{"id":"https://openalex.org/W4385478116","doi":"https://doi.org/10.1109/icphm57936.2023.10193957","title":"Application of Machine Learning for Anomaly Detection in Printed Circuit Boards Imbalance Date Set","display_name":"Application of Machine Learning for Anomaly Detection in Printed Circuit Boards Imbalance Date Set","publication_year":2023,"publication_date":"2023-06-05","ids":{"openalex":"https://openalex.org/W4385478116","doi":"https://doi.org/10.1109/icphm57936.2023.10193957"},"language":"en","primary_location":{"id":"doi:10.1109/icphm57936.2023.10193957","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icphm57936.2023.10193957","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Prognostics and Health Management (ICPHM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112635226","display_name":"Mehrnaz Mirzaei","orcid":null},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Mehrnaz Mirzaei","raw_affiliation_strings":["Concordia Institute for Information, Systems Engineering,Montreal,Canada","Concordia Institute for Information, Systems Engineering, Montreal, Canada"],"affiliations":[{"raw_affiliation_string":"Concordia Institute for Information, Systems Engineering,Montreal,Canada","institution_ids":["https://openalex.org/I60158472"]},{"raw_affiliation_string":"Concordia Institute for Information, Systems Engineering, Montreal, Canada","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5092580454","display_name":"Marzieh Hashemzadeh Sadat","orcid":null},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Marzieh Hashemzadeh Sadat","raw_affiliation_strings":["Concordia Institute for Information, Systems Engineering,Montreal,Canada","Concordia Institute for Information, Systems Engineering, Montreal, Canada"],"affiliations":[{"raw_affiliation_string":"Concordia Institute for Information, Systems Engineering,Montreal,Canada","institution_ids":["https://openalex.org/I60158472"]},{"raw_affiliation_string":"Concordia Institute for Information, Systems Engineering, Montreal, Canada","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089551127","display_name":"Farnoosh Naderkhani","orcid":"https://orcid.org/0000-0003-1808-4073"},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Farnoosh Naderkhani","raw_affiliation_strings":["Concordia Institute for Information, Systems Engineering,Montreal,Canada","Concordia Institute for Information, Systems Engineering, Montreal, Canada"],"affiliations":[{"raw_affiliation_string":"Concordia Institute for Information, Systems Engineering,Montreal,Canada","institution_ids":["https://openalex.org/I60158472"]},{"raw_affiliation_string":"Concordia Institute for Information, Systems Engineering, Montreal, Canada","institution_ids":["https://openalex.org/I60158472"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5112635226"],"corresponding_institution_ids":["https://openalex.org/I60158472"],"apc_list":null,"apc_paid":null,"fwci":0.5254,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.70810164,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"30","issue":null,"first_page":"128","last_page":"133"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13429","display_name":"Electricity Theft Detection Techniques","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.8073865175247192},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.655205249786377},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.5435523986816406},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5295162200927734},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.5217129588127136},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.5152376294136047},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.47631892561912537},{"id":"https://openalex.org/keywords/training-set","display_name":"Training set","score":0.4715706706047058},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4680606722831726},{"id":"https://openalex.org/keywords/precision-and-recall","display_name":"Precision and recall","score":0.46324315667152405},{"id":"https://openalex.org/keywords/anomaly","display_name":"Anomaly (physics)","score":0.4587235152721405},{"id":"https://openalex.org/keywords/data-set","display_name":"Data set","score":0.44485750794410706},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4234654903411865},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4099535048007965},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21000489592552185}],"concepts":[{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.8073865175247192},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.655205249786377},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.5435523986816406},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5295162200927734},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5217129588127136},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.5152376294136047},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.47631892561912537},{"id":"https://openalex.org/C51632099","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Training