{"id":"https://openalex.org/W2946270783","doi":"https://doi.org/10.1109/irps.2019.8720437","title":"Nonlinear Mixed Model and Reliability Prediction for OLED Luminance Degradation","display_name":"Nonlinear Mixed Model and Reliability Prediction for OLED Luminance Degradation","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2946270783","doi":"https://doi.org/10.1109/irps.2019.8720437","mag":"2946270783"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720437","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720437","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043170949","display_name":"Kanghyun Choi","orcid":"https://orcid.org/0000-0002-4238-8176"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Kanghyun Choi","raw_affiliation_strings":["Technology Reliability, OLED Business Samsung Display, Asan-si, Chungcheongnam-Do, Korea"],"affiliations":[{"raw_affiliation_string":"Technology Reliability, OLED Business Samsung Display, Asan-si, Chungcheongnam-Do, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100626973","display_name":"Jongwon Lee","orcid":"https://orcid.org/0000-0003-2368-6191"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongwon Lee","raw_affiliation_strings":["Technology Reliability, OLED Business Samsung Display, Asan-si, Chungcheongnam-Do, Korea"],"affiliations":[{"raw_affiliation_string":"Technology Reliability, OLED Business Samsung Display, Asan-si, Chungcheongnam-Do, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108684761","display_name":"Jongwoo Park","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongwoo Park","raw_affiliation_strings":["Technology Reliability, OLED Business Samsung Display, Asan-si, Chungcheongnam-Do, Korea"],"affiliations":[{"raw_affiliation_string":"Technology Reliability, OLED Business Samsung Display, Asan-si, Chungcheongnam-Do, Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5043170949"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":0.5961,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.6808682,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"80","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10611","display_name":"Organic Light-Emitting Diodes Research","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10611","display_name":"Organic Light-Emitting Diodes Research","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9765999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9611999988555908,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/luminance","display_name":"Luminance","score":0.778181791305542},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7747611403465271},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7358071804046631},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6782802939414978},{"id":"https://openalex.org/keywords/oled","display_name":"OLED","score":0.6484469771385193},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.6167038679122925},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.48684996366500854},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.21492356061935425},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17511805891990662},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11481291055679321},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09785404801368713},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0672694742679596},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.05551481246948242}],"concepts":[{"id":"https://openalex.org/C73313986","wikidata":"https://www.wikidata.org/wiki/Q355386","display_name":"Luminance","level":2,"score":0.778181791305542},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7747611403465271},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7358071804046631},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6782802939414978},{"id":"https://openalex.org/C150759737","wikidata":"https://www.wikidata.org/wiki/Q209593","display_name":"OLED","level":3,"score":0.6484469771385193},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.6167038679122925},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48684996366500854},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.21492356061935425},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17511805891990662},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11481291055679321},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09785404801368713},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0672694742679596},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.05551481246948242},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2019.8720437","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720437","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1999997583","https://openalex.org/W2034295797","https://openalex.org/W2142635246","https://openalex.org/W2184707848","https://openalex.org/W2342548755","https://openalex.org/W2582743722","https://openalex.org/W2802326141","https://openalex.org/W4206439534"],"related_works":["https://openalex.org/W2157038844","https://openalex.org/W2033512842","https://openalex.org/W1815542355","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2047067935"],"abstract_inverted_index":{"In":[0,82],"this":[1],"study,":[2],"we":[3],"develop":[4],"a":[5,22,87],"nonlinear":[6],"mixed":[7,45],"modeling":[8],"for":[9,98,109],"the":[10,79,93,99,119],"luminance":[11],"degradation":[12],"of":[13,28,57,92,101],"flexible":[14],"OLED,":[15],"enabling":[16],"precise":[17,88],"lifetime":[18,89],"prediction":[19,90],"even":[20],"with":[21,114],"limited":[23],"data":[24,68],"obtained":[25],"from":[26],"48h":[27],"aging":[29],"tests.":[30],"A":[31],"4-parameter":[32],"exponential":[33,74],"model":[34],"is":[35,40,63,107],"employed,":[36],"and":[37,72],"its":[38],"parameter":[39],"estimated":[41],"by":[42,78],"NLME":[43,62,84],"(nonlinear":[44,49],"effect":[46],"model)and":[47],"NLS":[48,71],"least":[50],"square)method":[51],"respectively.":[52],"Considering":[53],"time-dependent":[54],"random":[55],"behaviors":[56],"an":[58],"emissive":[59],"layer":[60],"deterioration,":[61],"better":[64],"fitted":[65],"to":[66],"empirical":[67],"set":[69],"than":[70],"stretched":[73],"decay":[75],"(SED),":[76],"examined":[77],"goodness-of-fit":[80],"test.":[81],"fact,":[83],"method":[85],"provides":[86],"within":[91],"mean":[94],"absolute":[95],"error":[96],"percentage":[97],"estimation":[100],"long-term":[102],"reliability":[103],"at":[104],"1,000h,":[105],"which":[106],"benefit":[108],"technical":[110],"feasibility":[111],"judgement":[112],"particularly":[113],"fast":[115],"turnaround":[116],"feedback":[117],"in":[118],"earlier":[120],"stage":[121],"development.":[122]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}