{"id":"https://openalex.org/W1978223018","doi":"https://doi.org/10.1109/isqed.2012.6187517","title":"A scalable curve-fit model of the substrate coupling resistances for IC design","display_name":"A scalable curve-fit model of the substrate coupling resistances for IC design","publication_year":2012,"publication_date":"2012-03-01","ids":{"openalex":"https://openalex.org/W1978223018","doi":"https://doi.org/10.1109/isqed.2012.6187517","mag":"1978223018"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2012.6187517","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2012.6187517","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021811433","display_name":"Vijaya Kumar Gurugubelli","orcid":"https://orcid.org/0000-0003-3928-4242"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Vijaya Kumar Gurugubelli","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India","Dept. of Electrical Engineering, Indian Institute of Technology, Madras, Chennai 600036, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]},{"raw_affiliation_string":"Dept. of Electrical Engineering, Indian Institute of Technology, Madras, Chennai 600036, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051775574","display_name":"Shreepad Karmalkar","orcid":"https://orcid.org/0000-0002-6400-8955"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Shreepad Karmalkar","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India","Dept. of Electrical Engineering, Indian Institute of Technology, Madras, Chennai 600036, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]},{"raw_affiliation_string":"Dept. of Electrical Engineering, Indian Institute of Technology, Madras, Chennai 600036, India","institution_ids":["https://openalex.org/I24676775"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5021811433"],"corresponding_institution_ids":["https://openalex.org/I24676775"],"apc_list":null,"apc_paid":null,"fwci":0.21871674,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.56382963,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"353","last_page":"357"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.7202528119087219},{"id":"https://openalex.org/keywords/substrate-coupling","display_name":"Substrate coupling","score":0.6982145309448242},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.6561906337738037},{"id":"https://openalex.org/keywords/contact-resistance","display_name":"Contact resistance","score":0.6241116523742676},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5683819055557251},{"id":"https://openalex.org/keywords/flow","display_name":"Flow (mathematics)","score":0.5374804735183716},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.4865385591983795},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.46779733896255493},{"id":"https://openalex.org/keywords/signal-flow-graph","display_name":"Signal-flow graph","score":0.43816810846328735},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.43160057067871094},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42892518639564514},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.4248216152191162},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.41042348742485046},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.39060795307159424},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.37413305044174194},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.37335917353630066},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.25857821106910706},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24695521593093872},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20533356070518494},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1967056393623352},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.14706605672836304},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.09887880086898804}],"concepts":[{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.7202528119087219},{"id":"https://openalex.org/C51674796","wikidata":"https://www.wikidata.org/wiki/Q7632167","display_name":"Substrate coupling","level":4,"score":0.6982145309448242},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.6561906337738037},{"id":"https://openalex.org/C123671423","wikidata":"https://www.wikidata.org/wiki/Q332329","display_name":"Contact resistance","level":3,"score":0.6241116523742676},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5683819055557251},{"id":"https://openalex.org/C38349280","wikidata":"https://www.wikidata.org/wiki/Q1434290","display_name":"Flow (mathematics)","level":2,"score":0.5374804735183716},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.4865385591983795},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.46779733896255493},{"id":"https://openalex.org/C166501922","wikidata":"https://www.wikidata.org/wiki/Q1786523","display_name":"Signal-flow graph","level":2,"score":0.43816810846328735},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.43160057067871094},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42892518639564514},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.4248216152191162},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.41042348742485046},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.39060795307159424},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.37413305044174194},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.37335917353630066},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.25857821106910706},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24695521593093872},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20533356070518494},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1967056393623352},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.14706605672836304},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.09887880086898804},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C155310634","wikidata":"https://www.wikidata.org/wiki/Q1852785","display_name":"Trench","level":3,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2012.6187517","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2012.6187517","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1543286747","https://openalex.org/W1564432903","https://openalex.org/W1996718405","https://openalex.org/W2084579111","https://openalex.org/W2098859370","https://openalex.org/W2109833570","https://openalex.org/W2118494913","https://openalex.org/W2120490366","https://openalex.org/W2123652837","https://openalex.org/W2129722479","https://openalex.org/W2138788278","https://openalex.org/W2145750518","https://openalex.org/W2149150678","https://openalex.org/W2161687514","https://openalex.org/W2171533172","https://openalex.org/W2180333551","https://openalex.org/W2188666002","https://openalex.org/W2567474316","https://openalex.org/W4236530243","https://openalex.org/W4255639240"],"related_works":["https://openalex.org/W2217909676","https://openalex.org/W2389214306","https://openalex.org/W2532402682","https://openalex.org/W4235240664","https://openalex.org/W2965083567","https://openalex.org/W1520725050","https://openalex.org/W2083105144","https://openalex.org/W2357426242","https://openalex.org/W2337245573","https://openalex.org/W2972257016"],"abstract_inverted_index":{"A":[0],"new":[1],"approach":[2,27],"is":[3,44,68],"presented":[4],"for":[5,15,86],"modeling":[6],"the":[7,10,19,38,48,108],"resistances":[8,30,88],"of":[9,21,50,74,105,107],"substrate":[11,96,112],"coupling":[12,39,42,87],"network":[13],"employed":[14],"noise":[16],"calculations":[17],"in":[18,103],"design":[20],"mixed-signal":[22],"and":[23,54,64,111],"RF":[24],"ICs.":[25],"The":[26],"introduces":[28],"intermediate":[29],"having":[31,57],"progressively":[32],"simpler":[33],"current":[34],"flow":[35],"patterns":[36],"than":[37],"resistances.":[40],"Each":[41],"resistance":[43,52,56,66],"then":[45],"modeled":[46],"as":[47,70],"product":[49],"two":[51],"ratios":[53],"a":[55,71,95,100],"simple":[58,72],"1-D":[59],"vertical":[60],"or":[61,98],"lateral":[62],"flow,":[63],"each":[65],"ratio":[67],"approximated":[69],"function":[73],"geometrical":[75],"aspect":[76],"ratios.":[77],"Based":[78],"on":[79,94],"this":[80],"approach,":[81],"closed-form":[82],"expressions":[83],"are":[84],"derived":[85],"associated":[89],"with":[90,97],"parallel":[91],"stripe":[92],"contacts":[93],"without":[99],"bottom":[101],"contact,":[102],"terms":[104],"dimensions":[106],"contact":[109],"configuration":[110],"parameters.":[113]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}