{"id":"https://openalex.org/W1963576510","doi":"https://doi.org/10.1109/icecs.2008.4674836","title":"Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits","display_name":"Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits","publication_year":2008,"publication_date":"2008-08-01","ids":{"openalex":"https://openalex.org/W1963576510","doi":"https://doi.org/10.1109/icecs.2008.4674836","mag":"1963576510"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2008.4674836","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4674836","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080418501","display_name":"Lukas Chruszczyk","orcid":"https://orcid.org/0000-0001-9812-8851"},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"L. Chruszczyk","raw_affiliation_strings":["INSTITUTE OF ELECTRONICS, SILESIAN UNIVERSITY OF TECHNOLOGY, GLIWICE, Poland","Inst. of Electron., Silesian Univ. of Technol., Gliwice"],"affiliations":[{"raw_affiliation_string":"INSTITUTE OF ELECTRONICS, SILESIAN UNIVERSITY OF TECHNOLOGY, GLIWICE, Poland","institution_ids":["https://openalex.org/I119004910"]},{"raw_affiliation_string":"Inst. of Electron., Silesian Univ. of Technol., Gliwice","institution_ids":["https://openalex.org/I119004910"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041953192","display_name":"Jerzy Rutkowski","orcid":null},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"J. Rutkowski","raw_affiliation_strings":["INSTITUTE OF ELECTRONICS, SILESIAN UNIVERSITY OF TECHNOLOGY, GLIWICE, Poland","Inst. of Electron., Silesian Univ. of Technol., Gliwice"],"affiliations":[{"raw_affiliation_string":"INSTITUTE OF ELECTRONICS, SILESIAN UNIVERSITY OF TECHNOLOGY, GLIWICE, Poland","institution_ids":["https://openalex.org/I119004910"]},{"raw_affiliation_string":"Inst. of Electron., Silesian Univ. of Technol., Gliwice","institution_ids":["https://openalex.org/I119004910"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5080418501"],"corresponding_institution_ids":["https://openalex.org/I119004910"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.0410564,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"61","issue":null,"first_page":"242","last_page":"246"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/aperiodic-graph","display_name":"Aperiodic graph","score":0.8914731740951538},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.7638838887214661},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.692236602306366},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6626760363578796},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6222840547561646},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5992962121963501},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5874012112617493},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.5729589462280273},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5707601308822632},{"id":"https://openalex.org/keywords/excitation","display_name":"Excitation","score":0.5188090205192566},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5158173441886902},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4370476305484772},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4323776960372925},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27443474531173706},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1575106978416443},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14812049269676208},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.05224636197090149}],"concepts":[{"id":"https://openalex.org/C104247578","wikidata":"https://www.wikidata.org/wiki/Q4779368","display_name":"Aperiodic graph","level":2,"score":0.8914731740951538},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.7638838887214661},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.692236602306366},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6626760363578796},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6222840547561646},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5992962121963501},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5874012112617493},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.5729589462280273},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5707601308822632},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.5188090205192566},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5158173441886902},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4370476305484772},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4323776960372925},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27443474531173706},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1575106978416443},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14812049269676208},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.05224636197090149},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2008.4674836","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4674836","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1561029587","https://openalex.org/W1924227955","https://openalex.org/W2151554678","https://openalex.org/W3011460294"],"related_works":["https://openalex.org/W2037661079","https://openalex.org/W2339191433","https://openalex.org/W4287817191","https://openalex.org/W4298800952","https://openalex.org/W2039582600","https://openalex.org/W1992569127","https://openalex.org/W172284633","https://openalex.org/W4380551899","https://openalex.org/W2601990241","https://openalex.org/W2077021924"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"design":[3],"of":[4,11,14,22,38],"specialised":[5],"aperiodic":[6,56],"excitation.":[7],"Purpose":[8],"is":[9,20,29],"improvement":[10,28],"fault":[12,46],"diagnosis":[13,47,52],"analog":[15],"electronic":[16],"circuits.":[17],"The":[18],"goal":[19],"enhancement":[21],"catastrophic":[23],"(hard)":[24],"faults":[25],"location.":[26],"Further":[27],"achieved":[30],"after":[31],"utilising":[32],"additional":[33],"feature":[34,49],"extraction":[35,50],"by":[36],"means":[37],"wavelet":[39],"transform.":[40],"Obtained":[41],"results":[42],"are":[43],"compared":[44],"to":[45],"without":[48],"and":[51],"with":[53],"the":[54],"simplest":[55],"excitation:":[57],"step":[58],"function.":[59]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}