{"id":"https://openalex.org/W2611478059","doi":"https://doi.org/10.1109/isqed.2017.7918292","title":"Variation-immune resistive Non-Volatile Memory using self-organized sub-bank circuit designs","display_name":"Variation-immune resistive Non-Volatile Memory using self-organized sub-bank circuit designs","publication_year":2017,"publication_date":"2017-03-01","ids":{"openalex":"https://openalex.org/W2611478059","doi":"https://doi.org/10.1109/isqed.2017.7918292","mag":"2611478059"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2017.7918292","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2017.7918292","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://stars.library.ucf.edu/scopus2015/7439","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048563280","display_name":"Navid Khoshavi","orcid":"https://orcid.org/0000-0002-4010-1354"},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Navid Khoshavi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016438213","display_name":"Soheil Salehi","orcid":"https://orcid.org/0000-0001-5998-8795"},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Soheil Salehi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069017725","display_name":"Ronald F. DeMara","orcid":"https://orcid.org/0000-0001-6864-7255"},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ronald F. DeMara","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL","institution_ids":["https://openalex.org/I106165777"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5048563280"],"corresponding_institution_ids":["https://openalex.org/I106165777"],"apc_list":null,"apc_paid":null,"fwci":0.8761,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.755742,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"36","issue":null,"first_page":"52","last_page":"57"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.6383061408996582},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6204619407653809},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.5856499671936035},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.5699765682220459},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4538480341434479},{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.4389345645904541},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.4335169792175293},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3237524628639221},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1971164345741272},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16606566309928894},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11725500226020813},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11114287376403809}],"concepts":[{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.6383061408996582},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6204619407653809},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.5856499671936035},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.5699765682220459},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4538480341434479},{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.4389345645904541},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.4335169792175293},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3237524628639221},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1971164345741272},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16606566309928894},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11725500226020813},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11114287376403809},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed.2017.7918292","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2017.7918292","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},{"id":"pmh:oai:stars.library.ucf.edu:scopus2015-8438","is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/scopus2015/7439","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus Export 2015-2019","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:stars.library.ucf.edu:scopus2015-8438","is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/scopus2015/7439","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus Export 2015-2019","raw_type":"text"},"sustainable_development_goals":[{"score":0.9100000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1693570377","https://openalex.org/W1891912133","https://openalex.org/W1992063709","https://openalex.org/W2012021334","https://openalex.org/W2028702248","https://openalex.org/W2029683116","https://openalex.org/W2098040113","https://openalex.org/W2098577477","https://openalex.org/W2110276925","https://openalex.org/W2116359224","https://openalex.org/W2141721356","https://openalex.org/W2150283124","https://openalex.org/W2167121891","https://openalex.org/W2336624548","https://openalex.org/W2397531454","https://openalex.org/W2403862212","https://openalex.org/W2496520886","https://openalex.org/W2548789460","https://openalex.org/W2588236721","https://openalex.org/W4238549369","https://openalex.org/W4299134008","https://openalex.org/W6724006877","https://openalex.org/W6733743781"],"related_works":["https://openalex.org/W3173413269","https://openalex.org/W2076211355","https://openalex.org/W2533127403","https://openalex.org/W2007070351","https://openalex.org/W2033811947","https://openalex.org/W2183989414","https://openalex.org/W2106343578","https://openalex.org/W1551399929","https://openalex.org/W2038212394","https://openalex.org/W2410132916"],"abstract_inverted_index":{"While":[0],"technology":[1,16,29],"scaling":[2],"enables":[3],"increased":[4],"density":[5],"for":[6,20,185],"memory":[7],"cells,":[8],"the":[9,18,25,47,76,87,99,105,110,117,132,144,158,167],"intrinsic":[10,106],"high":[11],"leakage":[12],"power":[13,120],"of":[14,27,49,109,143,169,178],"CMOS":[15],"and":[17,38,60,64,119],"demand":[19],"reduced":[21],"energy":[22],"consumption":[23,121],"inspires":[24],"use":[26],"emerging":[28],"alternatives":[30],"as":[31,153],"Non-Volatile":[32],"Memory":[33],"(NVM)":[34],"including":[35,57],"STT-MRAM,":[36],"PCM,":[37],"RRAM.":[39],"However,":[40],"their":[41],"narrow":[42],"resistive":[43,111,179],"sensing":[44,112,146,159,181],"margins":[45],"exacerbate":[46],"impact":[48],"Process":[50],"Variations":[51],"(PV)":[52],"in":[53,75,89,135],"high-density":[54],"NVM":[55,90],"arrays,":[56],"on-chip":[58],"cache":[59],"primary":[61],"memory.":[62],"Large-latency":[63],"power-hungry":[65],"Sense":[66],"Amplifiers":[67],"(SAs)":[68],"have":[69],"been":[70],"adapted":[71],"to":[72,84,115,165],"combat":[73],"PV":[74,88,133],"past.":[77],"Herein,":[78],"we":[79],"propose":[80],"a":[81],"novel":[82],"approach":[83],"actually":[85],"leverage":[86],"arrays":[91],"using":[92],"Self-Organized":[93],"Sub-bank":[94],"(SOS)":[95],"design.":[96],"SOS":[97,156],"engages":[98],"preferred":[100],"SA":[101],"alternative":[102],"based":[103],"on":[104,163],"as-built":[107],"behavior":[108],"timing":[113],"margin":[114],"reduce":[116,166],"latency":[118],"while":[122],"maintaining":[123],"acceptable":[124],"access":[125],"time.":[126],"Our":[127],"experimental":[128],"results":[129],"indicate":[130],"that":[131],"effect":[134],"our":[136],"case":[137],"study":[138],"may":[139],"perturb":[140],"around":[141],"27.5%":[142],"data":[145],"operations":[147],"from":[148],"which":[149],"21.5%":[150],"are":[151,183],"classified":[152],"extremely":[154],"vulnerable.":[155],"alleviates":[157],"vulnerability":[160],"by":[161,172],"40%":[162],"average":[164],"risk":[168],"application's":[170],"contamination":[171],"fault":[173],"propagation.":[174],"Additionally,":[175],"new":[176],"categories":[177],"read":[180],"dependability":[182],"defined":[184],"broad":[186],"adaption.":[187]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}