{"id":"https://openalex.org/W2787270786","doi":"https://doi.org/10.1109/icecs.2017.8292090","title":"Construction of coverage data for post-silicon validation using big data techniques","display_name":"Construction of coverage data for post-silicon validation using big data techniques","publication_year":2017,"publication_date":"2017-12-01","ids":{"openalex":"https://openalex.org/W2787270786","doi":"https://doi.org/10.1109/icecs.2017.8292090","mag":"2787270786"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2017.8292090","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2017.8292090","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001510113","display_name":"Eman El Mandouh","orcid":null},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210099704","display_name":"Mentor","ror":"https://ror.org/016grqh48","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210099704"]}],"countries":["GB","HU"],"is_corresponding":true,"raw_author_name":"Eman El Mandouh","raw_affiliation_strings":["Design Verification Technology, Mentor Graphics Corporation"],"affiliations":[{"raw_affiliation_string":"Design Verification Technology, Mentor Graphics Corporation","institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210099704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101438025","display_name":"Ahmed Gamal","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"A. Gamal","raw_affiliation_strings":["Computer Engineering Dept., Cairo University, Egypt"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Dept., Cairo University, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112346021","display_name":"Alaa Khaled","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"A. Khaled","raw_affiliation_strings":["Computer Engineering Dept., Cairo University, Egypt"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Dept., Cairo University, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035483192","display_name":"TAHANY M. IBRAHIM","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"T. Ibrahim","raw_affiliation_strings":["Computer Engineering Dept., Cairo University, Egypt"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Dept., Cairo University, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049534161","display_name":"Amr G. Wassal","orcid":"https://orcid.org/0000-0001-6009-4174"},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Amr G. Wassal","raw_affiliation_strings":["Computer Engineering Dept., Cairo University, Egypt"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Dept., Cairo University, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018521872","display_name":"Elsayed E. Hemayed","orcid":"https://orcid.org/0000-0002-5421-7948"},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Elsayed Hemayed","raw_affiliation_strings":["Computer Engineering Dept., Cairo University, Egypt"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Dept., Cairo University, Egypt","institution_ids":["https://openalex.org/I145487455"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5001510113"],"corresponding_institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210099704"],"apc_list":null,"apc_paid":null,"fwci":0.2867,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.62053763,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"46","last_page":"49"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7671424150466919},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5435317754745483},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5205432176589966},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.48472070693969727},{"id":"https://openalex.org/keywords/trace","display_name":"TRACE (psycholinguistics)","score":0.45988404750823975},{"id":"https://openalex.org/keywords/big-data","display_name":"Big data","score":0.4153510630130768},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4153457283973694},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3425264358520508},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14080804586410522},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13092756271362305}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7671424150466919},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5435317754745483},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5205432176589966},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.48472070693969727},{"id":"https://openalex.org/C75291252","wikidata":"https://www.wikidata.org/wiki/Q1315756","display_name":"TRACE (psycholinguistics)","level":2,"score":0.45988404750823975},{"id":"https://openalex.org/C75684735","wikidata":"https://www.wikidata.org/wiki/Q858810","display_name":"Big data","level":2,"score":0.4153510630130768},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4153457283973694},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3425264358520508},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14080804586410522},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13092756271362305},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2017.8292090","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2017.8292090","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1521758819","https://openalex.org/W1544635590","https://openalex.org/W1598064945","https://openalex.org/W1918014366","https://openalex.org/W2024436253","https://openalex.org/W2101700684","https://openalex.org/W2121206032","https://openalex.org/W2147524308","https://openalex.org/W2166862343","https://openalex.org/W2491385276","https://openalex.org/W2613999959","https://openalex.org/W2995564009","https://openalex.org/W4236304864","https://openalex.org/W6632404128"],"related_works":["https://openalex.org/W4390608645","https://openalex.org/W4247566972","https://openalex.org/W4394895745","https://openalex.org/W2960264696","https://openalex.org/W3090563135","https://openalex.org/W2497432351","https://openalex.org/W4206777497","https://openalex.org/W2910064364","https://openalex.org/W4200136508","https://openalex.org/W2499527417"],"abstract_inverted_index":{"Full-system":[0],"FPGA":[1,185],"prototyping":[2,186],"is":[3,52,60,66],"now":[4],"being":[5],"widely":[6],"used":[7,62],"in":[8,19,73,93,153],"the":[9,41,53,79,85,112,124,135,143,165,176,190,194],"industry":[10],"for":[11,107,198],"System-on-Chip":[12],"(SoC)":[13],"verification.":[14,29],"Prototyping":[15],"platforms":[16],"run":[17,152],"tests":[18,146],"a":[20,37,105],"fraction":[21],"of":[22,56,81,95,126,137,145],"time":[23],"compared":[24],"to":[25,69,84,151,163,180],"traditional":[26],"simulation":[27],"based":[28],"However,":[30],"unlike":[31],"simulation,":[32],"they":[33],"do":[34],"not":[35],"provide":[36],"good":[38],"visibility":[39],"about":[40],"Design":[42],"under":[43],"Verification":[44],"(DUV)":[45],"or":[46],"its":[47],"achieved":[48],"verification":[49,196],"results.":[50],"Coverage":[51],"standard":[54],"measure":[55],"validation":[57],"effectiveness":[58],"and":[59,98,167],"extensively":[61],"pre-silicon.":[63],"But":[64],"it":[65,133],"very":[67],"challengeable":[68],"analyze":[70],"coverage":[71,88,108,129,168,182],"data":[72,109,161,169,183],"post-silicon":[74],"validation.":[75],"This":[76],"usually":[77],"requires":[78],"addition":[80,125],"extra":[82,127],"logic":[83],"silicon":[86,119],"as":[87],"monitors,":[89],"which":[90],"are":[91,148],"costly":[92],"terms":[94],"area,":[96],"power":[97],"timing.":[99],"In":[100],"this":[101],"paper,":[102],"we":[103],"propose":[104],"framework":[106,178],"construction":[110,170],"from":[111,142,184,193],"HW":[113,200],"design":[114],"trace":[115],"buffer":[116],"values":[117],"during":[118],"execution.":[120],"Our":[121,156,172],"approach":[122],"avoids":[123],"synthesized":[128],"monitors":[130],"logic.":[131],"Additionally,":[132],"overcomes":[134],"challenge":[136],"processing":[138,166],"huge":[139],"traces":[140],"result":[141],"execution":[144],"that":[147,188],"impossibly":[149],"expensive":[150],"pre-silicon":[154,195],"simulation.":[155],"work":[157],"applies":[158],"state-of-the-art":[159],"big":[160],"techniques":[162],"reduce":[164],"overhead.":[171],"results":[173,197],"indicate":[174],"how":[175],"proposed":[177],"managed":[179],"extract":[181],"runs":[187],"matches":[189],"one":[191],"generated":[192],"new-to-verify":[199],"designs.":[201]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}