{"id":"https://openalex.org/W2130373684","doi":"https://doi.org/10.1109/icmlc.2011.6017015","title":"Application of an image processing software tool to crack inspection of crystalline silicon solar cells","display_name":"Application of an image processing software tool to crack inspection of crystalline silicon solar cells","publication_year":2011,"publication_date":"2011-07-01","ids":{"openalex":"https://openalex.org/W2130373684","doi":"https://doi.org/10.1109/icmlc.2011.6017015","mag":"2130373684"},"language":"en","primary_location":{"id":"doi:10.1109/icmlc.2011.6017015","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmlc.2011.6017015","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 International Conference on Machine Learning and Cybernetics","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108479823","display_name":"Jong-Hann Jean","orcid":null},"institutions":[{"id":"https://openalex.org/I142823887","display_name":"St. John's University","ror":"https://ror.org/00bgtad15","country_code":"US","type":"education","lineage":["https://openalex.org/I142823887"]},{"id":"https://openalex.org/I4210097625","display_name":"St. John's University","ror":"https://ror.org/00wyq5s37","country_code":"TW","type":"education","lineage":["https://openalex.org/I4210097625"]}],"countries":["TW","US"],"is_corresponding":true,"raw_author_name":"Jong-Hann Jean","raw_affiliation_strings":["Department of Electrical Engineering, Saint John's University, Taipei, Taiwan","[Department of Electrical Engineering, St. John's University, Taipei, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Saint John's University, Taipei, Taiwan","institution_ids":["https://openalex.org/I4210097625"]},{"raw_affiliation_string":"[Department of Electrical Engineering, St. John's University, Taipei, Taiwan]","institution_ids":["https://openalex.org/I142823887"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059701804","display_name":"Chia-Hong Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I142823887","display_name":"St. John's University","ror":"https://ror.org/00bgtad15","country_code":"US","type":"education","lineage":["https://openalex.org/I142823887"]},{"id":"https://openalex.org/I4210097625","display_name":"St. John's University","ror":"https://ror.org/00wyq5s37","country_code":"TW","type":"education","lineage":["https://openalex.org/I4210097625"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Chia-Hong Chen","raw_affiliation_strings":["Department of Electrical Engineering, Saint John's University, Taipei, Taiwan","[Department of Electrical Engineering, St. John's University, Taipei, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Saint John's University, Taipei, Taiwan","institution_ids":["https://openalex.org/I4210097625"]},{"raw_affiliation_string":"[Department of Electrical Engineering, St. John's University, Taipei, Taiwan]","institution_ids":["https://openalex.org/I142823887"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066919304","display_name":"Hsiu-Li Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210097625","display_name":"St. John's University","ror":"https://ror.org/00wyq5s37","country_code":"TW","type":"education","lineage":["https://openalex.org/I4210097625"]},{"id":"https://openalex.org/I142823887","display_name":"St. John's University","ror":"https://ror.org/00bgtad15","country_code":"US","type":"education","lineage":["https://openalex.org/I142823887"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Hsiu-Li Lin","raw_affiliation_strings":["Department of Electrical Engineering, Saint John's University, Taipei, Taiwan","[Department of Electrical Engineering, St. John's University, Taipei, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Saint John's University, Taipei, Taiwan","institution_ids":["https://openalex.org/I4210097625"]},{"raw_affiliation_string":"[Department of Electrical Engineering, St. John's University, Taipei, Taiwan]","institution_ids":["https://openalex.org/I142823887"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5108479823"],"corresponding_institution_ids":["https://openalex.org/I142823887","https://openalex.org/I4210097625"],"apc_list":null,"apc_paid":null,"fwci":3.0223,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.91482427,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1666","last_page":"1671"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9879999756813049,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.74323970079422},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.6813011765480042},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6325497627258301},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.598931074142456},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.5725678205490112},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5251338481903076},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5110198259353638},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4901324212551117},{"id":"https://openalex.org/keywords/template-matching","display_name":"Template matching","score":0.46763303875923157},{"id":"https://openalex.org/keywords/edge-detection","display_name":"Edge detection","score":0.45521870255470276},{"id":"https://openalex.org/keywords/graphical-user-interface","display_name":"Graphical user interface","score":0.4111582040786743},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.22455275058746338}],"concepts":[{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.74323970079422},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.6813011765480042},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6325497627258301},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.598931074142456},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.5725678205490112},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5251338481903076},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5110198259353638},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4901324212551117},{"id":"https://openalex.org/C158096908","wikidata":"https://www.wikidata.org/wiki/Q3983303","display_name":"Template matching","level":3,"score":0.46763303875923157},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.45521870255470276},{"id":"https://openalex.org/C37789001","wikidata":"https://www.wikidata.org/wiki/Q782543","display_name":"Graphical user interface","level":2,"score":0.4111582040786743},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.22455275058746338},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icmlc.2011.6017015","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmlc.2011.6017015","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 International Conference on Machine Learning and Cybernetics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.44999998807907104}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2030341774","https://openalex.org/W2035742536","https://openalex.org/W2078110295","https://openalex.org/W2114867528","https://openalex.org/W2116044718","https://openalex.org/W2129978592"],"related_works":["https://openalex.org/W1542224353","https://openalex.org/W2050699221","https://openalex.org/W2155191322","https://openalex.org/W2148060698","https://openalex.org/W4368227384","https://openalex.org/W1821254955","https://openalex.org/W2094999696","https://openalex.org/W2381104868","https://openalex.org/W2532465250","https://openalex.org/W2375715588"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3,45],"try":[4],"to":[5,56,93],"design":[6],"and":[7,29,79,98],"integrate":[8],"an":[9,47],"Automatic":[10],"Optical":[11],"Inspection":[12],"System":[13],"for":[14],"inspection":[15],"of":[16],"polycrystalline":[17],"silicon":[18],"solar":[19],"cells":[20],"or":[21],"modules,":[22],"emphasizing":[23],"on":[24,34],"its":[25],"image":[26],"processing,":[27],"measurement":[28],"analysis":[30],"software":[31,96],"utilities.":[32],"Based":[33],"the":[35,41,52,58,63,66,69,73,80,91,95],"cell":[36],"intensity":[37],"images":[38,88],"captured":[39],"by":[40,50,90],"electroluminescence":[42],"imaging":[43],"technique,":[44],"propose":[46],"inspecting":[48],"procedure":[49],"using":[51],"Windows-based":[53],"user":[54],"interface":[55],"implement":[57],"average":[59],"gray":[60],"level":[61],"tool,":[62,65,68,72],"thresholding":[64],"positioning":[67],"edge":[70],"detection":[71],"binary":[74],"large":[75],"object":[76],"(BLOB)":[77],"tool":[78,97],"template":[81],"matching":[82],"tool.":[83],"We":[84],"use":[85],"several":[86],"sample":[87],"provided":[89],"supplier":[92],"verify":[94],"receive":[99],"accurate":[100],"results.":[101]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}