{"id":"https://openalex.org/W1483499953","doi":"https://doi.org/10.1109/irps.2015.7112764","title":"Analyzing path delays for accelerated testing of logic chips","display_name":"Analyzing path delays for accelerated testing of logic chips","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1483499953","doi":"https://doi.org/10.1109/irps.2015.7112764","mag":"1483499953"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2015.7112764","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112764","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052641717","display_name":"Emily M. Ray","orcid":"https://orcid.org/0000-0001-6807-7491"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Emily Ray","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077091939","display_name":"B.P. Linder","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Barry Linder","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113500205","display_name":"R. P. Robertazzi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Raphael Robertazzi","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044532211","display_name":"Kevin Stawiasz","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kevin Stawiasz","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088957863","display_name":"Alan J. Weger","orcid":"https://orcid.org/0000-0001-8557-9573"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alan Weger","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069277366","display_name":"Emmanuel Yashchin","orcid":"https://orcid.org/0000-0002-8634-671X"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Emmanuel Yashchin","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036267166","display_name":"J. H. Stathis","orcid":"https://orcid.org/0000-0001-8340-2475"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James Stathis","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080343787","display_name":"Peilin Song","orcid":"https://orcid.org/0000-0003-4793-3230"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peilin Song","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5052641717"],"corresponding_institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.01515735,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"60","issue":null,"first_page":"6B.4.1","last_page":"6B.4.7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.6501196026802063},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5781309604644775},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.551472544670105},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5266463756561279},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.495034396648407},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.49054163694381714},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47017306089401245},{"id":"https://openalex.org/keywords/stress-testing","display_name":"Stress testing (software)","score":0.4588644206523895},{"id":"https://openalex.org/keywords/functional-testing","display_name":"Functional testing","score":0.4357988238334656},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4292401075363159},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.4188392162322998},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4095323085784912},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.24294909834861755},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21020451188087463},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1716955304145813}],"concepts":[{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6501196026802063},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5781309604644775},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.551472544670105},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5266463756561279},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.495034396648407},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.49054163694381714},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47017306089401245},{"id":"https://openalex.org/C7515471","wikidata":"https://www.wikidata.org/wiki/Q1936882","display_name":"Stress testing (software)","level":2,"score":0.4588644206523895},{"id":"https://openalex.org/C80823478","wikidata":"https://www.wikidata.org/wiki/Q4493432","display_name":"Functional testing","level":3,"score":0.4357988238334656},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4292401075363159},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.4188392162322998},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4095323085784912},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.24294909834861755},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21020451188087463},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1716955304145813},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2015.7112764","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112764","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W47629714","https://openalex.org/W1973178345","https://openalex.org/W1989874002","https://openalex.org/W2002071358","https://openalex.org/W2113764022","https://openalex.org/W2124222584","https://openalex.org/W2134788069","https://openalex.org/W2144085963","https://openalex.org/W2148381290","https://openalex.org/W2154582503","https://openalex.org/W2167724032","https://openalex.org/W2171540755","https://openalex.org/W2542616127","https://openalex.org/W6601940412"],"related_works":["https://openalex.org/W4396779139","https://openalex.org/W2588941787","https://openalex.org/W2397379759","https://openalex.org/W4290402610","https://openalex.org/W2672686872","https://openalex.org/W2920295218","https://openalex.org/W2461203194","https://openalex.org/W1549423346","https://openalex.org/W30898149","https://openalex.org/W2437806143"],"abstract_inverted_index":{"We":[0],"develop":[1],"a":[2,19,41,52,59],"test":[3,65],"methodology":[4],"utilizing":[5],"the":[6,14,37],"critical":[7],"path":[8],"delay":[9],"to":[10,55,68],"monitor":[11],"and":[12,47,74],"predict":[13],"degradation":[15,38],"of":[16,40],"circuits":[17],"during":[18,31],"ramp":[20],"voltage":[21],"stress":[22],"(RVS).":[23],"Stress":[24],"is":[25],"applied":[26],"by":[27],"looping":[28],"functional":[29,42],"patterns":[30],"RVS.":[32],"Our":[33],"results":[34],"demonstrate":[35],"that":[36,56],"behavior":[39],"circuit":[43],"can":[44],"be":[45],"characterized":[46],"analyzed":[48],"with":[49,71],"RVS":[50],"in":[51],"manner":[53],"similar":[54],"developed":[57],"for":[58],"single":[60],"transistor.":[61],"This":[62],"alternative":[63],"fast":[64],"lends":[66],"itself":[67],"in-line":[69],"testing":[70],"reduced":[72],"times":[73],"small":[75],"sample":[76],"numbers.":[77]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}