{"id":"https://openalex.org/W1555357088","doi":"https://doi.org/10.1109/icit.2015.7125206","title":"A fast and simple method to detect short circuit fault in cascaded H-bridge multilevel inverter","display_name":"A fast and simple method to detect short circuit fault in cascaded H-bridge multilevel inverter","publication_year":2015,"publication_date":"2015-03-01","ids":{"openalex":"https://openalex.org/W1555357088","doi":"https://doi.org/10.1109/icit.2015.7125206","mag":"1555357088"},"language":"en","primary_location":{"id":"doi:10.1109/icit.2015.7125206","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2015.7125206","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077634694","display_name":"Saeed Ouni","orcid":"https://orcid.org/0000-0002-2626-3250"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]},{"id":"https://openalex.org/I4210138643","display_name":"Universidad T\u00e9cnica Federico Santa Mar\u00eda","ror":"https://ror.org/02zbepj77","country_code":"EC","type":"education","lineage":["https://openalex.org/I4210138643"]},{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]}],"countries":["CL","EC","IR"],"is_corresponding":true,"raw_author_name":"Saeed Ouni","raw_affiliation_strings":["Departamento de Electr\u00f3nica, Universidad T\u00e9cnica Federico Santa Mar\u00eda","Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Departamento de Electr\u00f3nica, Universidad T\u00e9cnica Federico Santa Mar\u00eda","institution_ids":["https://openalex.org/I4210138643","https://openalex.org/I75778554"]},{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051422628","display_name":"Jos\u00e9 Rodr\u00edguez","orcid":"https://orcid.org/0000-0002-1410-4121"},"institutions":[{"id":"https://openalex.org/I4210138643","display_name":"Universidad T\u00e9cnica Federico Santa Mar\u00eda","ror":"https://ror.org/02zbepj77","country_code":"EC","type":"education","lineage":["https://openalex.org/I4210138643"]},{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]}],"countries":["CL","EC"],"is_corresponding":false,"raw_author_name":"Jose Rodriguez","raw_affiliation_strings":["Departamento de Electr\u00f3nica, Universidad T\u00e9cnica Federico Santa Mar\u00eda"],"affiliations":[{"raw_affiliation_string":"Departamento de Electr\u00f3nica, Universidad T\u00e9cnica Federico Santa Mar\u00eda","institution_ids":["https://openalex.org/I4210138643","https://openalex.org/I75778554"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060297287","display_name":"Mahmoud Shahbazi","orcid":"https://orcid.org/0000-0002-6057-3228"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mahmoud Shahbazi","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108608855","display_name":"MohammadReza Zolghadri","orcid":null},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"MohammadReza Zolghadri","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041640807","display_name":"Hashem Oraee","orcid":"https://orcid.org/0000-0002-1600-2030"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Hashem Oraee","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064003660","display_name":"Pablo Lezana","orcid":"https://orcid.org/0000-0001-8787-5536"},"institutions":[{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]},{"id":"https://openalex.org/I4210138643","display_name":"Universidad T\u00e9cnica Federico Santa Mar\u00eda","ror":"https://ror.org/02zbepj77","country_code":"EC","type":"education","lineage":["https://openalex.org/I4210138643"]}],"countries":["CL","EC"],"is_corresponding":false,"raw_author_name":"Pablo Lezana","raw_affiliation_strings":["Departamento de Electr\u00f3nica, Universidad T\u00e9cnica Federico Santa Mar\u00eda"],"affiliations":[{"raw_affiliation_string":"Departamento de Electr\u00f3nica, Universidad T\u00e9cnica Federico Santa Mar\u00eda","institution_ids":["https://openalex.org/I4210138643","https://openalex.org/I75778554"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060827189","display_name":"Andres Ulloa Schmeisser","orcid":null},"institutions":[{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]},{"id":"https://openalex.org/I4210138643","display_name":"Universidad T\u00e9cnica Federico Santa Mar\u00eda","ror":"https://ror.org/02zbepj77","country_code":"EC","type":"education","lineage":["https://openalex.org/I4210138643"]}],"countries":["CL","EC"],"is_corresponding":false,"raw_author_name":"Andres Ulloa Schmeisser","raw_affiliation_strings":["Departamento de Electr\u00f3nica, Universidad T\u00e9cnica Federico Santa Mar\u00eda"],"affiliations":[{"raw_affiliation_string":"Departamento de Electr\u00f3nica, Universidad T\u00e9cnica Federico Santa Mar\u00eda","institution_ids":["https://openalex.org/I4210138643","https://openalex.org/I75778554"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5077634694"],"corresponding_institution_ids":["https://openalex.org/I133529467","https://openalex.org/I4210138643","https://openalex.org/I75778554"],"apc_list":null,"apc_paid":null,"fwci":1.3809,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.82845434,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"866","last_page":"871"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7435035109519958},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.7020118236541748},{"id":"https://openalex.org/keywords/h-bridge","display_name":"H