{"id":"https://openalex.org/W2946350377","doi":"https://doi.org/10.1109/irps.2019.8720566","title":"Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers","display_name":"Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2946350377","doi":"https://doi.org/10.1109/irps.2019.8720566","mag":"2946350377"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720566","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720566","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/11380/1223173","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083166491","display_name":"Andrea Padovani","orcid":"https://orcid.org/0000-0003-1145-5257"},"institutions":[{"id":"https://openalex.org/I4210111989","display_name":"Molsoft (United States)","ror":"https://ror.org/024712k05","country_code":"US","type":"company","lineage":["https://openalex.org/I4210111989"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Andrea Padovani","raw_affiliation_strings":["MDLSoft Inc., Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"MDLSoft Inc., Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210111989"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068149790","display_name":"Milan Pe\u0161i\u0107","orcid":"https://orcid.org/0000-0002-1788-8945"},"institutions":[{"id":"https://openalex.org/I4210111989","display_name":"Molsoft (United States)","ror":"https://ror.org/024712k05","country_code":"US","type":"company","lineage":["https://openalex.org/I4210111989"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Milan Pesic","raw_affiliation_strings":["MDLSoft Inc., Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"MDLSoft Inc., Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210111989"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025156862","display_name":"Mondol Anik Kumar","orcid":"https://orcid.org/0000-0002-4341-1681"},"institutions":[{"id":"https://openalex.org/I4210111989","display_name":"Molsoft (United States)","ror":"https://ror.org/024712k05","country_code":"US","type":"company","lineage":["https://openalex.org/I4210111989"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mondol Anik Kumar","raw_affiliation_strings":["MDLSoft Inc., Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"MDLSoft Inc., Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210111989"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054453737","display_name":"Pieter Blomme","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Pieter Blomme","raw_affiliation_strings":["Micron, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Micron, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090266281","display_name":"A. Subirats","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Alexandre Subirats","raw_affiliation_strings":["Imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031476118","display_name":"Senthil Vadakupudhu Palayam","orcid":"https://orcid.org/0000-0002-0855-3377"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Senthil Vadakupudhupalayam","raw_affiliation_strings":["Imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046113314","display_name":"Md Zunaid Baten","orcid":"https://orcid.org/0000-0003-0656-2728"},"institutions":[{"id":"https://openalex.org/I183697816","display_name":"Bangladesh University of Engineering and Technology","ror":"https://ror.org/05a1qpv97","country_code":"BD","type":"education","lineage":["https://openalex.org/I183697816"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Zunaid Baten","raw_affiliation_strings":["Bangladesh University of Engineering and Technology, Dhaka, Bangladesh"],"affiliations":[{"raw_affiliation_string":"Bangladesh University of Engineering and Technology, Dhaka, Bangladesh","institution_ids":["https://openalex.org/I183697816"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003731777","display_name":"Luca Larcher","orcid":"https://orcid.org/0000-0002-9139-349X"},"institutions":[{"id":"https://openalex.org/I4210090508","display_name":"Azienda Sanitaria Unit\u00e0 Locale di Reggio Emilia","ror":"https://ror.org/001bbwj30","country_code":"IT","type":"healthcare","lineage":["https://openalex.org/I4210090508"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Larcher","raw_affiliation_strings":["DISMI, Reggio Emilia, Italy"],"affiliations":[{"raw_affiliation_string":"DISMI, Reggio Emilia, Italy","institution_ids":["https://openalex.org/I4210090508"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5083166491"],"corresponding_institution_ids":["https://openalex.org/I4210111989"],"apc_list":null,"apc_paid":null,"fwci":0.8436,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.73816493,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.7414067983627319},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.653923511505127},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.6255879998207092},{"id":"https://openalex.org/keywords/charge","display_name":"Charge (physics)","score":0.5724748969078064},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5624001622200012},{"id":"https://openalex.org/keywords/trapping","display_name":"Trapping","score":0.4900909662246704},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.4710412323474884},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4587445855140686},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4351559579372406},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4286724328994751},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.37144631147384644},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3472777009010315},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.24940958619117737},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19443875551223755},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11520683765411377},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.08343052864074707}],"concepts":[{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.7414067983627319},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.653923511505127},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.6255879998207092},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.5724748969078064},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5624001622200012},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.4900909662246704},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.4710412323474884},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4587445855140686},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4351559579372406},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4286724328994751},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37144631147384644},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3472777009010315},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.24940958619117737},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19443875551223755},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11520683765411377},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08343052864074707},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps.2019.8720566","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720566","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.unimore.it:11380/1223173","is_oa":true,"landing_page_url":"http://hdl.handle.net/11380/1223173","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:iris.unimore.it:11380/1223173","is_oa":true,"landing_page_url":"http://hdl.handle.net/11380/1223173","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1970919237","https://openalex.org/W1994992176","https://openalex.org/W2008147998","https://openalex.org/W2015057326","https://openalex.org/W2068787901","https://openalex.org/W2072891413","https://openalex.org/W2133878226","https://openalex.org/W2761857919","https://openalex.org/W4376552676"],"related_works":["https://openalex.org/W2054139911","https://openalex.org/W1577524679","https://openalex.org/W2386432552","https://openalex.org/W4230869547","https://openalex.org/W2489439822","https://openalex.org/W2355887979","https://openalex.org/W2116397085","https://openalex.org/W4285309357","https://openalex.org/W3165307257","https://openalex.org/W2515312339"],"abstract_inverted_index":{"3D":[0],"NAND":[1],"Flash":[2],"represents":[3],"the":[4,10,32,38,66,70,75,85,99,103],"unmatchable":[5],"non-":[6],"volatile":[7],"memory":[8],"concerning":[9],"bit-cost":[11],"scaling":[12],"efficiency":[13],"and":[14,40,46,73,77,105],"a":[15,58,80],"role":[16],"model":[17],"for":[18,69],"all":[19],"emerging":[20],"memories.":[21],"Yet":[22],"some":[23],"reliability":[24],"features":[25],"of":[26,31,43,65,82,84,109,124],"these":[27],"devices":[28],"i.e.":[29],"quantification":[30],"threshold":[33],"voltage":[34],"shift":[35],"due":[36],"to":[37],"lateral":[39],"vertical":[41],"migration/loss":[42],"charges":[44],"(LCL":[45],"VCL,":[47],"respectively)":[48],"is":[49],"not":[50],"fully":[51],"understood.":[52],"In":[53],"this":[54],"study":[55],"we":[56,87],"use":[57],"multi-scale":[59],"modeling":[60],"approach":[61],"start":[62],"from":[63],"identification":[64],"defects":[67],"responsible":[68],"charge":[71,100,111],"trapping":[72],"quantify":[74],"LCL":[76,97],"VLC.":[78],"As":[79],"part":[81],"engineering":[83],"barrier":[86],"investigate":[88],"also":[89],"band-gap":[90],"engineered":[91],"(BGE)":[92],"devices.":[93],"We":[94],"show":[95],"that":[96,106],"dominates":[98],"loss":[101],"during":[102],"retention":[104],"highest":[107],"portion":[108],"injected":[110],"ends":[112],"up":[113],"in":[114],"Al":[115],"<sub":[116,120],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[117,121],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[118],"O":[119],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">3</sub>":[122],"layer":[123],"BGE":[125],"device.":[126]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}