{"id":"https://openalex.org/W4410394155","doi":"https://doi.org/10.1109/irps48204.2025.10983458","title":"Power-Aware Mitigation of Logic Soft Error Rates at the 3-nm Bulk FinFET Node","display_name":"Power-Aware Mitigation of Logic Soft Error Rates at the 3-nm Bulk FinFET Node","publication_year":2025,"publication_date":"2025-03-30","ids":{"openalex":"https://openalex.org/W4410394155","doi":"https://doi.org/10.1109/irps48204.2025.10983458"},"language":"en","primary_location":{"id":"doi:10.1109/irps48204.2025.10983458","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983458","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113117955","display_name":"Jenna B. Kronenberg","orcid":"https://orcid.org/0009-0009-4632-6704"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"J. B. Kronenberg","raw_affiliation_strings":["Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN,United States"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN,United States","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015226951","display_name":"Yoni Xiong","orcid":"https://orcid.org/0000-0002-3635-7429"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Xiong","raw_affiliation_strings":["Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN,United States"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN,United States","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005276432","display_name":"Nicholas J. Pieper","orcid":"https://orcid.org/0000-0003-4968-7029"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. J. Pieper","raw_affiliation_strings":["Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN,United States"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN,United States","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006376684","display_name":"Dennis R. Ball","orcid":"https://orcid.org/0000-0003-0411-1835"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. R. Ball","raw_affiliation_strings":["Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN,United States"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN,United States","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090534631","display_name":"B. L. Bhuva","orcid":"https://orcid.org/0000-0002-2171-100X"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. L. Bhuva","raw_affiliation_strings":["Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN,United States"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN,United States","institution_ids":["https://openalex.org/I200719446"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5113117955"],"corresponding_institution_ids":["https://openalex.org/I200719446"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10806849,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6702839732170105},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.6670821905136108},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.6623239517211914},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5264602303504944},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5122177004814148},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45078244805336},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4134773910045624},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.36227908730506897},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.35760194063186646},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.182101309299469},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15462905168533325}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6702839732170105},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.6670821905136108},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.6623239517211914},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5264602303504944},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5122177004814148},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45078244805336},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4134773910045624},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36227908730506897},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.35760194063186646},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.182101309299469},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15462905168533325},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48204.2025.10983458","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983458","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7699999809265137,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1986706096","https://openalex.org/W2032681711","https://openalex.org/W2062980181","https://openalex.org/W2098694303","https://openalex.org/W2113626924","https://openalex.org/W2142358791","https://openalex.org/W2654812537","https://openalex.org/W3171486318","https://openalex.org/W4238927715"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2041615232","https://openalex.org/W2167002145","https://openalex.org/W2149032943","https://openalex.org/W2106281713","https://openalex.org/W2154081718","https://openalex.org/W1544140237","https://openalex.org/W1599771994","https://openalex.org/W3149410719","https://openalex.org/W1484235472"],"abstract_inverted_index":{"Mitigation":[0],"of":[1,16,32],"logic":[2],"soft":[3],"errors":[4],"results":[5],"in":[6],"heavy":[7],"performance":[8],"penalties.":[9],"Power-aware":[10],"mitigation":[11],"allows":[12],"for":[13],"the":[14,30],"optimization":[15],"power,":[17],"speed,":[18],"and":[19],"soft-error":[20],"rates.":[21],"Results":[22],"from":[23],"heavy-ion":[24],"irradiations":[25],"are":[26],"used":[27],"to":[28],"show":[29],"effectiveness":[31],"this":[33],"approach.":[34]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}