{"id":"https://openalex.org/W2978540635","doi":"https://doi.org/10.1109/iolts.2019.8854445","title":"A Controller Augmentation Method to Improve Transition Fault Coverage for RTL Data-Paths","display_name":"A Controller Augmentation Method to Improve Transition Fault Coverage for RTL Data-Paths","publication_year":2019,"publication_date":"2019-07-01","ids":{"openalex":"https://openalex.org/W2978540635","doi":"https://doi.org/10.1109/iolts.2019.8854445","mag":"2978540635"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2019.8854445","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2019.8854445","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085793321","display_name":"Yuki Takeuchi","orcid":"https://orcid.org/0000-0003-2428-7432"},"institutions":[{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]},{"id":"https://openalex.org/I52706244","display_name":"College of Industrial Technology","ror":"https://ror.org/054a9s036","country_code":"JP","type":"education","lineage":["https://openalex.org/I52706244"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yuki Takeuchi","raw_affiliation_strings":["Graduate School of Industrial Technology, Nihon University, Chiba, JAPAN"],"affiliations":[{"raw_affiliation_string":"Graduate School of Industrial Technology, Nihon University, Chiba, JAPAN","institution_ids":["https://openalex.org/I52706244","https://openalex.org/I104946051"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113865938","display_name":"Toshinori Hosokawa","orcid":null},"institutions":[{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]},{"id":"https://openalex.org/I52706244","display_name":"College of Industrial Technology","ror":"https://ror.org/054a9s036","country_code":"JP","type":"education","lineage":["https://openalex.org/I52706244"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshinori Hosokawa","raw_affiliation_strings":["College of Industrial Technology, Nihon University, Chiba, JAPAN"],"affiliations":[{"raw_affiliation_string":"College of Industrial Technology, Nihon University, Chiba, JAPAN","institution_ids":["https://openalex.org/I52706244","https://openalex.org/I104946051"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015411968","display_name":"Hiroshi Yamazaki","orcid":"https://orcid.org/0000-0001-9434-2957"},"institutions":[{"id":"https://openalex.org/I52706244","display_name":"College of Industrial Technology","ror":"https://ror.org/054a9s036","country_code":"JP","type":"education","lineage":["https://openalex.org/I52706244"]},{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Yamazaki","raw_affiliation_strings":["College of Industrial Technology, Nihon University, Chiba, JAPAN"],"affiliations":[{"raw_affiliation_string":"College of Industrial Technology, Nihon University, Chiba, JAPAN","institution_ids":["https://openalex.org/I52706244","https://openalex.org/I104946051"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101029241","display_name":"Masayoshi Yoshimura","orcid":null},"institutions":[{"id":"https://openalex.org/I168356945","display_name":"Kyoto Sangyo University","ror":"https://ror.org/05t70xh16","country_code":"JP","type":"education","lineage":["https://openalex.org/I168356945"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masayoshi Yoshimura","raw_affiliation_strings":["Faculty of Information Science and Engineering, Kyoto Sangyo University, Kyoto, JAPAN"],"affiliations":[{"raw_affiliation_string":"Faculty of Information Science and Engineering, Kyoto Sangyo University, Kyoto, JAPAN","institution_ids":["https://openalex.org/I168356945"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5085793321"],"corresponding_institution_ids":["https://openalex.org/I104946051","https://openalex.org/I52706244"],"apc_list":null,"apc_paid":null,"fwci":0.7223,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.68953822,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"17","issue":null,"first_page":"293","last_page":"298"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7044697403907776},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.4844062924385071},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.43541219830513},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4020770788192749},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.37359946966171265},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.32013222575187683},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.120319664478302},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.09246721863746643}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7044697403907776},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.4844062924385071},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.43541219830513},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4020770788192749},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.37359946966171265},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.32013222575187683},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.120319664478302},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.09246721863746643},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2019.8854445","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2019.8854445","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W204937362","https://openalex.org/W1483338234","https://openalex.org/W1503570386","https://openalex.org/W1583304273","https://openalex.org/W1963503916","https://openalex.org/W1980985044","https://openalex.org/W2108103162","https://openalex.org/W2112705672","https://openalex.org/W2130838564","https://openalex.org/W2138251715","https://openalex.org/W2154695555","https://openalex.org/W2294157076","https://openalex.org/W2760618420","https://openalex.org/W2896180301","https://openalex.org/W2945873616","https://openalex.org/W4302084786","https://openalex.org/W6676710984","https://openalex.org/W6679670324"],"related_works":["https://openalex.org/W2115140794","https://openalex.org/W2041120224","https://openalex.org/W1504320321","https://openalex.org/W2067902980","https://openalex.org/W4312275919","https://openalex.org/W2338293335","https://openalex.org/W2039378765","https://openalex.org/W2613115449","https://openalex.org/W2548529098","https://openalex.org/W2614685449"],"abstract_inverted_index":{"With":[0],"the":[1,15,33,41,91,105,114],"growing":[2],"clock":[3],"frequencies":[4],"and":[5,36,54,113],"complexity":[6],"for":[7],"VLSIs,":[8],"transition":[9,19,48,65,86,106],"fault":[10,49,66,87,107],"testing":[11],"is":[12,21,68],"required.":[13],"However,":[14],"number":[16,92,115],"of":[17,27,38,44,93,116],"untestable":[18,28,94,117],"faults":[20,30,118],"generally":[22],"much":[23],"more":[24],"than":[25],"that":[26,104],"stuck-at":[29],"due":[31],"to":[32,63,81,84],"circuit":[34],"structures":[35],"functions":[37],"VLSIs.":[39],"From":[40],"view":[42],"point":[43],"current":[45],"structural":[46],"testing,":[47],"coverage":[50,67,88,108],"might":[51,58],"be":[52,59],"insufficient":[53],"potential":[55],"timing":[56],"defects":[57],"escaped.":[60],"Therefore,":[61],"design-for-testability":[62],"improve":[64,85],"important.":[69],"In":[70],"this":[71],"paper,":[72],"we":[73],"propose":[74],"a":[75],"controller":[76],"augmentation":[77],"method":[78],"in":[79],"addition":[80],"scan":[82],"design,":[83],"with":[89],"reducing":[90],"faults.":[95],"Experimental":[96],"results":[97],"on":[98,123],"high-level":[99],"synthesis":[100],"benchmark":[101],"circuits":[102],"show":[103],"was":[109,119],"improved":[110],"by":[111,121],"4.75":[112],"reduced":[120],"76.93%":[122],"average.":[124]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}