{"id":"https://openalex.org/W1966002799","doi":"https://doi.org/10.1109/icecs.2011.6122253","title":"Novel technique for minimizing the comparator delay dispersion in 65nm CMOS technology","display_name":"Novel technique for minimizing the comparator delay dispersion in 65nm CMOS technology","publication_year":2011,"publication_date":"2011-12-01","ids":{"openalex":"https://openalex.org/W1966002799","doi":"https://doi.org/10.1109/icecs.2011.6122253","mag":"1966002799"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2011.6122253","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2011.6122253","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 18th IEEE International Conference on Electronics, Circuits, and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100645455","display_name":"Mohamed Abbas","orcid":"https://orcid.org/0000-0002-3141-2900"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Mohamed Abbas","raw_affiliation_strings":["VLSI Design & Education Center, University of Tokyo, Tokyo, Japan","VLSI Design and Education Center, the University of Tokyo, Tokyo, 113-0032, Japan"],"affiliations":[{"raw_affiliation_string":"VLSI Design & Education Center, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"VLSI Design and Education Center, the University of Tokyo, Tokyo, 113-0032, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010763159","display_name":"Takahiro Yamaguchi","orcid":"https://orcid.org/0000-0003-0325-8878"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro J. Yamaguchi","raw_affiliation_strings":["ADVANTEST Laboratories Limited, Sendai, Miyagi, Japan","ADVANTEST Laboratories, Ltd. 48-2, Matsubara, Aoba-ku, Sendai, Miyagi, 989-3124, Japan"],"affiliations":[{"raw_affiliation_string":"ADVANTEST Laboratories Limited, Sendai, Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"ADVANTEST Laboratories, Ltd. 48-2, Matsubara, Aoba-ku, Sendai, Miyagi, 989-3124, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108625204","display_name":"Yasuo Furukawa","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuo Furukawa","raw_affiliation_strings":["ADVANTEST Corporation, Gunma, Japan","ADVANTEST Corporation, Gunma 370-0718, Japan"],"affiliations":[{"raw_affiliation_string":"ADVANTEST Corporation, Gunma, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"ADVANTEST Corporation, Gunma 370-0718, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103025045","display_name":"Satoshi Komatsu","orcid":"https://orcid.org/0000-0002-9180-9053"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Komatsu","raw_affiliation_strings":["VLSI Design & Education Center, University of Tokyo, Tokyo, Japan","VLSI Design and Education Center, the University of Tokyo, Tokyo, 113-0032, Japan"],"affiliations":[{"raw_affiliation_string":"VLSI Design & Education Center, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"VLSI Design and Education Center, the University of Tokyo, Tokyo, 113-0032, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028680447","display_name":"Kunihiro Asada","orcid":"https://orcid.org/0000-0002-1150-0241"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kunihiro Asada","raw_affiliation_strings":["VLSI Design & Education Center, University of Tokyo, Tokyo, Japan","VLSI Design and Education Center, the University of Tokyo, Tokyo, 113-0032, Japan"],"affiliations":[{"raw_affiliation_string":"VLSI Design & Education Center, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"VLSI Design and Education Center, the University of Tokyo, Tokyo, 113-0032, Japan","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100645455"],"corresponding_institution_ids":["https://openalex.org/I74801974"],"apc_list":null,"apc_paid":null,"fwci":0.8394,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.72436978,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"220","last_page":"223"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.9263200163841248},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7538902759552002},{"id":"https://openalex.org/keywords/dispersion","display_name":"Dispersion (optics)","score":0.687375545501709},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.6728928089141846},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.5644909739494324},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5628751516342163},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5589178800582886},{"id":"https://openalex.org/keywords/variable","display_name":"Variable (mathematics)","score":0.5400126576423645},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.45144152641296387},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3676067590713501},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3401736617088318},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24961477518081665},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22217148542404175},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20814183354377747},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.13016217947006226},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10313841700553894}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.9263200163841248},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7538902759552002},{"id":"https://openalex.org/C177562468","wikidata":"https://www.wikidata.org/wiki/Q182893","display_name":"Dispersion (optics)","level":2,"score":0.687375545501709},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.6728928089141846},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.5644909739494324},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5628751516342163},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5589178800582886},{"id":"https://openalex.org/C182365436","wikidata":"https://www.wikidata.org/wiki/Q50701","display_name":"Variable (mathematics)","level":2,"score":0.5400126576423645},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.45144152641296387},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3676067590713501},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3401736617088318},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24961477518081665},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22217148542404175},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20814183354377747},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.13016217947006226},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10313841700553894},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2011.6122253","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2011.6122253","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 18th IEEE International Conference on Electronics, Circuits, and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2100835485","https://openalex.org/W2104046583","https://openalex.org/W2108439882","https://openalex.org/W2116120365","https://openalex.org/W2131675349","https://openalex.org/W2136511864","https://openalex.org/W2153562782","https://openalex.org/W2156114874"],"related_works":["https://openalex.org/W2044867305","https://openalex.org/W3161676474","https://openalex.org/W2478853198","https://openalex.org/W2615087047","https://openalex.org/W2118008391","https://openalex.org/W4328029037","https://openalex.org/W2968987278","https://openalex.org/W2572576974","https://openalex.org/W4293093694","https://openalex.org/W2921971237"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"new":[4],"technique":[5,18,60,65,85,100],"to":[6],"compensate":[7],"the":[8,45,50,54,59,79,83,92,99,107],"comparator":[9],"delay":[10,29,33,37,56,80],"dispersion":[11,57,81],"caused":[12],"by":[13],"variable":[14,32,36],"input":[15],"overdrive.":[16],"The":[17,35,64,72,95],"is":[19,39,61,66,86,111],"composed":[20],"of":[21,49,58,82,88,98],"three":[22],"main":[23],"blocks,":[24],"namely,":[25],"conventional":[26,51,93],"comparator,":[27],"fixed":[28],"block":[30,38],"and":[31,74,106],"block.":[34],"controlled":[40],"such":[41],"that":[42,78],"it":[43],"implements":[44],"inverse":[46],"overdrive-delay":[47],"characteristics":[48],"comparator.":[52,94],"Therefore,":[53],"overall":[55],"effectively":[62],"reduced.":[63],"implemented":[67],"in":[68,91],"65":[69],"nm":[70],"technology.":[71],"measurement":[73],"simulation":[75],"results":[76],"show":[77],"proposed":[84],"10%":[87],"its":[89],"counterpart":[90],"active":[96],"area":[97],"267.8":[101],"\u03bcm":[102],"<sup":[103],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[104],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[105],"measured":[108],"power":[109],"consumption":[110],"273":[112],"\u03bcW":[113],"at":[114],"200":[115],"MHz.":[116]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}