{"id":"https://openalex.org/W2786778640","doi":"https://doi.org/10.1109/icm.2017.8268835","title":"Effect of oxygen pressure on the semiconductor properties of FTO thin films","display_name":"Effect of oxygen pressure on the semiconductor properties of FTO thin films","publication_year":2017,"publication_date":"2017-12-01","ids":{"openalex":"https://openalex.org/W2786778640","doi":"https://doi.org/10.1109/icm.2017.8268835","mag":"2786778640"},"language":"en","primary_location":{"id":"doi:10.1109/icm.2017.8268835","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm.2017.8268835","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 29th International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069874671","display_name":"Ali Hamieh","orcid":"https://orcid.org/0000-0002-5218-3617"},"institutions":[{"id":"https://openalex.org/I160368002","display_name":"Lebanese University","ror":"https://ror.org/05x6qnc69","country_code":"LB","type":"education","lineage":["https://openalex.org/I160368002"]}],"countries":["LB"],"is_corresponding":true,"raw_author_name":"Ali Hamieh","raw_affiliation_strings":["Faculty of Agriculture, Lebanese University, Beirut"],"affiliations":[{"raw_affiliation_string":"Faculty of Agriculture, Lebanese University, Beirut","institution_ids":["https://openalex.org/I160368002"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066007325","display_name":"Jihad Hamieh","orcid":null},"institutions":[{"id":"https://openalex.org/I2802578854","display_name":"Arts, Sciences and Technology University in Lebanon","ror":"https://ror.org/00bzckd95","country_code":"LB","type":"education","lineage":["https://openalex.org/I2802578854"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Jihad Hamieh","raw_affiliation_strings":["Arts, Sciences & Technology University in Lebanon, Beirut, Lebanon"],"affiliations":[{"raw_affiliation_string":"Arts, Sciences & Technology University in Lebanon, Beirut, Lebanon","institution_ids":["https://openalex.org/I2802578854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102785430","display_name":"Ali Hami\u00e9","orcid":"https://orcid.org/0000-0002-8121-1429"},"institutions":[{"id":"https://openalex.org/I2802578854","display_name":"Arts, Sciences and Technology University in Lebanon","ror":"https://ror.org/00bzckd95","country_code":"LB","type":"education","lineage":["https://openalex.org/I2802578854"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Ali Hamie","raw_affiliation_strings":["Arts, Sciences & Technology University in Lebanon, Beirut, Lebanon"],"affiliations":[{"raw_affiliation_string":"Arts, Sciences & Technology University in Lebanon, Beirut, Lebanon","institution_ids":["https://openalex.org/I2802578854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067758833","display_name":"Ali Ghorayeb","orcid":null},"institutions":[{"id":"https://openalex.org/I160368002","display_name":"Lebanese University","ror":"https://ror.org/05x6qnc69","country_code":"LB","type":"education","lineage":["https://openalex.org/I160368002"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Ali Ghorayeb","raw_affiliation_strings":["Faculty of Sciences, Lebanese University, Beirut"],"affiliations":[{"raw_affiliation_string":"Faculty of Sciences, Lebanese University, Beirut","institution_ids":["https://openalex.org/I160368002"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001927596","display_name":"A. Zaiour","orcid":null},"institutions":[{"id":"https://openalex.org/I160368002","display_name":"Lebanese University","ror":"https://ror.org/05x6qnc69","country_code":"LB","type":"education","lineage":["https://openalex.org/I160368002"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Abdallah Zaiour","raw_affiliation_strings":["Faculty of Sciences, Lebanese University, Beirut"],"affiliations":[{"raw_affiliation_string":"Faculty of Sciences, Lebanese University, Beirut","institution_ids":["https://openalex.org/I160368002"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042416902","display_name":"Bassam Assaf","orcid":null},"institutions":[{"id":"https://openalex.org/I160368002","display_name":"Lebanese University","ror":"https://ror.org/05x6qnc69","country_code":"LB","type":"education","lineage":["https://openalex.org/I160368002"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Bassam Assaf","raw_affiliation_strings":["Faculty of Agriculture, Lebanese University, Beirut"],"affiliations":[{"raw_affiliation_string":"Faculty of Agriculture, Lebanese University, Beirut","institution_ids":["https://openalex.org/I160368002"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5069874671"],"corresponding_institution_ids":["https://openalex.org/I160368002"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15465731,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"79","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10607","display_name":"Magnetic and transport properties of perovskites and related