{"id":"https://openalex.org/W4408281564","doi":"https://doi.org/10.1109/iecon55916.2024.10905801","title":"Electrical machines: Real-time Simulation for Intelligent Fault Diagnosis, Prognostics and Health Management","display_name":"Electrical machines: Real-time Simulation for Intelligent Fault Diagnosis, Prognostics and Health Management","publication_year":2024,"publication_date":"2024-11-03","ids":{"openalex":"https://openalex.org/W4408281564","doi":"https://doi.org/10.1109/iecon55916.2024.10905801"},"language":"en","primary_location":{"id":"doi:10.1109/iecon55916.2024.10905801","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon55916.2024.10905801","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066940636","display_name":"Shahin Hedayati Kia","orcid":"https://orcid.org/0000-0001-6710-8196"},"institutions":[{"id":"https://openalex.org/I4647051","display_name":"Universit\u00e9 de Picardie Jules Verne","ror":"https://ror.org/01gyxrk03","country_code":"FR","type":"education","lineage":["https://openalex.org/I4647051"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Shahin Hedayati Kia","raw_affiliation_strings":["University of Picardie \"Jules Verne\",MIS Lab. (EA4290),Amiens,France,80039"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Picardie \"Jules Verne\",MIS Lab. (EA4290),Amiens,France,80039","institution_ids":["https://openalex.org/I4647051"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111922939","display_name":"Hubert Razik","orcid":null},"institutions":[{"id":"https://openalex.org/I100532134","display_name":"Lyon 1 Universit\u00e9","ror":"https://ror.org/029brtt94","country_code":"FR","type":"education","lineage":["https://openalex.org/I100532134","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I4210145913","display_name":"Laboratoire Amp\u00e8re","ror":"https://ror.org/04xbczw40","country_code":"FR","type":"facility","lineage":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I4210145913","https://openalex.org/I48430043"]},{"id":"https://openalex.org/I96733725","display_name":"Shanghai Maritime University","ror":"https://ror.org/04z7qrj66","country_code":"CN","type":"education","lineage":["https://openalex.org/I96733725"]}],"countries":["CN","FR"],"is_corresponding":false,"raw_author_name":"Hubert Razik","raw_affiliation_strings":["Université Claude Bernard Lyon 1,AMPERE Lab. (UMR5005),France,69622","Shanghai Maritime University (1550 Haigang Ave, Pudong Xinqu, Shanghai Shi, - Chine)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Université Claude Bernard Lyon 1,AMPERE Lab. (UMR5005),France,69622","institution_ids":["https://openalex.org/I100532134","https://openalex.org/I4210145913"]},{"raw_affiliation_string":"Shanghai Maritime University (1550 Haigang Ave, Pudong Xinqu, Shanghai Shi, - Chine)","institution_ids":["https://openalex.org/I96733725"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007317275","display_name":"Larisa Dunai","orcid":"https://orcid.org/0000-0002-5076-0695"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Larisa Dunai","raw_affiliation_strings":["Universitat Politècnica de València,Departamento Ingeniería Gráfica,Valencia,Spain,46022"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universitat Politècnica de València,Departamento Ingeniería Gráfica,Valencia,Spain,46022","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8829,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.77719014,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.9387000203132629,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.9387000203132629,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9254999756813049,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.9822551012039185},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6500662565231323},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6048703789710999},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4932388663291931},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.4613286554813385},{"id":"https://openalex.org/keywords/fault-management","display_name":"Fault management","score":0.43126487731933594},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2805384397506714},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.17038610577583313},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1666286587715149}],"concepts":[{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.9822551012039185},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6500662565231323},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6048703789710999},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4932388663291931},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.4613286554813385},{"id":"https://openalex.org/C108074857","wikidata":"https://www.wikidata.org/wiki/Q3067360","display_name":"Fault