{"id":"https://openalex.org/W4377968459","doi":"https://doi.org/10.1109/icps58381.2023.10128105","title":"A Survey of Few-shot Learning-based Compound Fault Diagnosis Methods for Industrial Processes","display_name":"A Survey of Few-shot Learning-based Compound Fault Diagnosis Methods for Industrial Processes","publication_year":2023,"publication_date":"2023-05-08","ids":{"openalex":"https://openalex.org/W4377968459","doi":"https://doi.org/10.1109/icps58381.2023.10128105"},"language":"en","primary_location":{"id":"doi:10.1109/icps58381.2023.10128105","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icps58381.2023.10128105","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 6th International Conference on Industrial Cyber-Physical Systems (ICPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004905542","display_name":"Liang Ma","orcid":"https://orcid.org/0000-0002-0513-6770"},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Liang Ma","raw_affiliation_strings":["School of Automation and Electrical Engineering, University of Science and Technology Beijing,Key Laboratory of Knowledge Automation for Industrial Processes of Ministry of Education,Beijing,China,100083"],"affiliations":[{"raw_affiliation_string":"School of Automation and Electrical Engineering, University of Science and Technology Beijing,Key Laboratory of Knowledge Automation for Industrial Processes of Ministry of Education,Beijing,China,100083","institution_ids":["https://openalex.org/I92403157"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114052172","display_name":"Fuzhong Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fuzhong Shi","raw_affiliation_strings":["School of Automation and Electrical Engineering, University of Science and Technology Beijing,Key Laboratory of Knowledge Automation for Industrial Processes of Ministry of Education,Beijing,China,100083"],"affiliations":[{"raw_affiliation_string":"School of Automation and Electrical Engineering, University of Science and Technology Beijing,Key Laboratory of Knowledge Automation for Industrial Processes of Ministry of Education,Beijing,China,100083","institution_ids":["https://openalex.org/I92403157"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081448725","display_name":"Zijing Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zijing Wu","raw_affiliation_strings":["School of Automation and Electrical Engineering, University of Science and Technology Beijing,Key Laboratory of Knowledge Automation for Industrial Processes of Ministry of Education,Beijing,China,100083"],"affiliations":[{"raw_affiliation_string":"School of Automation and Electrical Engineering, University of Science and Technology Beijing,Key Laboratory of Knowledge Automation for Industrial Processes of Ministry of Education,Beijing,China,100083","institution_ids":["https://openalex.org/I92403157"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016153320","display_name":"Kaixiang Peng","orcid":"https://orcid.org/0000-0001-8314-3047"},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kaixiang Peng","raw_affiliation_strings":["School of Automation and Electrical Engineering, University of Science and Technology Beijing,Key Laboratory of Knowledge Automation for Industrial Processes of Ministry of Education,Beijing,China,100083"],"affiliations":[{"raw_affiliation_string":"School of Automation and Electrical Engineering, University of Science and Technology Beijing,Key Laboratory of Knowledge Automation for Industrial Processes of Ministry of Education,Beijing,China,100083","institution_ids":["https://openalex.org/I92403157"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5004905542"],"corresponding_institution_ids":["https://openalex.org/I92403157"],"apc_list":null,"apc_paid":null,"fwci":0.938,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.74015287,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.96670001745224,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14392","display_name":"Geoscience and Mining Technology","score":0.96670001745224,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7422810792922974},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6767663359642029},{"id":"https://openalex.org/keywords/one-shot","display_name":"One shot","score":0.6536983847618103},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.584514856338501},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5790059566497803},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.472040057182312},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.35879260301589966},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2751421332359314},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.06710740923881531},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.06419059634208679}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7422810792922974},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6767663359642029},{"id":"https://openalex.org/C2992734406","wikidata":"https://www.wikidata.org/wiki/Q413267","display_name":"One shot","level":2,"score":0.6536983847618103},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.584514856338501},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5790059566497803},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.472040057182312},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35879260301589966},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2751421332359314},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.06710740923881531},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.06419059634208679},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icps58381.2023.10128105","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icps58381.2023.10128105","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 6th International Conference on Industrial Cyber-Physical Systems (ICPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5400000214576721}],"awards":[{"id":"https://openalex.org/G1309237840","display_name":null,"funder_award_id":"62003030,U21A20483,72171171","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3176671857","display_name":null,"funder_award_id":"2021YFB3301200","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W2115733720","https://openalex.org/W2165698076","https://openalex.org/W2504252959","https://openalex.org/W2738091946","https://openalex.org/W2898375427","https://openalex.org/W2919955455","https://openalex.org/W2939535241","https://openalex.org/W2939702904","https://openalex.org/W2944544772","https://openalex.org/W2954460690","https://openalex.org/W2966685465","https://openalex.org/W2998506103","https://openalex.org/W3007050866","https://openalex.org/W3019898994","https://openalex.org/W3034654297","https://openalex.org/W3044309180","https://openalex.org/W3150282857","https://openalex.org/W3158162893","https://openalex.org/W3174513158","https://openalex.org/W3174527500","https://openalex.org/W3213088652","https://openalex.org/W3215783632","https://openalex.org/W3216713827","https://openalex.org/W4249625715","https://openalex.org/W4287671529","https://openalex.org/W4293407356","https://openalex.org/W6712906272","https://openalex.org/W6840720034"],"related_works":["https://openalex.org/W2483566286","https://openalex.org/W2347304869","https://openalex.org/W3085605289","https://openalex.org/W1972540149","https://openalex.org/W2600228920","https://openalex.org/W2348003843","https://openalex.org/W1597645244","https://openalex.org/W1996952451","https://openalex.org/W2778466204","https://openalex.org/W3125782123"],"abstract_inverted_index":{"Once":[0],"the":[1,5,8,26,35,38,42,78,87],"fault":[2,9,74],"occurs":[3],"in":[4,17],"industrial":[6,46],"processes,":[7],"maybe":[10],"always":[11],"compound":[12,63,73],"faults":[13,28,64],"which":[14],"take":[15],"place":[16],"different":[18],"locations,":[19],"forms,":[20],"and":[21,31,40,58,69,84,90],"degrees.":[22],"How":[23],"to":[24],"diagnose":[25],"multiple":[27],"with":[29],"coupling":[30],"propagation":[32],"characteristics,":[33],"enhance":[34],"reliability":[36],"of":[37,45,60,72],"system,":[39],"ensure":[41],"reliable":[43],"operation":[44],"processes":[47],"is":[48,65],"very":[49],"important.":[50],"In":[51],"this":[52],"paper,":[53],"a":[54],"survey":[55],"on":[56],"mechanism":[57],"manifestation":[59],"symptoms":[61],"for":[62],"given.":[66],"Meanwhile,":[67],"difficulties":[68],"research":[70,91],"status":[71],"diagnosis":[75],"methods,":[76],"especially":[77],"few-shot":[79],"learning-based":[80],"methods":[81],"are":[82,93],"analyzed":[83],"discussed.":[85],"Moreover,":[86],"advantages,":[88],"disadvantages,":[89],"directions":[92],"mentioned.":[94]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}