{"id":"https://openalex.org/W4392248736","doi":"https://doi.org/10.1109/icce59016.2024.10444280","title":"Fast-neutron soft-error tolerance experimentation with a radiation-hardened optically reconfigurable gate array","display_name":"Fast-neutron soft-error tolerance experimentation with a radiation-hardened optically reconfigurable gate array","publication_year":2024,"publication_date":"2024-01-06","ids":{"openalex":"https://openalex.org/W4392248736","doi":"https://doi.org/10.1109/icce59016.2024.10444280"},"language":"en","primary_location":{"id":"doi:10.1109/icce59016.2024.10444280","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icce59016.2024.10444280","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101887712","display_name":"Minoru Watanabe","orcid":"https://orcid.org/0000-0002-7452-3555"},"institutions":[{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Minoru Watanabe","raw_affiliation_strings":["Okayama University,Faculty of Natural Science and Technology","Faculty of Natural Science and Technology, Okayama University"],"affiliations":[{"raw_affiliation_string":"Okayama University,Faculty of Natural Science and Technology","institution_ids":["https://openalex.org/I163770644"]},{"raw_affiliation_string":"Faculty of Natural Science and Technology, Okayama University","institution_ids":["https://openalex.org/I163770644"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061619362","display_name":"Makoto Kobayashi","orcid":"https://orcid.org/0000-0003-0920-2154"},"institutions":[{"id":"https://openalex.org/I4210108322","display_name":"National Institute for Fusion Science","ror":"https://ror.org/01t3wyv61","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1319490839","https://openalex.org/I199525922","https://openalex.org/I4210108322"]},{"id":"https://openalex.org/I200475212","display_name":"The Graduate University for Advanced Studies, SOKENDAI","ror":"https://ror.org/0516ah480","country_code":"JP","type":"education","lineage":["https://openalex.org/I200475212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto Kobayashi","raw_affiliation_strings":["National Institute for Fusion Science and the Graduate University of Advanced Studies, SOKENDAI"],"affiliations":[{"raw_affiliation_string":"National Institute for Fusion Science and the Graduate University of Advanced Studies, SOKENDAI","institution_ids":["https://openalex.org/I200475212","https://openalex.org/I4210108322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034696524","display_name":"M. Isobe","orcid":"https://orcid.org/0000-0002-3572-1882"},"institutions":[{"id":"https://openalex.org/I4210108322","display_name":"National Institute for Fusion Science","ror":"https://ror.org/01t3wyv61","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1319490839","https://openalex.org/I199525922","https://openalex.org/I4210108322"]},{"id":"https://openalex.org/I200475212","display_name":"The Graduate University for Advanced Studies, SOKENDAI","ror":"https://ror.org/0516ah480","country_code":"JP","type":"education","lineage":["https://openalex.org/I200475212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsutaka Isobe","raw_affiliation_strings":["National Institute for Fusion Science and the Graduate University of Advanced Studies, SOKENDAI"],"affiliations":[{"raw_affiliation_string":"National Institute for Fusion Science and the Graduate University of Advanced Studies, SOKENDAI","institution_ids":["https://openalex.org/I200475212","https://openalex.org/I4210108322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061571214","display_name":"K. Ogawa","orcid":"https://orcid.org/0000-0003-4555-1837"},"institutions":[{"id":"https://openalex.org/I200475212","display_name":"The Graduate University for Advanced Studies, SOKENDAI","ror":"https://ror.org/0516ah480","country_code":"JP","type":"education","lineage":["https://openalex.org/I200475212"]},{"id":"https://openalex.org/I4210108322","display_name":"National Institute for Fusion Science","ror":"https://ror.org/01t3wyv61","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1319490839","https://openalex.org/I199525922","https://openalex.org/I4210108322"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kunihiro Ogawa","raw_affiliation_strings":["National Institute for Fusion Science and the Graduate University of Advanced Studies, SOKENDAI"],"affiliations":[{"raw_affiliation_string":"National Institute for Fusion Science and the Graduate University of Advanced Studies, SOKENDAI","institution_ids":["https://openalex.org/I200475212","https://openalex.org/I4210108322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021475982","display_name":"S. Matsuyama","orcid":"https://orcid.org/0000-0003-4701-0970"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shigeo