management","level":3,"score":0.43126487731933594},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2805384397506714},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.17038610577583313},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1666286587715149},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2779119184","wikidata":"https://www.wikidata.org/wiki/Q294350","display_name":"ALARM","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iecon55916.2024.10905801","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon55916.2024.10905801","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-04993562v1","is_oa":false,"landing_page_url":"https://u-picardie.hal.science/hal-04993562","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society, Nov 2024, Chicago, United States. pp.1-6, ⟨10.1109/IECON55916.2024.10905801⟩","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322930","display_name":"Ministerio de Ciencia e Innovaci\u00f3n","ror":"https://ror.org/034900433"},{"id":"https://openalex.org/F4320335598","display_name":"Agencia Estatal de Investigaci\u00f3n","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W2020239725","https://openalex.org/W2094723240","https://openalex.org/W2099236707","https://openalex.org/W2101162879","https://openalex.org/W2147725743","https://openalex.org/W2154085245","https://openalex.org/W2158985775","https://openalex.org/W2168295423","https://openalex.org/W2169665559","https://openalex.org/W2345236397","https://openalex.org/W2582262468","https://openalex.org/W2592087115","https://openalex.org/W2600040096","https://openalex.org/W2782894320","https://openalex.org/W2789764336","https://openalex.org/W2804780212","https://openalex.org/W2899134774","https://openalex.org/W2936849665","https://openalex.org/W2982936646","https://openalex.org/W2999256904","https://openalex.org/W3003667836","https://openalex.org/W3086895414","https://openalex.org/W3129836339","https://openalex.org/W3137941580","https://openalex.org/W3185041717","https://openalex.org/W3194895745","https://openalex.org/W3206240344","https://openalex.org/W4206825357","https://openalex.org/W4214478937","https://openalex.org/W4252269865","https://openalex.org/W4286847151","https://openalex.org/W4290703456","https://openalex.org/W4295854421","https://openalex.org/W4296991965","https://openalex.org/W4312095837","https://openalex.org/W4312629386","https://openalex.org/W4387789796","https://openalex.org/W4399832505"],"related_works":["https://openalex.org/W2557573737","https://openalex.org/W2143585755","https://openalex.org/W2383842997","https://openalex.org/W2908973203","https://openalex.org/W2801712269","https://openalex.org/W1872896676","https://openalex.org/W2156691445","https://openalex.org/W2045186954","https://openalex.org/W3000986292","https://openalex.org/W1502469213"],"abstract_inverted_index":{"This":[0,94],"article":[1],"reviews":[2],"selected":[3],"research":[4,121],"focused":[5],"on":[6,55,129],"digital":[7,20],"real-time":[8,86,131],"simulation":[9],"for":[10],"the":[11,67,73,82,113,119,130],"intelligent":[12,76],"condition":[13],"monitoring":[14],"of":[15,69,75,85,112,134],"electrical":[16,135],"machines.":[17],"Traditional":[18],"multi-physical":[19,132],"simulations":[21],"have":[22],"been":[23],"broadly":[24,139],"used":[25],"in":[26,33,48,118,141],"industrial":[27,142],"product":[28],"manufacturing":[29],"and":[30,38,43,51,66,78,105,116],"processing,":[31,61],"particularly":[32],"virtual":[34,56],"testing":[35],"under":[36],"regular":[37],"harsh":[39],"working":[40],"conditions,":[41],"aging,":[42],"life-cycle":[44,106],"analysis.":[45],"Recent":[46],"progress":[47,115],"data":[49,88],"communication":[50],"information":[52],"technologies":[53],"based":[54],"reality,":[57],"cloud":[58],"computing,":[59],"parallel":[60],"machine":[62],"learning,":[63],"large-scale/big":[64],"data,":[65],"Internet":[68],"Things":[70],"has":[71],"allowed":[72],"development":[74],"physical":[77,92],"mathematical":[79],"models":[80],"with":[81,90],"primary":[83,126],"capability":[84],"bilateral":[87],"transfer":[89],"a":[91],"unit.":[93],"new":[95],"trend":[96],"leads":[97],"to":[98],"perform":[99],"condition-based":[100],"monitoring,":[101],"fault":[102],"diagnosis,":[103],"prognostics":[104],"analysis":[107],"more":[108],"efficiently.":[109],"An":[110],"overview":[111],"recent":[114],"challenges":[117],"above":[120],"topic":[122],"is":[123,128],"presented.":[124],"The":[125],"emphasis":[127],"modeling":[133],"machines,":[136],"which":[137],"are":[138],"utilized":[140],"plants.":[143]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-08-05T07:39:15.569665","created_date":"2025-10-10T00:00:00"}