{"id":"https://openalex.org/W2945329304","doi":"https://doi.org/10.1109/irps.2019.8720470","title":"Evaluating Impact of Information Uncertainties on Component Reliability Assessment","display_name":"Evaluating Impact of Information Uncertainties on Component Reliability Assessment","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2945329304","doi":"https://doi.org/10.1109/irps.2019.8720470","mag":"2945329304"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720470","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720470","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012329195","display_name":"Diganta Das","orcid":"https://orcid.org/0000-0001-9097-2118"},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Diganta Das","raw_affiliation_strings":["Center for Advanced Life Cycle Engineering, University of Maryland, College Park, Maryland, USA"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Life Cycle Engineering, University of Maryland, College Park, Maryland, USA","institution_ids":["https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031336847","display_name":"Edmond Elburn","orcid":null},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Edmond Elburn","raw_affiliation_strings":["Center for Advanced Life Cycle Engineering, University of Maryland, College Park, Maryland, USA"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Life Cycle Engineering, University of Maryland, College Park, Maryland, USA","institution_ids":["https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013287421","display_name":"Michael Pecht","orcid":"https://orcid.org/0000-0003-1126-8662"},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Pecht","raw_affiliation_strings":["Center for Advanced Life Cycle Engineering, University of Maryland, College Park, Maryland, USA"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Life Cycle Engineering, University of Maryland, College Park, Maryland, USA","institution_ids":["https://openalex.org/I66946132"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054938859","display_name":"Bhanu Sood","orcid":"https://orcid.org/0000-0002-0468-9074"},"institutions":[{"id":"https://openalex.org/I1306266525","display_name":"Goddard Space Flight Center","ror":"https://ror.org/0171mag52","country_code":"US","type":"facility","lineage":["https://openalex.org/I1306266525","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bhanu Sood","raw_affiliation_strings":["NASA Goddard Space Flight Center, Greenbelt, Maryland"],"affiliations":[{"raw_affiliation_string":"NASA Goddard Space Flight Center, Greenbelt, Maryland","institution_ids":["https://openalex.org/I1306266525"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5012329195"],"corresponding_institution_ids":["https://openalex.org/I66946132"],"apc_list":null,"apc_paid":null,"fwci":0.6517,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.68876102,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"9145","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9810000061988831,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9747999906539917,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7945388555526733},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7703875303268433},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.7006840109825134},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.6975986361503601},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6873748898506165},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6544523239135742},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.44394341111183167},{"id":"https://openalex.org/keywords/information-quality","display_name":"Information quality","score":0.44027209281921387},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.38317418098449707},{"id":"https://openalex.org/keywords/information-system","display_name":"Information system","score":0.3133791387081146},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20001220703125},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10767340660095215}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7945388555526733},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7703875303268433},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.7006840109825134},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.6975986361503601},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6873748898506165},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6544523239135742},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.44394341111183167},{"id":"https://openalex.org/C45983554","wikidata":"https://www.wikidata.org/wiki/Q3412851","display_name":"Information quality","level":3,"score":0.44027209281921387},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.38317418098449707},{"id":"https://openalex.org/C180198813","wikidata":"https://www.wikidata.org/wiki/Q121182","display_name":"Information system","level":2,"score":0.3133791387081146},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20001220703125},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10767340660095215},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2019.8720470","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720470","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2924909496","https://openalex.org/W3148885632","https://openalex.org/W4302489269"],"related_works":["https://openalex.org/W2183133984","https://openalex.org/W2891233567","https://openalex.org/W3216334995","https://openalex.org/W2400064296","https://openalex.org/W45106814","https://openalex.org/W604614931","https://openalex.org/W2115713508","https://openalex.org/W2967493338","https://openalex.org/W2105381387","https://openalex.org/W2136860952"],"abstract_inverted_index":{"The":[0],"predicted":[1],"reliability":[2,32,111,147],"of":[3,21,80,82,137],"an":[4],"electronic":[5],"component":[6],"is":[7,97,116],"dependent":[8],"on":[9,146],"application":[10],"conditions,":[11],"part":[12],"characteristics,":[13],"and":[14,85,101,127,131,143],"modeling":[15],"constants.":[16],"Information":[17],"related":[18],"to":[19,34,62],"each":[20,38],"these":[22],"factors":[23],"must":[24],"be":[25,35,41,54,107],"found":[26],"(or":[27],"approximated)":[28],"for":[29,99,109,122,129],"a":[30,44],"proper":[31],"estimation":[33],"made.":[36],"As":[37],"input":[39,75],"can":[40,53,106],"treated":[42],"as":[43],"distribution":[45,64],"representing":[46],"information":[47,51,84,95,115,124],"uncertainty,":[48],"the":[49,56,59,78,87,90,94,134],"more":[50],"that":[52,96,105],"found,":[55],"less":[57],"uncertain":[58],"final":[60],"time":[61],"failure":[63,140],"assessment":[65],"will":[66],"be.":[67],"In":[68],"this":[69],"paper,":[70],"we":[71,119],"show":[72],"three":[73],"main":[74],"aspects":[76],"in":[77,89,139],"context":[79],"methods":[81,121],"collecting":[83],"quantifying":[86,123],"uncertainty":[88,138],"information.":[91],"We":[92],"evaluated":[93],"available":[98],"COTS":[100],"non-COTS":[102],"semiconductor":[103],"parts":[104],"used":[108],"completing":[110],"assessments.":[112,148],"When":[113],"such":[114],"not":[117],"available,":[118],"developed":[120],"availability,":[125],"consistency,":[126],"quality":[128],"parts,":[130],"finally":[132],"evaluate":[133],"different":[135],"sources":[136],"model":[141],"inputs":[142],"their":[144],"impact":[145]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}