,"score":0.4986152648925781},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4579545259475708},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.4362525939941406},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4257062077522278},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.42462238669395447},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4232310354709625},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.41662928462028503},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34641778469085693},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.32858142256736755},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2870029807090759},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.17849546670913696},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.156002014875412},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2017.7870268","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2017.7870268","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1981612049","https://openalex.org/W2016997355","https://openalex.org/W2065826607","https://openalex.org/W2100516830"],"related_works":["https://openalex.org/W2142311551","https://openalex.org/W2075082765","https://openalex.org/W1548368440","https://openalex.org/W2883717048","https://openalex.org/W2061141771","https://openalex.org/W2946288499","https://openalex.org/W2096185181","https://openalex.org/W3092800402","https://openalex.org/W1515519876","https://openalex.org/W2091974750"],"abstract_inverted_index":{"In":[0,51],"recent":[1],"years,":[2],"the":[3,20,30,34,57,105],"performance":[4],"of":[5,16,37,80],"cellphone":[6,24,43],"cameras":[7,25,28,44],"has":[8],"improved,":[9],"and":[10,26,65,88],"is":[11,29],"becoming":[12],"comparable":[13],"to":[14,33,53],"that":[15],"SLR":[17,27],"cameras.":[18],"However,":[19],"big":[21],"difference":[22],"between":[23],"distortion":[31],"due":[32],"rolling":[35],"exposure":[36],"CMOS":[38,97],"image":[39],"sensors":[40],"(CISs)":[41],"because":[42],"cannot":[45],"have":[46],"a":[47],"mechanical":[48],"shutters":[49],"[1].":[50],"addition":[52],"this":[54],"technical":[55],"problem,":[56],"demands":[58],"for":[59,66],"high":[60],"quality":[61],"in":[62],"dark":[63],"situations":[64],"movies":[67],"are":[68],"increasing.":[69],"Frame-level":[70],"signal":[71],"processing":[72],"can":[73],"solve":[74],"these":[75],"problems,":[76],"but":[77],"previous":[78],"generations":[79],"CIS":[81],"could":[82],"not":[83],"achieve":[84],"both":[85],"high-speed":[86],"readout":[87],"accessible":[89],"I/F":[90],"speed.":[91],"This":[92],"paper":[93],"presents":[94],"3-layer-stacked":[95],"back-illuminated":[96],"Image":[98],"Sensor":[99],"(3L-BI-CIS)":[100],"with":[101],"mounted":[102],"DRAM":[103],"as":[104],"frame":[106],"memory.":[107]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":19},{"year":2018,"cited_by_count":14},{"year":2017,"cited_by_count":2}],"updated_date":"2026-02-02T03:55:41.653505","created_date":"2025-10-10T00:00:00"}