{"id":"https://openalex.org/W4311224206","doi":"https://doi.org/10.1109/icecs202256217.2022.9970988","title":"A 40 GHz Varactor-less Class-C VCO with 17.1% Tuning Range and Long-Term Reliability in 28nm FD-SOI for Satellite Communications","display_name":"A 40 GHz Varactor-less Class-C VCO with 17.1% Tuning Range and Long-Term Reliability in 28nm FD-SOI for Satellite Communications","publication_year":2022,"publication_date":"2022-10-24","ids":{"openalex":"https://openalex.org/W4311224206","doi":"https://doi.org/10.1109/icecs202256217.2022.9970988"},"language":"en","primary_location":{"id":"doi:10.1109/icecs202256217.2022.9970988","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs202256217.2022.9970988","pdf_url":null,"source":{"id":"https://openalex.org/S4363607963","display_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039308968","display_name":"Ayoub Ait Ihda","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I2799535048","display_name":"Centre National d'\u00c9tudes Spatiales","ror":"https://ror.org/04h1h0y33","country_code":"FR","type":"government","lineage":["https://openalex.org/I2799535048"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Ayoub Ait Ihda","raw_affiliation_strings":["Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218,IMS Lab.,Talence,France","CNES, France","IMS Lab., Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218, Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218,IMS Lab.,Talence,France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"CNES, France","institution_ids":["https://openalex.org/I2799535048"]},{"raw_affiliation_string":"IMS Lab., Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218, Talence, France","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189","https://openalex.org/I1294671590","https://openalex.org/I15057530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068662659","display_name":"Yann Deval","orcid":"https://orcid.org/0000-0002-7358-8904"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Yann Deval","raw_affiliation_strings":["Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218,IMS Lab.,Talence,France","IMS Lab., Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218, Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218,IMS Lab.,Talence,France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"IMS Lab., Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218, Talence, France","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189","https://openalex.org/I1294671590","https://openalex.org/I15057530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110758665","display_name":"H. Lapuyade","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Herve Lapuyade","raw_affiliation_strings":["Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218,IMS Lab.,Talence,France","IMS Lab., Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218, Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218,IMS Lab.,Talence,France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"IMS Lab., Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218, Talence, France","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189","https://openalex.org/I1294671590","https://openalex.org/I15057530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090763602","display_name":"Fran\u00e7ois Rivet","orcid":"https://orcid.org/0000-0002-6003-4208"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Francois Rivet","raw_affiliation_strings":["Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218,IMS Lab.,Talence,France","IMS Lab., Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218, Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218,IMS Lab.,Talence,France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"IMS Lab., Univ. Bordeaux, Bordeaux INP, CNRS UMR 5218, Talence, France","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189","https://openalex.org/I1294671590","https://openalex.org/I15057530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073340989","display_name":"Matthieu Gastaldi","orcid":null},"institutions":[{"id":"https://openalex.org/I2799535048","display_name":"Centre National d'\u00c9tudes Spatiales","ror":"https://ror.org/04h1h0y33","country_code":"FR","type":"government","lineage":["https://openalex.org/I2799535048"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Matthieu Gastaldi","raw_affiliation_strings":["CNES,France","CNES, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNES,France","institution_ids":["https://openalex.org/I2799535048"]},{"raw_affiliation_string":"CNES, France","institution_ids":["https://openalex.org/I2799535048"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019039019","display_name":"S. Rochette","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]},{"id":"https://openalex.org/I4400009052","display_name":"Thales Alenia Space (France)","ror":"https://ror.org/05gz77z03","country_code":null,"type":"company","lineage":["https://openalex.org/I2802798279","https://openalex.org/I4210140930","https://openalex.org/I4400009052"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Stephane Rochette","raw_affiliation_strings":["Thales Alenia Space,France","Thales Alenia Space, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Alenia Space,France","institution_ids":["https://openalex.org/I4210140930","https://openalex.org/I4400009052"]},{"raw_affiliation_string":"Thales Alenia