{"id":"https://openalex.org/W4376606702","doi":"https://doi.org/10.1109/irps48203.2023.10118274","title":"SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation","display_name":"SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation","publication_year":2023,"publication_date":"2023-03-01","ids":{"openalex":"https://openalex.org/W4376606702","doi":"https://doi.org/10.1109/irps48203.2023.10118274"},"language":"en","primary_location":{"id":"doi:10.1109/irps48203.2023.10118274","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48203.2023.10118274","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010031826","display_name":"Christian Schwabe","orcid":"https://orcid.org/0000-0001-9611-7489"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Schwabe","raw_affiliation_strings":["Chemnitz University of Technology,Professorship of Power Electronics,Chemnitz,Germany","Professorship of Power Electronics, Chemnitz University of Technology, Chemnitz, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chemnitz University of Technology,Professorship of Power Electronics,Chemnitz,Germany","institution_ids":["https://openalex.org/I2610724"]},{"raw_affiliation_string":"Professorship of Power Electronics, Chemnitz University of Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033112561","display_name":"Xing Liu","orcid":"https://orcid.org/0000-0003-4583-6082"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Xing Liu","raw_affiliation_strings":["Chemnitz University of Technology,Professorship of Power Electronics,Chemnitz,Germany","Professorship of Power Electronics, Chemnitz University of Technology, Chemnitz, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chemnitz University of Technology,Professorship of Power Electronics,Chemnitz,Germany","institution_ids":["https://openalex.org/I2610724"]},{"raw_affiliation_string":"Professorship of Power Electronics, Chemnitz University of Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063262077","display_name":"Tobias N. Wassermann","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Tobias N. Wassermann","raw_affiliation_strings":["Infineon Technologies AG,Warstein,Germany,59581"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG,Warstein,Germany,59581","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030707614","display_name":"Paul Salmen","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Paul Salmen","raw_affiliation_strings":["Infineon Technologies AG,Warstein,Germany,59581"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG,Warstein,Germany,59581","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036487516","display_name":"Thomas Basler","orcid":"https://orcid.org/0000-0003-1489-6461"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Basler","raw_affiliation_strings":["Chemnitz University of Technology,Professorship of Power Electronics,Chemnitz,Germany","Professorship of Power Electronics, Chemnitz University of Technology, Chemnitz, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chemnitz University of Technology,Professorship of Power Electronics,Chemnitz,Germany","institution_ids":["https://openalex.org/I2610724"]},{"raw_affiliation_string":"Professorship of Power Electronics, Chemnitz University of Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.3269,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.95445173,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-cycling","display_name":"Power cycling","score":0.6815763115882874},{"id":"https://openalex.org/keywords/interpretation","display_name":"Interpretation (philosophy)","score":0.627876341342926},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.5827779173851013},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5338619351387024},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4822257459163666},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.47610411047935486},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4750266671180725},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.47059762477874756},{"id":"https://openalex.org/keywords/power-mosfet","display_name":"Power MOSFET","score":0.45544010400772095},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.4376082718372345},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.385367214679718},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3800079822540283},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37777939438819885},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34393906593322754},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.1854439079761505},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1771223247051239},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.15174034237861633},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.08371806144714355},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.08160772919654846}],"concepts":[{"id":"https://openalex.org/C2777900271","wikidata":"https://www.wikidata.org/wiki/Q17105337","display_name":"Power cycling","level":4,"score":0.6815763115882874},{"id":"https://openalex.org/C527412718","wikidata":"https://www.wikidata.org/wiki/Q855395","display_name":"Interpretation (philosophy)","level":2,"score":0.627876341342926},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.5827779173851013},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5338619351387024},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4822257459163666},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.47610411047935486},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4750266671180725},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.47059762477874756},{"id":"https://openalex.org/C88653102","wikidata":"https://www.wikidata.org/wiki/Q570553","display_name":"Power MOSFET","level":5,"score":0.45544010400772095},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.4376082718372345},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.385367214679718},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3800079822540283},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37777939438819885},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34393906593322754},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.1854439079761505},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1771223247051239},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.15174034237861633},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.08371806144714355},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.08160772919654846},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48203.2023.10118274","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48203.2023.10118274","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2091749383","https://openalex.org/W2550484295","https://openalex.org/W2770666768","https://openalex.org/W2901571527","https://openalex.org/W2967146328","https://openalex.org/W3132175001","https://openalex.org/W3159859197","https://openalex.org/W3168914030","https://openalex.org/W3198397891","https://openalex.org/W4200143293","https://openalex.org/W4282843607","https://openalex.org/W4286580160","https://openalex.org/W6729559499","https://openalex.org/W6757378398","https://openalex.org/W6796500521","https://openalex.org/W6801503275"],"related_works":["https://openalex.org/W4254968926","https://openalex.org/W2542162669","https://openalex.org/W1977042749","https://openalex.org/W2606572865","https://openalex.org/W2121451436","https://openalex.org/W2078152308","https://openalex.org/W2115248544","https://openalex.org/W1608296848","https://openalex.org/W2049062674","https://openalex.org/W2975003965"],"abstract_inverted_index":{"The":[0,74],"gate-oxide":[1],"processing":[2],"for":[3,58,91],"SiC":[4],"MOSFET":[5],"devices":[6,127],"is":[7,40,83,114],"challenging":[8],"and":[9,27,44,85,105,135],"can":[10,20,33,86,138],"lead":[11],"to":[12,67,117],"pronounced":[13],"trapping":[14],"effects":[15],"at":[16],"the$\\mathbf{SiC}/\\mathbf{SiO}_{2}$interface,":[17],"which":[18],"then":[19],"induce":[21,118],"threshold":[22,61,122],"voltage":[23,62,113],"instabilities":[24],"during":[25,64,71,80],"switching":[26],"other":[28],"long-term":[29],"tests.":[30],"This":[31,51],"effect":[32],"influence":[34,75,130],"the$\\mathbf{R_{DS,":[35],"on}}$,":[36],"if":[37],"the":[38,46,77,100,107,125,132],"channel":[39],"not":[41,115],"completely":[42],"closed,":[43],"also":[45],"temperature":[47],"determination":[48,79],"by":[49],"the$\\mathbf{V}_{\\mathbf{S}\\mathbf{D}}(\\mathbf{T})$method.":[50],"paper":[52],"presents":[53],"a":[54,59,110,119,128],"special":[55],"measurement":[56,63],"circuit":[57],"live":[60],"power":[65,81,103],"cycling":[66,82],"study":[68],"these":[69],"issues":[70],"lifetime":[72,78,133],"testing.":[73],"on":[76,131],"evaluated":[84],"be":[87,140],"in":[88],"parts":[89],"neglected":[90],"state-of-the-art":[92],"devices.":[93],"Even":[94],"though":[95],"high":[96],"temperatures":[97],"are":[98],"present,":[99],"number":[101],"of":[102],"cycles":[104],"respectively":[106],"time":[108],"under":[109],"certain":[111],"gate":[112,121],"sufficient":[116],"reasonable":[120],"shift.":[123],"For":[124],"investigated":[126],"negative":[129],"testing":[134],"results":[136],"interpretation":[137],"hence":[139],"ruled":[141],"out.":[142]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}