{"id":"https://openalex.org/W4312198744","doi":"https://doi.org/10.1109/ieem55944.2022.9989630","title":"RF MEMS Resonance Sensor for Measuring Microplastics Concentration","display_name":"RF MEMS Resonance Sensor for Measuring Microplastics Concentration","publication_year":2022,"publication_date":"2022-12-07","ids":{"openalex":"https://openalex.org/W4312198744","doi":"https://doi.org/10.1109/ieem55944.2022.9989630"},"language":"en","primary_location":{"id":"doi:10.1109/ieem55944.2022.9989630","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem55944.2022.9989630","pdf_url":null,"source":{"id":"https://openalex.org/S4363607849","display_name":"2022 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058323295","display_name":"J. H. Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]},{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"J. H. Kim","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering,Seoul,Korea","Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering,Seoul,Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019883517","display_name":"K. H. Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"K. H. Lee","raw_affiliation_strings":["Korea Electronics Technology Institute,Department of Industrial Engineering,Seongnam,Korea","Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute,Department of Industrial Engineering,Seongnam,Korea","institution_ids":["https://openalex.org/I4210131650"]},{"raw_affiliation_string":"Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039970763","display_name":"C. U.","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"C. U. Cha","raw_affiliation_strings":["Korea Electronics Technology Institute,Department of Industrial Engineering,Seongnam,Korea","Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute,Department of Industrial Engineering,Seongnam,Korea","institution_ids":["https://openalex.org/I4210131650"]},{"raw_affiliation_string":"Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101623357","display_name":"Yoonki Hong","orcid":"https://orcid.org/0000-0002-4249-143X"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Y. T. Hong","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering,Seoul,Korea","Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering,Seoul,Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"0174","last_page":"0176"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10753","display_name":"Microplastics and Plastic Pollution","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2310","display_name":"Pollution"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10753","display_name":"Microplastics and Plastic Pollution","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2310","display_name":"Pollution"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12017","display_name":"Recycling and Waste Management Techniques","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14318","display_name":"Polydiacetylene-based materials and applications","score":0.9571999907493591,"subfield":{"id":"https://openalex.org/subfields/1605","display_name":"Organic Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microplastics","display_name":"Microplastics","score":0.9783424139022827},{"id":"https://openalex.org/keywords/microfluidics","display_name":"Microfluidics","score":0.5716526508331299},{"id":"https://openalex.org/keywords/microelectromechanical-systems","display_name":"Microelectromechanical systems","score":0.5139102935791016},{"id":"https://openalex.org/keywords/resonance","display_name":"Resonance (particle physics)","score":0.4455571174621582},{"id":"https://openalex.org/keywords/resonator","display_name":"Resonator","score":0.4455104470252991},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3910341262817383},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.36867380142211914},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.26014381647109985},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2561360001564026},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.15726295113563538},{"id":"https://openalex.org/keywords/environmental-chemistry","display_name":"Environmental chemistry","score":0.11918288469314575},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10046258568763733}],"concepts":[{"id":"https://openalex.org/C2780401329","wikidata":"https://www.wikidata.org/wiki/Q6839919","display_name":"Microplastics","level":2,"score":0.9783424139022827},{"id":"https://openalex.org/C8673954","wikidata":"https://www.wikidata.org/wiki/Q138845","display_name":"Microfluidics","level":2,"score":0.5716526508331299},{"id":"https://openalex.org/C37977207","wikidata":"https://www.wikidata.org/wiki/Q175561","display_name":"Microelectromechanical systems","level":2,"score":0.5139102935791016},{"id":"https://openalex.org/C139210041","wikidata":"https://www.wikidata.org/wiki/Q2145840","display_name":"Resonance (particle physics)","level":2,"score":0.4455571174621582},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.4455104470252991},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3910341262817383},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.36867380142211914},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.26014381647109985},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2561360001564026},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.15726295113563538},{"id":"https://openalex.org/C107872376","wikidata":"https://www.wikidata.org/wiki/Q321355","display_name":"Environmental chemistry","level":1,"score":0.11918288469314575},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10046258568763733},{"id":"https://openalex.org/C109214941","wikidata":"https://www.wikidata.org/wiki/Q18334","display_name":"Particle physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ieem55944.2022.9989630","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem55944.2022.9989630","pdf_url":null,"source":{"id":"https://openalex.org/S4363607849","display_name":"2022 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2608368045","https://openalex.org/W2975218902","https://openalex.org/W3027761339"],"related_works":["https://openalex.org/W4366956929","https://openalex.org/W4292702250","https://openalex.org/W4313424063","https://openalex.org/W3137432639","https://openalex.org/W3008604706","https://openalex.org/W4293363595","https://openalex.org/W2922519157","https://openalex.org/W3005399349","https://openalex.org/W2537716684","https://openalex.org/W2152087047"],"abstract_inverted_index":{"Recently,":[0],"microplastics":[1,14,61,71],"have":[2],"become":[3],"a":[4,16,32,47,57,63,93],"big":[5],"problem,":[6],"but":[7,102],"conventional":[8],"particle":[9],"analyzers":[10],"that":[11,83,95],"can":[12],"detect":[13,39],"require":[15],"lot":[17],"of":[18,46,59,70,86,106],"time":[19],"and":[20,50,66,92],"cost,":[21],"so":[22],"in":[23,26],"this":[24,30],"paper,":[25],"order":[27],"to":[28,38],"solve":[29],"issue,":[31],"low-cost":[33],"RF":[34],"sensor":[35,44],"was":[36,81,108],"designed":[37],"microplastics.":[40],"The":[41],"proposed":[42],"MEMS":[43],"consists":[45],"microfluidic":[48,64],"structure":[49,65],"an":[51,73],"LC":[52,74],"resonator.":[53],"First,":[54],"it":[55,80],"is":[56],"principle":[58],"collecting":[60],"through":[62],"measuring":[67],"the":[68,78,84,100,104],"concentration":[69,85,101],"using":[72],"resonance":[75],"structure.":[76],"Through":[77],"structure,":[79],"confirmed":[82],"0.001%":[87],"unit":[88],"could":[89,96],"be":[90],"detected,":[91],"circuit":[94],"identify":[97],"not":[98],"only":[99],"also":[103],"type":[105],"substance":[107],"proposed.":[109]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-17T09:13:05.818461","created_date":"2025-10-10T00:00:00"}
