{"id":"https://openalex.org/W2942784010","doi":"https://doi.org/10.1109/iscas.2019.8702557","title":"A Low Voltage 10-Bit Non-Binary 2B/Cycle Time and Voltage Based SAR ADC","display_name":"A Low Voltage 10-Bit Non-Binary 2B/Cycle Time and Voltage Based SAR ADC","publication_year":2019,"publication_date":"2019-05-01","ids":{"openalex":"https://openalex.org/W2942784010","doi":"https://doi.org/10.1109/iscas.2019.8702557","mag":"2942784010"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2019.8702557","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2019.8702557","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024055531","display_name":"Jian Luo","orcid":"https://orcid.org/0000-0001-6738-7199"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Luo","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100337026","display_name":"Jing Li","orcid":"https://orcid.org/0000-0002-9598-7420"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Li","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100749757","display_name":"Ning Ning","orcid":"https://orcid.org/0000-0001-7893-1428"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Ning","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067510762","display_name":"Kejun Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kejun Wu","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100412044","display_name":"Zhen Liu","orcid":"https://orcid.org/0000-0002-3143-1976"},"institutions":[{"id":"https://openalex.org/I139024713","display_name":"Guangdong University of Technology","ror":"https://ror.org/04azbjn80","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Liu","raw_affiliation_strings":["School of Materials and Energy, Guangdong University of Technology, Guangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials and Energy, Guangdong University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I139024713"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100356073","display_name":"Yang Liu","orcid":"https://orcid.org/0000-0003-0615-7036"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Liu","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100377679","display_name":"Qi Yu","orcid":"https://orcid.org/0000-0002-0490-0749"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Yu","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"51","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6636151075363159},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.5949254631996155},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.5375086665153503},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.5283041000366211},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.501713752746582},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4712788462638855},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3329688310623169},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3119834065437317},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.1552099585533142},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10684826970100403},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.09262216091156006},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09072774648666382}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6636151075363159},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.5949254631996155},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.5375086665153503},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.5283041000366211},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.501713752746582},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4712788462638855},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3329688310623169},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3119834065437317},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.1552099585533142},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10684826970100403},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.09262216091156006},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09072774648666382},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2019.8702557","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2019.8702557","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8199999928474426,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1976274808","https://openalex.org/W1982704180","https://openalex.org/W1986817445","https://openalex.org/W1989745461","https://openalex.org/W2029526102","https://openalex.org/W2038212324","https://openalex.org/W2062952706","https://openalex.org/W2068164598","https://openalex.org/W2081904850","https://openalex.org/W2111186324","https://openalex.org/W2277569188","https://openalex.org/W2290410950","https://openalex.org/W2395206555","https://openalex.org/W2492388076","https://openalex.org/W2588496625","https://openalex.org/W2609793316","https://openalex.org/W6630722060","https://openalex.org/W6643998933"],"related_works":["https://openalex.org/W2411923897","https://openalex.org/W4285347720","https://openalex.org/W4200259850","https://openalex.org/W2333831899","https://openalex.org/W2484894494","https://openalex.org/W2367385042","https://openalex.org/W4381186982","https://openalex.org/W1859921603","https://openalex.org/W1571481168","https://openalex.org/W4283748689"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,24,92,140],"low":[4,18],"power":[5,107],"10-bit":[6,93],"2b/cycle":[7,54],"time":[8,30],"and":[9,70,81,85,134],"voltage":[10,46,80],"based-successive":[11],"approximation":[12],"register":[13],"analog-to-digital":[14],"converter":[15],"(ADC).":[16],"At":[17],"supply":[19,108],"voltage,":[20],"there":[21],"will":[22],"be":[23],"significant":[25],"difference":[26],"in":[27,139],"comparator":[28,50],"decision":[29,51,86],"for":[31],"different":[32],"input":[33],"voltages.":[34],"By":[35],"taking":[36],"advantage":[37],"of":[38,120,128,131,142,145],"the":[39,44,48,58,75,113],"fact,":[40],"this":[41],"ADC":[42,76,97,114],"converts":[43],"reference":[45,65],"to":[47,56,124],"corresponding":[49,123],"time,":[52],"achieving":[53],"quantization":[55],"improve":[57],"conversion":[59],"speed.":[60],"In":[61],"addition,":[62],"by":[63],"obtaining":[64],"delays":[66],"with":[67,104],"duplicated":[68],"circuits":[69],"using":[71,100],"non-binary":[72],"capacitor":[73],"arrays,":[74],"can":[77],"tolerate":[78],"process,":[79],"temperature":[82],"(PVT)":[83],"variations":[84],"errors.":[87],"To":[88],"validate":[89],"these":[90],"concepts,":[91],"2":[94],"MS/s":[95],"SAR":[96],"is":[98],"designed":[99],"130nm":[101],"CMOS":[102],"process":[103],"0.5":[105],"V":[106],"voltage.":[109],"Simulation":[110],"results":[111],"shows":[112],"achieve":[115],"signal-to-noise":[116],"distortion":[117],"ratio":[118],"(SNDR)":[119],"59.63":[121],"dB,":[122],"an":[125],"effective":[126],"number":[127],"bits":[129,133],"(ENOB)":[130],"9.61":[132],"consumes":[135],"3.2":[136],"\u00b5W,":[137],"resulting":[138],"figure":[141],"merit":[143],"(FOM)":[144],"2.06":[146],"fJ/c-s.":[147]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}