{"id":"https://openalex.org/W4412030826","doi":"https://doi.org/10.1109/icphm65385.2025.11062062","title":"Using Monte Carlo Simulation with BAT and OCBA for the Binary-state Network Reliability Problem","display_name":"Using Monte Carlo Simulation with BAT and OCBA for the Binary-state Network Reliability Problem","publication_year":2025,"publication_date":"2025-06-09","ids":{"openalex":"https://openalex.org/W4412030826","doi":"https://doi.org/10.1109/icphm65385.2025.11062062"},"language":"en","primary_location":{"id":"doi:10.1109/icphm65385.2025.11062062","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icphm65385.2025.11062062","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Prognostics and Health Management (ICPHM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012456515","display_name":"Wei\u2010Chang Yeh","orcid":"https://orcid.org/0000-0001-7393-0768"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Wei-Chang Yeh","raw_affiliation_strings":["National Tsing Hua University,Department of Industrial Engineering and Engineering Management,Hsinchu City,Taiwan"],"affiliations":[{"raw_affiliation_string":"National Tsing Hua University,Department of Industrial Engineering and Engineering Management,Hsinchu City,Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Fu-Cheng Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Fu-Cheng Luo","raw_affiliation_strings":["National Tsing Hua University,Department of Industrial Engineering and Engineering Management,Hsinchu City,Taiwan"],"affiliations":[{"raw_affiliation_string":"National Tsing Hua University,Department of Industrial Engineering and Engineering Management,Hsinchu City,Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"last","author":{"id":null,"display_name":"Chi-Shiuan Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chi-Shiuan Lin","raw_affiliation_strings":["National Tsing Hua University,Department of Industrial Engineering and Engineering Management,Hsinchu City,Taiwan"],"affiliations":[{"raw_affiliation_string":"National Tsing Hua University,Department of Industrial Engineering and Engineering Management,Hsinchu City,Taiwan","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5012456515"],"corresponding_institution_ids":["https://openalex.org/I25846049"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18362689,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.8460999727249146,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.8460999727249146,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.7461107969284058},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6624031066894531},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.590877890586853},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.5143593549728394},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.39400625228881836},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13980001211166382},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1292005181312561},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08755254745483398},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.07281091809272766}],"concepts":[{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.7461107969284058},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6624031066894531},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.590877890586853},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.5143593549728394},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.39400625228881836},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13980001211166382},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1292005181312561},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08755254745483398},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.07281091809272766},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icphm65385.2025.11062062","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icphm65385.2025.11062062","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Prognostics and Health Management (ICPHM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2074339441","https://openalex.org/W2112680405","https://openalex.org/W2133062475","https://openalex.org/W2792309650","https://openalex.org/W3119687213","https://openalex.org/W3173373217","https://openalex.org/W3194936869","https://openalex.org/W4365520216"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2005266888"],"abstract_inverted_index":{"The":[0],"probe":[1,24,44,62,83,86],"card":[2,25],"is":[3,15,32,119,200],"an":[4,120,127],"essential":[5],"tool":[6],"for":[7,70,77],"measuring":[8],"the":[9,23,38,61,74,78,85,90,97,100,104,138,150,153,158,165,189,209],"yield":[10],"of":[11,42,81,92,99,106,152,160],"semiconductor":[12,18],"wafers":[13],"and":[14,36,40,50,132],"indispensable":[16],"in":[17,73,173],"testing.":[19],"To":[20],"ensure":[21],"that":[22],"functions":[26],"properly":[27],"after":[28],"multiple":[29],"uses,":[30],"it":[31,108],"crucial":[33],"to":[34,45,59,142,182,202,211],"maintain":[35],"verify":[37],"performance":[39],"accuracy":[41,151],"each":[43,82],"avoid":[46],"impacting":[47],"product":[48],"quality":[49],"delivery":[51],"time.":[52],"This":[53],"study":[54,125],"employs":[55],"network":[56,69,101],"reliability":[57,75,113,146,215],"characteristics":[58],"convert":[60],"card's":[63],"circuit":[64],"diagram":[65,102],"into":[66],"a":[67],"general":[68],"analysis,":[71],"resulting":[72],"values":[76,114,216],"normal":[79],"operation":[80],"within":[84],"card,":[87],"thus":[88],"facilitating":[89],"monitoring":[91],"its":[93],"operational":[94],"reliability.":[95],"As":[96],"scale":[98],"increases,":[103],"complexity":[105],"solving":[107],"also":[109,176],"grows.":[110],"Determining":[111],"precise":[112],"using":[115],"traditional":[116],"mathematical":[117],"methods":[118],"NP-hard":[121],"problem.":[122],"Therefore,":[123],"this":[124],"proposes":[126],"Optimal":[128,195],"Computing":[129,196],"Budget":[130,197],"Allocation":[131,198],"Monte":[133,178],"Carlo":[134,179],"Simulation":[135,180],"based":[136],"on":[137,169],"Binary-Addition-Tree":[139,154],"algorithm":[140,155,210],"(BAT-MCS-OCBA)":[141],"quickly":[143],"obtain":[144],"approximate":[145,214],"values.":[147],"BAT-MCS-OCBA":[148],"combines":[149],"(BAT)":[156],"with":[157,217],"concept":[159],"super":[161,190],"vectors,":[162],"which":[163],"simplifies":[164],"extensive":[166],"time":[167],"spent":[168],"enumerating":[170],"variable":[171],"combinations":[172],"BAT.":[174],"It":[175],"utilizes":[177],"(MCS)":[181],"simulate":[183],"subsequent":[184],"scenarios":[185],"not":[186],"considered":[187],"by":[188],"vector,":[191],"enhancing":[192],"accuracy.":[193],"Finally,":[194],"(OCBA)":[199],"applied":[201],"allocate":[203],"resources":[204],"effectively":[205],"during":[206],"simulations,":[207],"enabling":[208],"achieve":[212],"faster":[213],"improved":[218],"solution":[219],"quality.":[220]},"counts_by_year":[],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}