{"id":"https://openalex.org/W1528415616","doi":"https://doi.org/10.1109/irps.2015.7112794","title":"ESD protection clamp with active feedback and mis-trigger immunity in 28nm CMOS process","display_name":"ESD protection clamp with active feedback and mis-trigger immunity in 28nm CMOS process","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1528415616","doi":"https://doi.org/10.1109/irps.2015.7112794","mag":"1528415616"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2015.7112794","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112794","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103412871","display_name":"Srivatsan Parthasarathy","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Srivatsan Parthasarathy","raw_affiliation_strings":["Analog Devices, Inc., Wilmington, MA, USA",", Analog Devices, Inc., Wilmington, MA, USA"],"affiliations":[{"raw_affiliation_string":"Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":", Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004199779","display_name":"Javier A. Salcedo","orcid":"https://orcid.org/0000-0001-8999-2998"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Javier A. Salcedo","raw_affiliation_strings":["Analog Devices, Inc., Wilmington, MA, USA",", Analog Devices, Inc., Wilmington, MA, USA"],"affiliations":[{"raw_affiliation_string":"Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":", Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017279451","display_name":"Sandro Herrera","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sandro Herrera","raw_affiliation_strings":["Analog Devices, Inc., Wilmington, MA, USA",", Analog Devices, Inc., Wilmington, MA, USA"],"affiliations":[{"raw_affiliation_string":"Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":", Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110613093","display_name":"Jean-Jacques Hajjar","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jean-Jacques Hajjar","raw_affiliation_strings":["Analog Devices, Inc., Wilmington, MA, USA",", Analog Devices, Inc., Wilmington, MA, USA"],"affiliations":[{"raw_affiliation_string":"Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":", Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5103412871"],"corresponding_institution_ids":["https://openalex.org/I117023288"],"apc_list":null,"apc_paid":null,"fwci":0.3946,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.64926621,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"EL.3.1","last_page":"EL.3.5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7112920880317688},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6460477113723755},{"id":"https://openalex.org/keywords/clamping","display_name":"Clamping","score":0.5858103036880493},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5501700639724731},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4945826232433319},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49237382411956787},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4866255223751068},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4726359248161316},{"id":"https://openalex.org/keywords/clamp","display_name":"Clamp","score":0.4720367193222046},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4518732726573944},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.441118061542511},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43763619661331177},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.43504226207733154},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0814649760723114}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7112920880317688},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6460477113723755},{"id":"https://openalex.org/C84111939","wikidata":"https://www.wikidata.org/wiki/Q5125465","display_name":"Clamping","level":2,"score":0.5858103036880493},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5501700639724731},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4945826232433319},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49237382411956787},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4866255223751068},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4726359248161316},{"id":"https://openalex.org/C2776161997","wikidata":"https://www.wikidata.org/wiki/Q846600","display_name":"Clamp","level":3,"score":0.4720367193222046},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4518732726573944},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.441118061542511},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43763619661331177},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43504226207733154},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0814649760723114},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2015.7112794","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112794","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1565155074","https://openalex.org/W1966291942","https://openalex.org/W2054830385","https://openalex.org/W2058946591","https://openalex.org/W2120399117","https://openalex.org/W2124399691","https://openalex.org/W2143335074","https://openalex.org/W2172954419","https://openalex.org/W6633908552","https://openalex.org/W6664412251","https://openalex.org/W6665272232","https://openalex.org/W6681240150","https://openalex.org/W6684530264"],"related_works":["https://openalex.org/W2022341425","https://openalex.org/W2149437626","https://openalex.org/W3036944672","https://openalex.org/W2375338697","https://openalex.org/W4231525483","https://openalex.org/W2020386169","https://openalex.org/W1683412264","https://openalex.org/W2384001192","https://openalex.org/W2365506001","https://openalex.org/W2381874526"],"abstract_inverted_index":{"Data":[0],"Converters":[1],"in":[2,16],"28nm":[3],"CMOS":[4],"processes":[5],"have":[6],"the":[7,19,44,56,65,68,90],"need":[8],"to":[9,18,60,80,85],"support":[10],"higher":[11,45],"voltage":[12,75],"power":[13],"supply":[14,31,46,57],"domains":[15],"addition":[17],"more":[20],"traditional":[21],"core":[22],"and":[23,73,87],"I/O":[24],"voltages.":[25],"In":[26],"this":[27],"work":[28],"a":[29,38],"new":[30],"clamp":[32,58],"architecture":[33,59],"is":[34,53,77],"proposed":[35],"which":[36],"ensures":[37],"reliable":[39,82],"low":[40],"leakage":[41],"performance":[42],"at":[43],"voltages":[47],"(2.5V/3.3V).":[48],"An":[49],"active":[50],"feedback":[51],"network":[52],"designed":[54],"into":[55],"ensure":[61,81],"uniform":[62],"clamping":[63],"during":[64],"duration":[66],"of":[67],"ESD":[69],"event.":[70],"Miss-trigger":[71],"immunity":[72],"over":[74],"protection":[76],"additionally":[78],"incorporated":[79],"functionality":[83],"up":[84],"3.3V":[86],"across":[88],"all":[89],"process":[91],"corners.":[92]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}