{"id":"https://openalex.org/W3039940585","doi":"https://doi.org/10.1109/irps45951.2020.9129621","title":"Characterizing Energetic Dependence of Low-Energy Neutron-induced MCUs in 65 nm bulk SRAMs","display_name":"Characterizing Energetic Dependence of Low-Energy Neutron-induced MCUs in 65 nm bulk SRAMs","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3039940585","doi":"https://doi.org/10.1109/irps45951.2020.9129621","mag":"3039940585"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9129621","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129621","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065071055","display_name":"Wang Liao","orcid":"https://orcid.org/0000-0003-2134-5588"},"institutions":[{"id":"https://openalex.org/I35568498","display_name":"Kochi University of Technology","ror":"https://ror.org/00rghrr56","country_code":"JP","type":"education","lineage":["https://openalex.org/I35568498"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Wang Liao","raw_affiliation_strings":["School of System Engineering, Kochi University of Technology, Kami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of System Engineering, Kochi University of Technology, Kami, Japan","institution_ids":["https://openalex.org/I35568498"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075721481","display_name":"Kojiro Ito","orcid":"https://orcid.org/0000-0002-7962-2990"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kojiro Ito","raw_affiliation_strings":["Department of Information System Engineerings, Osaka University, Suita, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information System Engineerings, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015621925","display_name":"Yukio Mitsuyama","orcid":"https://orcid.org/0000-0001-8151-0085"},"institutions":[{"id":"https://openalex.org/I35568498","display_name":"Kochi University of Technology","ror":"https://ror.org/00rghrr56","country_code":"JP","type":"education","lineage":["https://openalex.org/I35568498"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukio Mitsuyama","raw_affiliation_strings":["School of System Engineering, Kochi University of Technology, Kami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of System Engineering, Kochi University of Technology, Kami, Japan","institution_ids":["https://openalex.org/I35568498"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Department of Information System Engineerings, Osaka University, Suita, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information System Engineerings, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2081,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.50868969,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/neutron","display_name":"Neutron","score":0.8126839399337769},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6102845072746277},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.5646956562995911},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.558434009552002},{"id":"https://openalex.org/keywords/neutron-temperature","display_name":"Neutron temperature","score":0.5410799384117126},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5212305784225464},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.4960421025753021},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4390040934085846},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.41194969415664673},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3839322626590729},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11791548132896423},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.0774683952331543},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.05456244945526123}],"concepts":[{"id":"https://openalex.org/C152568617","wikidata":"https://www.wikidata.org/wiki/Q2348","display_name":"Neutron","level":2,"score":0.8126839399337769},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6102845072746277},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.5646956562995911},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.558434009552002},{"id":"https://openalex.org/C27251351","wikidata":"https://www.wikidata.org/wiki/Q1969703","display_name":"Neutron temperature","level":3,"score":0.5410799384117126},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5212305784225464},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4960421025753021},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4390040934085846},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.41194969415664673},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3839322626590729},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11791548132896423},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0774683952331543},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.05456244945526123},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps45951.2020.9129621","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129621","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8500000238418579}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W130024161","https://openalex.org/W1560445260","https://openalex.org/W2099411639","https://openalex.org/W2110061914","https://openalex.org/W2123907815","https://openalex.org/W2215541762","https://openalex.org/W2768857792","https://openalex.org/W2798104185","https://openalex.org/W2905558805","https://openalex.org/W2964027539","https://openalex.org/W3187317723"],"related_works":["https://openalex.org/W2283836889","https://openalex.org/W4377022832","https://openalex.org/W2059913392","https://openalex.org/W2101610044","https://openalex.org/W2562468118","https://openalex.org/W2080370876","https://openalex.org/W2062100669","https://openalex.org/W2005776481","https://openalex.org/W2386418659","https://openalex.org/W1981755310"],"abstract_inverted_index":{"This":[0,17],"paper":[1],"studies":[2],"the":[3,22,26,31,35,40,47,50,58,67,73,80,91,102,114,121,137,143,146,150,160,170],"characteristic":[4],"of":[5,25,39,70,83,99,117,123,145,153],"MCUs":[6],"induced":[7],"by":[8,130],"monoenergetic":[9],"and":[10,54],"quasi-monoenergetic":[11],"low-energy":[12,147,161],"neutrons":[13,162],"in":[14,169],"65-nm":[15],"SRAM.":[16],"work":[18],"is":[19,76,86],"highlighted":[20],"with":[21,46,62],"characterized":[23],"dependence":[24,38],"MCU":[27,51,74,103,111,139],"cross":[28,42,52],"section":[29,43,53],"on":[30,136],"neutron":[32,64,118,148],"energy,":[33],"whereas":[34],"evaluated":[36],"energy":[37,69,98,119],"SEU":[41],"was":[44],"consistent":[45],"literature.":[48],"Both":[49],"its":[55],"proportion":[56,75,104,112],"to":[57,149],"total":[59,151],"events":[60],"increase":[61],"higher":[63],"energy.":[65],"At":[66],"onset":[68],"6.0":[71],"MeV,":[72,101],"51":[77],"%,":[78],"while":[79],"maximum":[81],"value":[82],"66":[84],"%":[85],"at":[87,95],"70":[88],"MeV.":[89],"On":[90],"other":[92],"hand,":[93],"even":[94,129],"a":[96],"lower":[97],"4.1":[100,131],"keeps":[105],"around":[106],"50":[107],"%.":[108],"The":[109,155],"high":[110],"over":[113],"wide":[115],"range":[116],"suggests":[120],"possibility":[122],"large-LET":[124],"secondary":[125],"ions":[126],"being":[127],"generated":[128],"MeV":[132,165],"neutrons.":[133],"Also,":[134],"based":[135],"measured":[138],"dependence,":[140],"we":[141],"calculated":[142,156],"contribution":[144],"SER":[152],"MCU.":[154],"result":[157],"indicates":[158],"that":[159],"below":[163],"10":[164],"are":[166],"mostly":[167],"negligible":[168],"terrestrial":[171],"environment.":[172]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}