{"id":"https://openalex.org/W2094597636","doi":"https://doi.org/10.1109/isscc.2013.6487781","title":"A micropower battery current sensor with ±0.03% (3σ) inaccuracy from −40 to +85°C","display_name":"A micropower battery current sensor with ±0.03% (3σ) inaccuracy from −40 to +85°C","publication_year":2013,"publication_date":"2013-02-01","ids":{"openalex":"https://openalex.org/W2094597636","doi":"https://doi.org/10.1109/isscc.2013.6487781","mag":"2094597636"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2013.6487781","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2013.6487781","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035537867","display_name":"Saleh Heidary Shalmany","orcid":"https://orcid.org/0000-0003-3846-134X"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"S. H. Shalmany","raw_affiliation_strings":["Delft University of Technology, Delft, Netherlands","Delft University of Technology, Delft, Netherlands;"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft University of Technology, Delft, Netherlands;","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022953640","display_name":"D. Draxelmayr","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131793","display_name":"Infineon Technologies (Austria)","ror":"https://ror.org/03msng824","country_code":"AT","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210131793"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"D. Draxelmayr","raw_affiliation_strings":["Infineon Technologies, Villach, Austria","Infineon Technol., Villach, Austria"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies, Villach, Austria","institution_ids":["https://openalex.org/I4210131793"]},{"raw_affiliation_string":"Infineon Technol., Villach, Austria","institution_ids":["https://openalex.org/I4210131793"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029302924","display_name":"Kofi A. A. Makinwa","orcid":"https://orcid.org/0000-0002-2992-5467"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"K. A. A. Makinwa","raw_affiliation_strings":["Delft University of Technology, Delft, Netherlands","Delft University of Technology, Delft, Netherlands;"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft University of Technology, Delft, Netherlands;","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5035537867"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":2.1983,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.8714809,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"386","last_page":"387"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/micropower","display_name":"Micropower","score":0.8930187225341797},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.7037767171859741},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.6409752368927002},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5772882699966431},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.5336794257164001},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5320115089416504},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5032863020896912},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48398876190185547},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.462547242641449},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.45805609226226807},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.42404043674468994},{"id":"https://openalex.org/keywords/battery","display_name":"Battery (electricity)","score":0.4185936152935028},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.36871129274368286},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3135470449924469},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20267456769943237},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09023350477218628}],"concepts":[{"id":"https://openalex.org/C2851963","wikidata":"https://www.wikidata.org/wiki/Q6839950","display_name":"Micropower","level":3,"score":0.8930187225341797},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.7037767171859741},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.6409752368927002},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5772882699966431},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.5336794257164001},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5320115089416504},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5032863020896912},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48398876190185547},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.462547242641449},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.45805609226226807},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.42404043674468994},{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.4185936152935028},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.36871129274368286},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3135470449924469},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20267456769943237},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09023350477218628},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2013.6487781","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2013.6487781","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1569754381","https://openalex.org/W2023841370","https://openalex.org/W2055944305","https://openalex.org/W2081291956","https://openalex.org/W2101501150","https://openalex.org/W4247586331"],"related_works":["https://openalex.org/W1901801783","https://openalex.org/W1975047920","https://openalex.org/W2101963313","https://openalex.org/W2370820504","https://openalex.org/W2133199116","https://openalex.org/W4389955510","https://openalex.org/W2347289947","https://openalex.org/W2364640622","https://openalex.org/W2390376289","https://openalex.org/W2005544085"],"abstract_inverted_index":{"This":[0,63],"paper":[1],"presents":[2],"a":[3,14,18,22,53,89],"micropower":[4],"current-sensing":[5],"system":[6],"(CSS)":[7],"for":[8],"battery":[9],"monitoring,":[10],"which":[11,51],"consists":[12],"of":[13,65,72],"calibrated":[15],"shunt":[16],"resistor,":[17],"\u0394\u03a3":[19],"ADC,":[20],"and":[21,46,79],"dynamic":[23,73,82],"bandgap":[24],"reference":[25],"(BGR).":[26],"For":[27],"currents":[28],"ranging":[29],"from":[30],"0":[31],"to":[32,40],"1A":[33],"over":[34],"the":[35,70],"industrial":[36],"temperature":[37,77],"range":[38],"(-40\u00b0C":[39],"+85\u00b0C),":[41],"it":[42],"exhibits":[43],"10\u03bcA":[44],"offset":[45],"\u00b10.03%":[47],"(3\u03c3)":[48],"gain":[49],"error,":[50],"is":[52,67,86],"3\u00d7":[54],"improvement":[55],"on":[56],"systems":[57],"with":[58],"off-chip":[59],"external":[60],"references":[61],"[1,2].":[62],"level":[64],"accuracy":[66],"achieved":[68],"by":[69,88],"use":[71],"error-correction":[74],"techniques,":[75],"digital":[76],"compensation,":[78],"an":[80],"on-chip":[81],"BGR,":[83],"whose":[84],"spread":[85],"corrected":[87],"single":[90],"room-temperature":[91],"trim.":[92]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":8},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}