Space, France","institution_ids":["https://openalex.org/I4210140930","https://openalex.org/I4400009052"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5039308968"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I2799535048","https://openalex.org/I4210157089","https://openalex.org/I4210160189"],"apc_list":null,"apc_paid":null,"fwci":0.3196,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.44605491,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.8440824747085571},{"id":"https://openalex.org/keywords/varicap","display_name":"Varicap","score":0.7751729488372803},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6802756786346436},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.6551175713539124},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5017528533935547},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.49598321318626404},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4764837920665741},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.4621560871601105},{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.4532987177371979},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4490537941455841},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4099269509315491},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.3836537003517151},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3731161952018738},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32270270586013794},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3206750154495239},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2871452867984772},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24319037795066833},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.09580415487289429}],"concepts":[{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.8440824747085571},{"id":"https://openalex.org/C15485314","wikidata":"https://www.wikidata.org/wiki/Q467463","display_name":"Varicap","level":4,"score":0.7751729488372803},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6802756786346436},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.6551175713539124},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5017528533935547},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.49598321318626404},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4764837920665741},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.4621560871601105},{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.4532987177371979},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4490537941455841},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4099269509315491},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.3836537003517151},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3731161952018738},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32270270586013794},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3206750154495239},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2871452867984772},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24319037795066833},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.09580415487289429},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/icecs202256217.2022.9970988","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs202256217.2022.9970988","pdf_url":null,"source":{"id":"https://openalex.org/S4363607963","display_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-03852880v1","is_oa":false,"landing_page_url":"https://hal.science/hal-03852880","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"29th IEEE International Conference on Electronics Circuits and Systems (ICECS), Oct 2022, Glasgow, United Kingdom","raw_type":"Conference papers"},{"id":"pmh:oai:HAL:hal-03852889v1","is_oa":false,"landing_page_url":"https://hal.science/hal-03852889","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Conference on Analog VLSI Circuits (AVIC)","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8600000143051147}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1974955739","https://openalex.org/W2050645980","https://openalex.org/W2063345521","https://openalex.org/W2112006904","https://openalex.org/W2150935719","https://openalex.org/W2885463289","https://openalex.org/W2948736226","https://openalex.org/W3015797764"],"related_works":["https://openalex.org/W2141726610","https://openalex.org/W2061664740","https://openalex.org/W2024671495","https://openalex.org/W1964543336","https://openalex.org/W2619153394","https://openalex.org/W2134439706","https://openalex.org/W2057338677","https://openalex.org/W4236967454","https://openalex.org/W4242529045","https://openalex.org/W4311591691"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,18,24,48,120,179,184],"40":[4],"GHz":[5,159,162,181],"varactor-less":[6],"class-C":[7,13,59],"VCO":[8,145],"with":[9,76,183],"long-term":[10],"reliability.":[11],"The":[12,38,61,92,113,144,167,195],"mode":[14],"is":[15,42,95,116,171],"achieved":[16],"by":[17,68,118],"transformer":[19,99],"magnetic":[20],"feedback":[21,134],"loop":[22,135],"and":[23,109,153,160,198,206],"control":[25],"circuit":[26,114],"that":[27],"lowers":[28],"the":[29,34,45,55,65,69,74,77,81,98,102,110,124,129,138,142,155],"bias":[30],"gate":[31],"voltage":[32,50],"of":[33,58,80,165,187],"VCO's":[35],"cross-pair":[36],"transistors.":[37,82],"tail":[39],"current":[40],"source":[41],"removed":[43],"from":[44,64,178],"VCO,":[46],"ensuring":[47],"high":[49,56],"swing":[51],"in":[52,123,148],"addition":[53],"to":[54,72,100,106,127,137],"efficiency":[57],"VCO.":[60],"design":[62],"benefits":[63],"body-biasing":[66],"offered":[67],"FD-SOI":[70,151],"technology":[71,152],"fine-tune":[73],"frequency":[75,156],"parasitic":[78,103],"capacitance":[79],"Thus,":[83],"low-quality":[84],"factor":[85],"varactors":[86],"at":[87,174],"mm-wave":[88],"frequencies":[89],"are":[90,203],"avoided.":[91],"capacitor":[93],"bank":[94],"placed":[96],"inside":[97],"reduce":[101],"inductance":[104],"due":[105],"lead":[107],"wires":[108],"silicon":[111],"footprint.":[112],"reliability":[115],"improved":[117],"using":[119],"cascode":[121],"structure":[122],"active":[125,139],"device":[126,140],"mitigate":[128],"hot-carriers":[130],"generation.":[131],"A":[132],"capacitive":[133],"added":[136],"boosts":[141],"transconductance.":[143],"was":[146],"implemented":[147],"28":[149],"nm":[150],"covers":[154],"between":[157],"35.58":[158,180],"42.36":[161],"(tuning":[163],"range":[164],"17.1%).":[166],"measured":[168],"phase":[169],"noise":[170],"\u221288.33":[172],"dBc/Hz":[173,205],"1":[175,191],"MHz":[176],"offset":[177],"carrier":[182],"power":[185],"consumption":[186],"7.3":[188],"mW":[189],"under":[190],"V":[192],"supply":[193],"voltage.":[194],"resulting":[196],"FoM":[197,199],"<inf":[200],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[201],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">T</inf>":[202],"170.72":[204],"175.38":[207],"dBc/Hz,":[208],"respectively.":[209]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-04-26T08:31:28.666265","created_date":"2025-10-10T00:00:00"}