{"id":"https://openalex.org/W4410394773","doi":"https://doi.org/10.1109/irps48204.2025.10982854","title":"Power and SER Performance of Flip-Flop Cells with Low-Leakage Options","display_name":"Power and SER Performance of Flip-Flop Cells with Low-Leakage Options","publication_year":2025,"publication_date":"2025-03-30","ids":{"openalex":"https://openalex.org/W4410394773","doi":"https://doi.org/10.1109/irps48204.2025.10982854"},"language":"en","primary_location":{"id":"doi:10.1109/irps48204.2025.10982854","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10982854","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005276432","display_name":"Nicholas J. Pieper","orcid":"https://orcid.org/0000-0003-4968-7029"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"N. J. Pieper","raw_affiliation_strings":["Vanderbilt University,Department of ECE,Nashville,TN,USA,37215"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Department of ECE,Nashville,TN,USA,37215","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015226951","display_name":"Yoni Xiong","orcid":"https://orcid.org/0000-0002-3635-7429"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Xiong","raw_affiliation_strings":["Vanderbilt University,Department of ECE,Nashville,TN,USA,37215"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Department of ECE,Nashville,TN,USA,37215","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113117955","display_name":"Jenna B. Kronenberg","orcid":"https://orcid.org/0009-0009-4632-6704"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. B. Kronenberg","raw_affiliation_strings":["Vanderbilt University,Department of ECE,Nashville,TN,USA,37215"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Department of ECE,Nashville,TN,USA,37215","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061264216","display_name":"Rita Fung","orcid":"https://orcid.org/0000-0001-9774-1451"},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Fung","raw_affiliation_strings":["Cisco Systems, Inc. San Jose,CA,USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems, Inc. San Jose,CA,USA","institution_ids":["https://openalex.org/I135428043"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006376684","display_name":"Dennis R. Ball","orcid":"https://orcid.org/0000-0003-0411-1835"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. R. Ball","raw_affiliation_strings":["Vanderbilt University,Department of ECE,Nashville,TN,USA,37215"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Department of ECE,Nashville,TN,USA,37215","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090534631","display_name":"B. L. Bhuva","orcid":"https://orcid.org/0000-0002-2171-100X"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. L. Bhuva","raw_affiliation_strings":["Vanderbilt University,Department of ECE,Nashville,TN,USA,37215"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Department of ECE,Nashville,TN,USA,37215","institution_ids":["https://openalex.org/I200719446"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5005276432"],"corresponding_institution_ids":["https://openalex.org/I200719446"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10825285,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.983299970626831,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.983299970626831,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.964900016784668,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9634000062942505,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.8045696020126343},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.7078065872192383},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.5398198366165161},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4716072678565979},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4512287378311157},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4211488664150238},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4070424437522888},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.3543887734413147},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3446013331413269},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3289461135864258},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2116183340549469},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18048042058944702},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1528725028038025},{"id":"https://openalex.org/keywords/economics","display_name":"Economics","score":0.0888708233833313}],"concepts":[{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.8045696020126343},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.7078065872192383},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.5398198366165161},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4716072678565979},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4512287378311157},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4211488664150238},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4070424437522888},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.3543887734413147},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3446013331413269},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3289461135864258},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2116183340549469},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18048042058944702},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1528725028038025},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0888708233833313},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48204.2025.10982854","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10982854","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7300000190734863,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2137273775","https://openalex.org/W2141068710","https://openalex.org/W2161960035","https://openalex.org/W2321508901","https://openalex.org/W2560368994","https://openalex.org/W3118958636","https://openalex.org/W4312999421","https://openalex.org/W4388937567","https://openalex.org/W4405180042"],"related_works":["https://openalex.org/W2130342263","https://openalex.org/W2544815995","https://openalex.org/W2900067469","https://openalex.org/W2968511773","https://openalex.org/W1589514528","https://openalex.org/W19917524","https://openalex.org/W2521086587","https://openalex.org/W3199489944","https://openalex.org/W1428244460","https://openalex.org/W1896669116"],"abstract_inverted_index":{"Low-leakage":[0],"(LL)":[1],"threshold":[2],"voltage":[3],"(VT)":[4],"options":[5,57],"are":[6],"used":[7],"at":[8,59],"advanced":[9],"technology":[10],"nodes":[11],"to":[12,37],"reduce":[13],"power":[14],"consumption":[15],"for":[16,52],"mobile,":[17],"Internet":[18],"of":[19,41,47],"Things":[20],"(IoT),":[21],"and":[22,55],"space":[23],"applications.":[24],"A":[25],"new":[26],"measure,":[27],"given":[28],"by":[29],"(SER<sup":[30],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[31,33],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">A*</sup>Ileakage<sup":[32],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">B</sup>)":[34],"is":[35],"proposed":[36],"measure":[38],"the":[39],"efficacy":[40],"different":[42,53],"VT":[43,56],"options.":[44],"This":[45],"Figure":[46],"Merit":[48],"(FoM)":[49],"varies":[50],"widely":[51],"LL":[54],"available":[58],"a":[60],"3nm":[61],"bulk":[62],"FinFET":[63],"node.":[64]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}