{"id":"https://openalex.org/W3158397926","doi":"https://doi.org/10.1109/irps46558.2021.9405155","title":"Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs","display_name":"Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs","publication_year":2021,"publication_date":"2021-03-01","ids":{"openalex":"https://openalex.org/W3158397926","doi":"https://doi.org/10.1109/irps46558.2021.9405155","mag":"3158397926"},"language":"en","primary_location":{"id":"doi:10.1109/irps46558.2021.9405155","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps46558.2021.9405155","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008806951","display_name":"Satyam Kumar","orcid":"https://orcid.org/0000-0002-5132-6460"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Satyam Kumar","raw_affiliation_strings":["Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000783453","display_name":"Tarun Samadder","orcid":"https://orcid.org/0000-0001-7137-1771"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Tarun Samadder","raw_affiliation_strings":["Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059487742","display_name":"Karansingh Thakor","orcid":null},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Karansingh Thakor","raw_affiliation_strings":["Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019929574","display_name":"Uma Sharma","orcid":"https://orcid.org/0000-0002-5682-9905"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Uma Sharma","raw_affiliation_strings":["Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057107600","display_name":"Souvik Mahapatra","orcid":"https://orcid.org/0000-0002-4516-766X"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Souvik Mahapatra","raw_affiliation_strings":["Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India","institution_ids":["https://openalex.org/I162827531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5008806951"],"corresponding_institution_ids":["https://openalex.org/I162827531"],"apc_list":null,"apc_paid":null,"fwci":0.3008,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.54755145,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/kinetics","display_name":"Kinetics","score":0.6774925589561462},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.6336068511009216},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.5343574285507202},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5284407138824463},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.5101840496063232},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.49124497175216675},{"id":"https://openalex.org/keywords/diffusion","display_name":"Diffusion","score":0.469880610704422},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4128246307373047},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.29340824484825134},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.28298792243003845},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.241209477186203},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20863518118858337},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.14157068729400635}],"concepts":[{"id":"https://openalex.org/C148898269","wikidata":"https://www.wikidata.org/wiki/Q1108792","display_name":"Kinetics","level":2,"score":0.6774925589561462},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.6336068511009216},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.5343574285507202},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5284407138824463},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.5101840496063232},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.49124497175216675},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.469880610704422},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4128246307373047},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.29340824484825134},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.28298792243003845},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.241209477186203},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20863518118858337},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.14157068729400635},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps46558.2021.9405155","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps46558.2021.9405155","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1583499813","https://openalex.org/W1730175705","https://openalex.org/W2102352834","https://openalex.org/W2135132351","https://openalex.org/W2155418451","https://openalex.org/W2527438975","https://openalex.org/W2780706692","https://openalex.org/W2802502993","https://openalex.org/W2929001642","https://openalex.org/W2945018636","https://openalex.org/W3030454559","https://openalex.org/W3037038174","https://openalex.org/W3086979620","https://openalex.org/W3094528804","https://openalex.org/W3094742621","https://openalex.org/W3119969230","https://openalex.org/W3158575979","https://openalex.org/W6795311044"],"related_works":["https://openalex.org/W1980203814","https://openalex.org/W2965295431","https://openalex.org/W2325428709","https://openalex.org/W2254931227","https://openalex.org/W2390155750","https://openalex.org/W2359833044","https://openalex.org/W2225406648","https://openalex.org/W1603736412","https://openalex.org/W2386785728","https://openalex.org/W2037069556"],"abstract_inverted_index":{"A":[0],"stochastic":[1,25],"Reaction-Diffusion-Drift":[2],"(RDD)":[3],"model":[4],"framework":[5],"is":[6,39,44,65,81],"proposed":[7],"for":[8,74],"trap":[9],"time":[10,59],"kinetics":[11,43,60],"under":[12],"Hot":[13],"Carrier":[14],"Degradation":[15],"(HCD)":[16],"stress":[17,64,80],"and":[18,32,51,62],"post-stress":[19],"conditions.":[20],"Consistency":[21],"of":[22,72],"the":[23,68,75],"3-D":[24,27],"RDD,":[26],"TCAD":[28],"incorporated":[29],"deterministic":[30,36],"RDD":[31,37],"an":[33],"\u201cequivalent\u201d":[34],"1-D":[35],"frameworks":[38],"shown.":[40],"Measured":[41],"HCD":[42,50,58,77],"decoupled":[45],"into":[46],"contributions":[47],"by":[48],"pure":[49,57,76],"Bias":[52],"Temperature":[53],"Instability":[54],"(BTI).":[55],"The":[56],"during":[61],"after":[63,79],"modeled":[66],"using":[67],"above":[69],"frameworks.":[70],"Lack":[71],"recovery":[73],"component":[78],"explained.":[82]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}