{"id":"https://openalex.org/W4386211362","doi":"https://doi.org/10.1109/iolts59296.2023.10224880","title":"SLM ISA and Hardware Extensions for RISC-V Processors","display_name":"SLM ISA and Hardware Extensions for RISC-V Processors","publication_year":2023,"publication_date":"2023-07-03","ids":{"openalex":"https://openalex.org/W4386211362","doi":"https://doi.org/10.1109/iolts59296.2023.10224880"},"language":"en","primary_location":{"id":"doi:10.1109/iolts59296.2023.10224880","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/iolts59296.2023.10224880","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025604223","display_name":"Seyedeh Maryam Ghasemi","orcid":"https://orcid.org/0000-0003-3501-4472"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"S. Maryam Ghasemi","raw_affiliation_strings":["Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010769003","display_name":"Sergej Meschkov","orcid":"https://orcid.org/0000-0003-1552-589X"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sergej Meschkov","raw_affiliation_strings":["Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022816225","display_name":"Jonas Krautter","orcid":"https://orcid.org/0000-0002-7492-5319"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jonas Krautter","raw_affiliation_strings":["Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026813167","display_name":"Dennis R. E. Gnad","orcid":"https://orcid.org/0000-0002-2839-4692"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dennis R. E. Gnad","raw_affiliation_strings":["Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064445713","display_name":"Mehdi B. Tahoori","orcid":"https://orcid.org/0000-0002-8829-5610"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mehdi B. Tahoori","raw_affiliation_strings":["Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5025604223"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":0.2678,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.5370783,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"26","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reduced-instruction-set-computing","display_name":"Reduced instruction set computing","score":0.7223590612411499},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6306966543197632},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6306329369544983},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5940492749214172},{"id":"https://openalex.org/keywords/maintainability","display_name":"Maintainability","score":0.5262379050254822},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.44192585349082947},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.43379783630371094},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.41926848888397217},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4173153042793274},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.410768985748291},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3786785304546356},{"id":"https://openalex.org/keywords/instruction-set","display_name":"Instruction set","score":0.32690906524658203},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2228643000125885},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.18493998050689697},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1621609628200531},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.11218860745429993},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.11101576685905457},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09600397944450378}],"concepts":[{"id":"https://openalex.org/C126298526","wikidata":"https://www.wikidata.org/wiki/Q189376","display_name":"Reduced instruction set computing","level":3,"score":0.7223590612411499},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6306966543197632},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6306329369544983},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5940492749214172},{"id":"https://openalex.org/C160713754","wikidata":"https://www.wikidata.org/wiki/Q1389965","display_name":"Maintainability","level":2,"score":0.5262379050254822},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.44192585349082947},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43379783630371094},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.41926848888397217},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4173153042793274},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.410768985748291},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3786785304546356},{"id":"https://openalex.org/C202491316","wikidata":"https://www.wikidata.org/wiki/Q272683","display_name":"Instruction set","level":2,"score":0.32690906524658203},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2228643000125885},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.18493998050689697},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1621609628200531},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.11218860745429993},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.11101576685905457},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09600397944450378}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts59296.2023.10224880","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/iolts59296.2023.10224880","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W598643494","https://openalex.org/W1585229822","https://openalex.org/W2036917908","https://openalex.org/W3023052894","https://openalex.org/W3038834620","https://openalex.org/W3040443268","https://openalex.org/W3140239545","https://openalex.org/W3157485505","https://openalex.org/W4225324920","https://openalex.org/W4296338928","https://openalex.org/W4301492010","https://openalex.org/W4378806047","https://openalex.org/W6792427158"],"related_works":["https://openalex.org/W2538644970","https://openalex.org/W4376881175","https://openalex.org/W4310584696","https://openalex.org/W4385730960","https://openalex.org/W4237840813","https://openalex.org/W2128502296","https://openalex.org/W2993622674","https://openalex.org/W1833044483","https://openalex.org/W4382053335","https://openalex.org/W2036206036"],"abstract_inverted_index":{"Nowadays,":[0],"RISC-V":[1,106],"processors":[2],"have":[3],"attracted":[4],"much":[5],"attention":[6],"due":[7],"to":[8,48,60,89,136,151],"their":[9],"extendability,":[10],"for":[11,101,123],"targeting":[12],"high":[13],"performance":[14],"applications":[15,68],"with":[16],"strict":[17],"demands":[18],"on":[19],"functional":[20,33],"safety.":[21],"Silicon":[22],"Lifecycle":[23],"Management":[24],"(SLM)":[25],"is":[26],"a":[27,105,134],"new":[28],"emerging":[29],"concept":[30,46],"aiming":[31],"at":[32],"safety":[34,63],"among":[35],"other":[36],"features":[37],"such":[38],"as":[39,80,82,133],"availability,":[40],"maintainability,":[41],"and":[42,118,127],"lifetime":[43],"extension.":[44],"This":[45],"helps":[47],"monitor":[49,152],"the":[50,57,75,87,141,146],"system":[51,150,159],"health":[52],"during":[53],"its":[54],"lifecycle,":[55],"in":[56,104,140,155],"various":[58],"timespans,":[59],"ensure":[61],"that":[62],"margins":[64],"while":[65],"running":[66],"critical":[67],"are":[69],"not":[70],"exceeded.":[71],"Hence,":[72],"enabling":[73,102],"both":[74],"collection":[76],"of":[77,148],"chip":[78,153],"parametrics":[79],"well":[81],"in-field":[83],"testing":[84],"will":[85],"provide":[86],"means":[88],"fulfill":[90],"this":[91,94,110,149],"concept.":[92],"In":[93],"work,":[95],"we":[96,112,144],"propose":[97],"instruction":[98],"set":[99],"extensions":[100],"SLM":[103],"based":[107],"system.":[108],"For":[109],"purpose,":[111],"introduce":[113],"Path":[114],"Transient":[115],"Monitors":[116,121],"(PTM)":[117],"Voltage":[119],"Fluctuations":[120],"(VFM)":[122],"monitoring":[124],"path":[125],"delay":[126],"voltage":[128,138],"fluctuations.":[129],"Using":[130],"power":[131],"wasters":[132],"mean":[135],"inject":[137],"fluctuations":[139],"FPGA":[142],"system,":[143],"evaluate":[145],"abilities":[147],"degradation":[154],"early":[156],"stages":[157],"before":[158],"failure.":[160]},"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}