{"id":"https://openalex.org/W2108509374","doi":"https://doi.org/10.1109/isqed.2003.1194708","title":"Leakage current reduction in sequential circuits by modifying the scan chains","display_name":"Leakage current reduction in sequential circuits by modifying the scan chains","publication_year":2004,"publication_date":"2004-03-22","ids":{"openalex":"https://openalex.org/W2108509374","doi":"https://doi.org/10.1109/isqed.2003.1194708","mag":"2108509374"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2003.1194708","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194708","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109214532","display_name":"Afshin Abdollahi","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A. Abdollahi","raw_affiliation_strings":["University of Southern California, USA","[University of Southern California Los, Angeles, CA, USA]"],"affiliations":[{"raw_affiliation_string":"University of Southern California, USA","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"[University of Southern California Los, Angeles, CA, USA]","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036666925","display_name":"Farzan Fallah","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094759","display_name":"Fujitsu (United States)","ror":"https://ror.org/0073whr05","country_code":"US","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4210094759"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Fallah","raw_affiliation_strings":["Fujitsu Laboratories of America, Inc., USA","Fujitsu Labs. of America, Inc., USA"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories of America, Inc., USA","institution_ids":["https://openalex.org/I4210094759"]},{"raw_affiliation_string":"Fujitsu Labs. of America, Inc., USA","institution_ids":["https://openalex.org/I4210094759"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044650311","display_name":"Massoud Pedram","orcid":"https://orcid.org/0000-0002-2677-7307"},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Pedram","raw_affiliation_strings":["University of Southern California, USA","University of Southern , California , USA"],"affiliations":[{"raw_affiliation_string":"University of Southern California, USA","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"University of Southern , California , USA","institution_ids":["https://openalex.org/I1174212"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5109214532"],"corresponding_institution_ids":["https://openalex.org/I1174212"],"apc_list":null,"apc_paid":null,"fwci":0.2641,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.5724567,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"49","last_page":"54"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6898117065429688},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6826522350311279},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.653990626335144},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6109123826026917},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.6001386642456055},{"id":"https://openalex.org/keywords/sleep-mode","display_name":"Sleep mode","score":0.5528457164764404},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5404490232467651},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5305633544921875},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.4349030554294586},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.41932398080825806},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.3836909234523773},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3346143066883087},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2473030388355255},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22785505652427673},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2043226957321167},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09793815016746521},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06575381755828857},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.06252515316009521}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6898117065429688},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6826522350311279},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.653990626335144},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6109123826026917},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.6001386642456055},{"id":"https://openalex.org/C57149124","wikidata":"https://www.wikidata.org/wiki/Q587346","display_name":"Sleep mode","level":4,"score":0.5528457164764404},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5404490232467651},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5305633544921875},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.4349030554294586},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.41932398080825806},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3836909234523773},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3346143066883087},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2473030388355255},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22785505652427673},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2043226957321167},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09793815016746521},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06575381755828857},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.06252515316009521},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/isqed.2003.1194708","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194708","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.407.9979","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.407.9979","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://atrak.usc.edu/~massoud/Papers/leakage-scanchain-isqed03.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.409.3833","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.409.3833","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2003/isqed03/pdffiles/1b_1.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.68.2043","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.68.2043","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www-wjp.cs.uni-sb.de/~smueller/magic_scan.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5699999928474426,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1949737515","https://openalex.org/W2012940761","https://openalex.org/W2083626899","https://openalex.org/W2104208957","https://openalex.org/W2110069873","https://openalex.org/W2121194013","https://openalex.org/W2138450211","https://openalex.org/W2165788555","https://openalex.org/W4299319444","https://openalex.org/W6667722213"],"related_works":["https://openalex.org/W2752479413","https://openalex.org/W2110968362","https://openalex.org/W4238178324","https://openalex.org/W2163776294","https://openalex.org/W2131499522","https://openalex.org/W3141297747","https://openalex.org/W4248668797","https://openalex.org/W2111485030","https://openalex.org/W2057961029","https://openalex.org/W4390345338"],"abstract_inverted_index":{"Input":[0],"vector":[1,59,90],"control":[2],"is":[3,40],"an":[4],"effective":[5],"technique":[6,29,99],"for":[7,30,103],"reducing":[8],"the":[9,21,32,45,56,63,71,77,87,92,97,110,114],"leakage":[10,34,58,89],"current":[11],"of":[12,76],"combinational":[13],"VLSI":[14,50],"circuits":[15,18],"when":[16,60],"these":[17,67],"are":[19],"in":[20,48],"sleep":[22,64],"mode.":[23,65],"In":[24],"this":[25],"paper":[26],"a":[27,37,49],"design":[28],"applying":[31],"minimum":[33,57,88],"input":[35],"to":[36,52,85,91],"sequential":[38],"circuit":[39,51],"proposed.":[41],"Our":[42],"method":[43],"uses":[44],"built-in":[46],"scan-chain":[47,106],"drive":[53],"it":[54,61],"with":[55],"enters":[62],"Using":[66],"scan":[68],"registers":[69],"eliminates":[70],"area":[72],"and":[73,108],"delay":[74],"overhead":[75],"additional":[78],"circuitry":[79],"that":[80],"would":[81],"otherwise":[82],"be":[83,101],"needed":[84],"apply":[86],"circuit.":[93],"We":[94],"show":[95],"how":[96],"proposed":[98],"can":[100],"used":[102],"several":[104],"different":[105],"architectures":[107],"present":[109],"experimental":[111],"results":[112],"on":[113],"MCNC91":[115],"benchmark":[116],"circuits.":[117]},"counts_by_year":[{"year":2020,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}