{"id":"https://openalex.org/W2152027692","doi":"https://doi.org/10.1109/isqed.2009.4810392","title":"SRAM supply voltage scaling: A reliability perspective","display_name":"SRAM supply voltage scaling: A reliability perspective","publication_year":2009,"publication_date":"2009-03-01","ids":{"openalex":"https://openalex.org/W2152027692","doi":"https://doi.org/10.1109/isqed.2009.4810392","mag":"2152027692"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2009.4810392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2009.4810392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th International Symposium on Quality Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101739616","display_name":"Animesh Kumar","orcid":"https://orcid.org/0000-0001-7845-3171"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Animesh Kumar","raw_affiliation_strings":["EECS, University of California, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"EECS, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088933304","display_name":"Jan M. Rabaey","orcid":"https://orcid.org/0000-0001-6290-4855"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jan Rabaey","raw_affiliation_strings":["EECS, University of California, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"EECS, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030620564","display_name":"Kannan Ramchandran","orcid":"https://orcid.org/0000-0002-4567-328X"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kannan Ramchandran","raw_affiliation_strings":["EECS, University of California, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"EECS, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101739616"],"corresponding_institution_ids":["https://openalex.org/I95457486"],"apc_list":null,"apc_paid":null,"fwci":2.0935,"has_fulltext":false,"cited_by_count":33,"citation_normalized_percentile":{"value":0.88033666,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"782","last_page":"787"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6185045838356018},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5873441100120544},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5284217000007629},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5197717547416687},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.48042917251586914},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.4787132740020752},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.4643585681915283},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.4643087387084961},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4412003755569458},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4397999942302704},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.41444772481918335},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.33456993103027344},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2756640911102295},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22462153434753418},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15042448043823242},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.14466574788093567}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6185045838356018},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5873441100120544},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5284217000007629},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5197717547416687},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.48042917251586914},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.4787132740020752},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.4643585681915283},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.4643087387084961},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4412003755569458},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4397999942302704},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.41444772481918335},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.33456993103027344},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2756640911102295},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22462153434753418},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15042448043823242},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.14466574788093567},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2009.4810392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2009.4810392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th International Symposium on Quality Electronic Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1979668030","https://openalex.org/W2019199024","https://openalex.org/W2042694839","https://openalex.org/W2087114849","https://openalex.org/W2099569658","https://openalex.org/W2122488218","https://openalex.org/W2123085386","https://openalex.org/W2127745296","https://openalex.org/W2129300315","https://openalex.org/W2132621842","https://openalex.org/W2138779125","https://openalex.org/W2142358791","https://openalex.org/W2143137068","https://openalex.org/W2543171663","https://openalex.org/W3149410719","https://openalex.org/W6672033794"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W1500230652","https://openalex.org/W2363504003","https://openalex.org/W2066033226","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2088929465","https://openalex.org/W2612883256","https://openalex.org/W4386933833"],"abstract_inverted_index":{"SRAM":[0,32,57,98],"leakage":[1],"power":[2,10,159],"is":[3,74,86,161,170,177],"a":[4,13,66,89,105],"significan":[5],"fraction":[6],"of":[7,125,186],"the":[8,29,37,108,164,173,181,184],"total":[9],"consumption":[11],"on":[12],"chip.":[14],"Various":[15],"system":[16,61],"level":[17,62],"techniques":[18],"have":[19],"been":[20],"proposed":[21],"to":[22,46,76,113,180],"reduce":[23],"this":[24,195],"leakage-power":[25,58,150,202],"by":[26,122],"reducing":[27],"(scaling)":[28],"supply":[30,33,114,136,192],"voltage.":[31,193],"voltage":[34,115,137],"scaling":[35],"reduces":[36],"leakage-power,":[38,135],"but":[39,117],"it":[40,118],"increases":[41,111],"stored-data":[42],"failure":[43,49,78,100],"rate":[44],"due":[45,112],"commonly":[47],"known":[48],"mechanisms,":[50],"for":[51,91],"example,":[52],"soft-errors.":[53],"This":[54],"work":[55],"studies":[56],"reduction":[59,203],"using":[60],"design":[63],"techniques,":[64],"with":[65],"data-reliability":[67],"constraint.":[68,174],"A":[69],"statistical":[70],"or":[71,82],"probabilistic":[72,106],"setup":[73],"used":[75,87],"model":[77],"mechanisms":[79,101],"like":[80],"soft-errors":[81],"process-variations,":[83],"and":[84,128,143,157,166,191,200],"error-probability":[85,168],"as":[88,163,172],"metric":[90],"reliability.":[92],"Error":[93],"models":[94],"which":[95],"combine":[96],"various":[97],"cell":[99],"are":[102,147,205],"developed.":[103],"In":[104],"setup,":[107],"bit-error":[109],"probability":[110,146],"reduction,":[116,138],"can":[119],"be":[120],"compensated":[121],"suitable":[123],"choices":[124,185],"error-correction":[126,141,189],"code":[127],"data-refresh":[129,139,158,187],"(scrubbing)":[130],"rate.":[131],"The":[132,149,175],"trade-offs":[133],"between":[134],"rate,":[140,188],"code,":[142,190],"decoding":[144],"error":[145],"studied.":[148],"-":[151,160],"including":[152],"redundancy":[153],"overhead,":[154],"coding":[155],"power,":[156],"set":[162,171],"cost-function":[165,176],"an":[167],"target":[169],"minimized":[178],"subject":[179],"constraint,":[182],"over":[183],"Using":[194],"optimization":[196],"procedure,":[197],"simulation":[198],"results":[199],"circuit-level":[201],"estimates":[204],"presented.":[206]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":5},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}