{"id":"https://openalex.org/W1603518645","doi":"https://doi.org/10.1109/irps.2015.7112669","title":"A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)","display_name":"A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1603518645","doi":"https://doi.org/10.1109/irps.2015.7112669","mag":"1603518645"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2015.7112669","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112669","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012609593","display_name":"Ernest Y. Wu","orcid":"https://orcid.org/0000-0003-4979-1029"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ernest Wu","raw_affiliation_strings":["IBM Research Division, Essex Junction, VT, USA","IBM Research Division, Essex Junction, VT, (USA)"],"affiliations":[{"raw_affiliation_string":"IBM Research Division, Essex Junction, VT, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM Research Division, Essex Junction, VT, (USA)","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036267166","display_name":"J. H. Stathis","orcid":"https://orcid.org/0000-0001-8340-2475"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James Stathis","raw_affiliation_strings":["IBM System and Technology Group, IBM Research Division, Yorktown Heights, NY, USA","IBM Research Division,Yorktown Heights,NY,USA"],"affiliations":[{"raw_affiliation_string":"IBM System and Technology Group, IBM Research Division, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM Research Division,Yorktown Heights,NY,USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101406296","display_name":"Baozhen Li","orcid":"https://orcid.org/0000-0002-6054-5729"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Baozhen Li","raw_affiliation_strings":["IBM Research Division, Essex Junction, VT, USA","IBM System and Technology Group, Essex Junction, VT (USA)"],"affiliations":[{"raw_affiliation_string":"IBM Research Division, Essex Junction, VT, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM System and Technology Group, Essex Junction, VT (USA)","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077091939","display_name":"B.P. Linder","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Barry Linder","raw_affiliation_strings":["IBM System and Technology Group, IBM Research Division, Yorktown Heights, NY, USA","IBM Research Division,Yorktown Heights,NY,USA"],"affiliations":[{"raw_affiliation_string":"IBM System and Technology Group, IBM Research Division, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM Research Division,Yorktown Heights,NY,USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100643410","display_name":"Kai Zhao","orcid":"https://orcid.org/0000-0001-5328-3962"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kai Zhao","raw_affiliation_strings":["IBM Research Division, Hopewell Junction, NY, USA","IBM System and Technology Group, Hopewell Junction, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Research Division, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM System and Technology Group, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018104184","display_name":"Griselda Bonilla","orcid":"https://orcid.org/0000-0002-4665-0645"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Griselda Bonilla","raw_affiliation_strings":["IBM System and Technology Group, IBM Research Division, Yorktown Heights, NY, USA","IBM Research Division,Yorktown Heights,NY,USA"],"affiliations":[{"raw_affiliation_string":"IBM System and Technology Group, IBM Research Division, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM Research Division,Yorktown Heights,NY,USA","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5012609593"],"corresponding_institution_ids":["https://openalex.org/I1341412227"],"apc_list":null,"apc_paid":null,"fwci":0.8164,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.68845388,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"2A.2.1","last_page":"2A.2.11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9704999923706055,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9207000136375427,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6998651623725891},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5526576042175293},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48481765389442444},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.46834585070610046},{"id":"https://openalex.org/keywords/electric-breakdown","display_name":"Electric breakdown","score":0.4545038342475891},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3937879204750061},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37351739406585693},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1521688997745514},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0884225070476532}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6998651623725891},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5526576042175293},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48481765389442444},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.46834585070610046},{"id":"https://openalex.org/C2984221369","wikidata":"https://www.wikidata.org/wiki/Q422584","display_name":"Electric breakdown","level":3,"score":0.4545038342475891},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3937879204750061},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37351739406585693},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1521688997745514},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0884225070476532},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2015.7112669","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112669","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2053668343","https://openalex.org/W2076353393","https://openalex.org/W2362940819","https://openalex.org/W2086745820","https://openalex.org/W1908385343","https://openalex.org/W1620532008","https://openalex.org/W3048822953","https://openalex.org/W2363540792","https://openalex.org/W2575281867","https://openalex.org/W1971303789"],"abstract_inverted_index":{"We":[0,173],"investigate":[1],"the":[2,5,21,43,47,114,126,148,186],"validity":[3,127],"of":[4,27,46,105,116,125,128,188],"sampling-based":[6],"reconstruction":[7,130,176,189],"methodology":[8,83,177,190],"for":[9],"its":[10,206,209,212],"general":[11],"applications":[12],"to":[13,50,88,201,205],"dielectric":[14],"breakdown":[15],"with":[16,70,97,143],"variability":[17],"or":[18],"non-uniformity.":[19],"For":[20],"first":[22],"time,":[23],"a":[24,52,122],"sampling-number":[25],"dependence":[26],"reconstructed":[28,48],"Weibull":[29],"slope":[30],"is":[31,79,199],"reported.":[32],"Through":[33],"both":[34],"experimental":[35],"studies":[36],"and":[37,94,107,154,156,178,211],"Monte":[38],"Carlo":[39],"simulation,":[40],"we":[41,111,146],"confirm":[42],"original":[44],"concept":[45],"distribution":[49,53],"represent":[51],"as":[54,59,92],"if":[55,166],"no":[56],"thickness/spacing":[57],"variation":[58],"advanced":[60],"by":[61,66],"Roussel":[62],"et":[63],"al.":[64],"[1],":[65],"using":[67,168,214],"gate":[68],"oxides":[69],"very":[71,169],"tight":[72],"thickness":[73],"control.":[74],"Despite":[75],"this":[76,82,129],"success,":[77],"it":[78],"unclear":[80],"whether":[81],"can":[84,120,162,191],"be":[85,163,192,202],"generally":[86],"applied":[87],"complicated":[89],"systems":[90],"such":[91],"BEOL":[93],"MOL":[95],"dielectrics":[96],"large":[98,170],"variation.":[99],"By":[100],"comparing":[101],"two":[102],"different":[103],"cases":[104],"slightly":[106],"highly":[108],"non-uniform":[109],"dielectrics,":[110],"show":[112],"that":[113,175],"use":[115],"small":[117,215],"sampling":[118,171],"number":[119],"give":[121],"false":[123],"impression":[124],"methodology.":[131],"Using":[132],"detailed":[133],"in-die":[134,150],"T":[135],"<sub":[136],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[137],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">BD</sub>":[138],"distributions":[139,151],"across":[140],"entire":[141],"wafers":[142],"extraordinary":[144],"statistics,":[145],"reveal":[147],"underlying":[149],"being":[152],"bimodal":[153],"non-Weibull,":[155],"following":[157],"non-Poisson":[158],"area":[159],"scaling,":[160],"which":[161],"completely":[164],"masked":[165],"not":[167],"numbers.":[172],"demonstrate":[174],"time-dependent":[179,196],"clustering":[180,197],"model":[181,198],"yield":[182],"comparable":[183],"results":[184],"when":[185],"assumptions":[187],"satisfied.":[193],"In":[194],"comparison,":[195],"shown":[200],"advantageous":[203],"due":[204],"simplicity":[207],"in":[208],"implementation":[210],"predictability":[213],"statistics.":[216]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}