Matsuyama","raw_affiliation_strings":["Tohoku University"],"affiliations":[{"raw_affiliation_string":"Tohoku University","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066996463","display_name":"Misako Miwa","orcid":"https://orcid.org/0000-0002-8919-6112"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Misako Miwa","raw_affiliation_strings":["Tohoku University"],"affiliations":[{"raw_affiliation_string":"Tohoku University","institution_ids":["https://openalex.org/I201537933"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101887712"],"corresponding_institution_ids":["https://openalex.org/I163770644"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.01427936,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.832305371761322},{"id":"https://openalex.org/keywords/neutron","display_name":"Neutron","score":0.5709423422813416},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5314786434173584},{"id":"https://openalex.org/keywords/radiation-tolerance","display_name":"Radiation tolerance","score":0.49129050970077515},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.4907177686691284},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.42089036107063293},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.41846805810928345},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36240798234939575},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3414926528930664},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3384820818901062},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.32339704036712646},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22142070531845093},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13615775108337402},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.13012287020683289},{"id":"https://openalex.org/keywords/radiation-therapy","display_name":"Radiation therapy","score":0.08578631281852722}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.832305371761322},{"id":"https://openalex.org/C152568617","wikidata":"https://www.wikidata.org/wiki/Q2348","display_name":"Neutron","level":2,"score":0.5709423422813416},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5314786434173584},{"id":"https://openalex.org/C2987992536","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation tolerance","level":3,"score":0.49129050970077515},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.4907177686691284},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.42089036107063293},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.41846805810928345},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36240798234939575},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3414926528930664},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3384820818901062},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.32339704036712646},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22142070531845093},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13615775108337402},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.13012287020683289},{"id":"https://openalex.org/C509974204","wikidata":"https://www.wikidata.org/wiki/Q180507","display_name":"Radiation therapy","level":2,"score":0.08578631281852722},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce59016.2024.10444280","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icce59016.2024.10444280","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W4308575523","https://openalex.org/W4379115635","https://openalex.org/W4387473943"],"related_works":["https://openalex.org/W2110991008","https://openalex.org/W2161109877","https://openalex.org/W2563310135","https://openalex.org/W2000201823","https://openalex.org/W3009592744","https://openalex.org/W2042832476","https://openalex.org/W2149051075","https://openalex.org/W2061536619","https://openalex.org/W2394408226","https://openalex.org/W4392710407"],"abstract_inverted_index":{"Nuclear":[0],"power":[1],"plants":[2],"and":[3],"their":[4],"decommissioning":[5,21],"operations":[6],"require":[7],"radiation-hardened":[8,48],"devices":[9,25],"that":[10],"are":[11],"robust":[12],"against":[13],"neutron":[14],"because":[15],"recriticality":[16],"might":[17],"happen":[18],"while":[19],"doing":[20],"tasks.":[22],"To":[23],"realize":[24],"able":[26],"to":[27],"withstand":[28],"such":[29],"environments,":[30],"optically":[31,49],"reconfigurable":[32,50],"gate":[33,51],"arrays":[34],"have":[35],"been":[36],"developed.":[37],"This":[38],"paper":[39],"presents":[40],"radiation":[41],"tolerance":[42],"experiment":[43],"results":[44],"obtained":[45],"for":[46],"a":[47,54],"array":[52],"using":[53],"fast-neutron":[55],"beam.":[56]},"counts_by_year":[],"updated_date":"2025-12-19T19:40:27.379048","created_date":"2025-10-10T00:00:00"}