set","level":2,"score":0.4715706706047058},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4680606722831726},{"id":"https://openalex.org/C81669768","wikidata":"https://www.wikidata.org/wiki/Q2359161","display_name":"Precision and recall","level":2,"score":0.46324315667152405},{"id":"https://openalex.org/C12997251","wikidata":"https://www.wikidata.org/wiki/Q567560","display_name":"Anomaly (physics)","level":2,"score":0.4587235152721405},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.44485750794410706},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4234654903411865},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4099535048007965},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21000489592552185},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icphm57936.2023.10193957","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icphm57936.2023.10193957","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Prognostics and Health Management (ICPHM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6399999856948853}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1993864160","https://openalex.org/W2008056655","https://openalex.org/W2056132907","https://openalex.org/W2128420091","https://openalex.org/W2400895677","https://openalex.org/W2768348081","https://openalex.org/W2789841922","https://openalex.org/W2792444291","https://openalex.org/W2806416578","https://openalex.org/W2806646158","https://openalex.org/W2911964244","https://openalex.org/W2944943292","https://openalex.org/W2963253967","https://openalex.org/W2984761674","https://openalex.org/W3037877747","https://openalex.org/W3084325977","https://openalex.org/W3085018267","https://openalex.org/W3089801272","https://openalex.org/W3111404230","https://openalex.org/W3169384804","https://openalex.org/W3186516637","https://openalex.org/W3202252155","https://openalex.org/W3216660278","https://openalex.org/W4205140486","https://openalex.org/W4210579633","https://openalex.org/W4220793365","https://openalex.org/W4221120298","https://openalex.org/W4281699975","https://openalex.org/W4283789468","https://openalex.org/W4283789628","https://openalex.org/W4283790272","https://openalex.org/W4286582003","https://openalex.org/W4293410868","https://openalex.org/W4294051863","https://openalex.org/W4310150460","https://openalex.org/W6713226382","https://openalex.org/W6745609711","https://openalex.org/W6838232560"],"related_works":["https://openalex.org/W2806741695","https://openalex.org/W4290647774","https://openalex.org/W3189286258","https://openalex.org/W3207797160","https://openalex.org/W3210364259","https://openalex.org/W4300558037","https://openalex.org/W2912112202","https://openalex.org/W2667207928","https://openalex.org/W4377864969","https://openalex.org/W2972971679"],"abstract_inverted_index":{"The":[0],"detection":[1,20,61,123],"of":[2,56,72,88,103,115,121,130],"anomalies":[3],"in":[4,13,31,62,101,117,124,134],"printed":[5],"circuit":[6],"boards":[7],"(PCBs)":[8],"is":[9],"an":[10],"important":[11],"challenge":[12,120],"the":[14,54,70,82,86,89,113,119,128],"electronics":[15],"manufacturing":[16],"industry.":[17],"Traditional":[18],"anomaly":[19,60,122],"methods":[21,100],"often":[22],"struggle":[23],"to":[24,48,80],"handle":[25],"imbalanced":[26,73,132],"datasets,":[27],"which":[28],"are":[29],"common":[30],"real-world":[32],"PCB":[33],"production.":[34],"In":[35],"recent":[36],"years,":[37],"machine":[38],"learning":[39],"(ML)":[40],"algorithms":[41,58],"have":[42],"emerged":[43],"as":[44],"a":[45,65,77],"promising":[46],"solution":[47],"this":[49,110],"problem.":[50],"This":[51],"study":[52,111],"investigates":[53],"use":[55],"ML":[57,90,116],"for":[59],"PCBs,":[63],"with":[64],"particular":[66],"focus":[67],"on":[68],"addressing":[69,118],"issue":[71],"data.":[74],"We":[75],"propose":[76],"data-level":[78],"technique":[79],"balance":[81],"dataset":[83],"and":[84,106,126],"improve":[85],"performance":[87],"algorithm.":[91],"Our":[92],"results":[93],"show":[94],"that":[95],"our":[96],"approach":[97],"outperforms":[98],"traditional":[99],"terms":[102],"precision,":[104],"recall,":[105],"F1":[107],"score.":[108],"Overall,":[109],"demonstrates":[112],"potential":[114],"PCBs":[125],"highlights":[127],"importance":[129],"considering":[131],"data":[133],"such":[135],"applications.":[136]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}