bridge","score":0.7016068696975708},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.602875828742981},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5986967086791992},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5613462924957275},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5261256694793701},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5174822807312012},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.47962722182273865},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4397912919521332},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3708626627922058},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.36106330156326294},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20589837431907654},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.1728718876838684},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.16634464263916016},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1337992548942566},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.08289271593093872},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.0742526650428772}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7435035109519958},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.7020118236541748},{"id":"https://openalex.org/C2778512005","wikidata":"https://www.wikidata.org/wiki/Q1545300","display_name":"H bridge","level":4,"score":0.7016068696975708},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.602875828742981},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5986967086791992},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5613462924957275},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5261256694793701},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5174822807312012},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.47962722182273865},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4397912919521332},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3708626627922058},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.36106330156326294},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20589837431907654},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.1728718876838684},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.16634464263916016},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1337992548942566},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.08289271593093872},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0742526650428772},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icit.2015.7125206","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2015.7125206","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W87353603","https://openalex.org/W225505944","https://openalex.org/W1968795727","https://openalex.org/W2007650816","https://openalex.org/W2030973541","https://openalex.org/W2041889229","https://openalex.org/W2059768996","https://openalex.org/W2069097042","https://openalex.org/W2090364380","https://openalex.org/W2095639323","https://openalex.org/W2108048963","https://openalex.org/W2111528612","https://openalex.org/W2154705583","https://openalex.org/W2161004549","https://openalex.org/W2161011148","https://openalex.org/W2167630521","https://openalex.org/W2168344259","https://openalex.org/W2507034709","https://openalex.org/W2539106575","https://openalex.org/W2539708761","https://openalex.org/W2542648387","https://openalex.org/W4255369858","https://openalex.org/W6729017296"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2169811953","https://openalex.org/W2102542442","https://openalex.org/W2995978550","https://openalex.org/W2370701447","https://openalex.org/W1995954242","https://openalex.org/W1040674887","https://openalex.org/W1853740179"],"abstract_inverted_index":{"Fault":[0],"detection":[1,33,92],"is":[2,19,35,63],"one":[3],"of":[4,39,56,59,88],"the":[5,23,40,57,86,89],"most":[6],"important":[7],"tasks":[8],"in":[9,26],"fault":[10,91],"tolerant":[11],"converters.":[12],"In":[13],"this":[14,60,75],"paper,":[15],"a":[16,27,67],"new":[17],"method":[18,76],"proposed":[20,90],"to":[21,65,73],"detect":[22],"faulty":[24],"cell":[25],"cascaded":[28],"H-bridge":[29],"multilevel":[30],"inverter.":[31],"The":[32,80],"technique":[34],"based":[36],"on":[37],"comparison":[38],"output":[41],"voltage":[42,45],"with":[43],"reference":[44],"made":[46],"by":[47],"using":[48],"switching":[49],"control":[50],"pulses":[51],"and":[52,77,82],"DC-Link":[53],"voltage.":[54],"Because":[55],"simplicity":[58],"method,":[61],"it":[62],"possible":[64],"use":[66],"single":[68],"field-programmable":[69],"gate":[70],"array":[71],"(FPGA)":[72],"implement":[74],"inverter":[78],"control.":[79],"simulation":[81],"experimental":[83],"results":[84],"confirm":[85],"effectiveness":[87],"technique.":[93]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}