materials","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9825000166893005,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oxygen","display_name":"Oxygen","score":0.5785679221153259},{"id":"https://openalex.org/keywords/thin-film","display_name":"Thin film","score":0.5464622974395752},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4652901887893677},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.43747496604919434},{"id":"https://openalex.org/keywords/epitaxy","display_name":"Epitaxy","score":0.43085721135139465},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.4292443096637726},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.30222874879837036},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2649366855621338},{"id":"https://openalex.org/keywords/organic-chemistry","display_name":"Organic chemistry","score":0.20648732781410217},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.20379510521888733}],"concepts":[{"id":"https://openalex.org/C540031477","wikidata":"https://www.wikidata.org/wiki/Q629","display_name":"Oxygen","level":2,"score":0.5785679221153259},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5464622974395752},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4652901887893677},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.43747496604919434},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.43085721135139465},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.4292443096637726},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.30222874879837036},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2649366855621338},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.20648732781410217},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.20379510521888733},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icm.2017.8268835","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm.2017.8268835","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 29th International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W627075074","https://openalex.org/W1514452635","https://openalex.org/W1543076793","https://openalex.org/W1588944626","https://openalex.org/W1617533440","https://openalex.org/W1671293550","https://openalex.org/W1727635404","https://openalex.org/W1736321058","https://openalex.org/W1965245884","https://openalex.org/W1967806386","https://openalex.org/W1976567207","https://openalex.org/W1986213552","https://openalex.org/W2003887133","https://openalex.org/W2014490327","https://openalex.org/W2014521578","https://openalex.org/W2022915008","https://openalex.org/W2032843489","https://openalex.org/W2042473487","https://openalex.org/W2049537476","https://openalex.org/W2081298453","https://openalex.org/W2085164934","https://openalex.org/W2963886933","https://openalex.org/W3158419683"],"related_works":["https://openalex.org/W2071549041","https://openalex.org/W2027167691","https://openalex.org/W2024471745","https://openalex.org/W1998613480","https://openalex.org/W2049125200","https://openalex.org/W1147243170","https://openalex.org/W2972426140","https://openalex.org/W2027491795","https://openalex.org/W1981155105","https://openalex.org/W2012656502"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"the":[3,50,93,104,109,119,127],"Optical":[4],"and":[5,53],"Semiconductor":[6],"properties":[7,86],"of":[8,12,111,130],"epitaxial":[9],"thin":[10,112],"films":[11,57],"Fe":[13],"<inf":[14,18,22,29],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[15,19,23,30,67],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2\u2212x</inf>":[16],"Ti":[17],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">x</inf>":[20],"O":[21],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">3-\u03b4</inf>":[24],",":[25],"deposited":[26],"on":[27],"SrTiO":[28],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">3</inf>":[31],"(001)":[32],"by":[33,103,126],"pulsed":[34],"laser":[35],"deposition":[36],"(PLD)":[37],"are":[38,101],"studied.":[39],"We":[40],"use":[41],"Perlin":[42],"Elmer":[43],"9500":[44],"spechtrophotometer":[45],"in":[46],"order":[47],"to":[48],"measure":[49],"optical":[51,85],"transmission":[52],"reflection.":[54],"The":[55,75,84],"prepared":[56,76],"using":[58],"oxygen":[59,94,105],"pressure":[60],"PO2":[61],"above":[62],"3":[63],"\u2217":[64],"10":[65],"<sup":[66],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">\u22127</sup>":[68],"Torr,":[69],"presents":[70],"a":[71,79,88,115],"R(3)":[72],"symmetry":[73],"structure.":[74],"samples":[77],"present":[78],"deficiency":[80,106],"\u03b4":[81],"=":[82],"0.35.":[83],"show":[87,114],"very":[89],"important":[90],"dependence":[91],"with":[92,123],"cation":[95],"stoichiometry.":[96],"These":[97],"last":[98],"properties,":[99],"which":[100],"dominated":[102],"obtained":[107],"during":[108],"growth":[110],"films,":[113],"semiconductor":[116],"behavior":[117],"where":[118],"conductivity":[120],"increase":[121],"more":[122],"S":[124],"than":[125],"atomic":[128],"ordering":[129],"titanium.":[131]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}