{"id":"https://openalex.org/W3106764495","doi":"https://doi.org/10.1109/icce-taiwan49838.2020.9258018","title":"Automatic ICEMI time-domain muti-point measurement platform","display_name":"Automatic ICEMI time-domain muti-point measurement platform","publication_year":2020,"publication_date":"2020-09-28","ids":{"openalex":"https://openalex.org/W3106764495","doi":"https://doi.org/10.1109/icce-taiwan49838.2020.9258018","mag":"3106764495"},"language":"en","primary_location":{"id":"doi:10.1109/icce-taiwan49838.2020.9258018","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce-taiwan49838.2020.9258018","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101637848","display_name":"Po\u2010Wei Huang","orcid":"https://orcid.org/0000-0001-5681-2305"},"institutions":[{"id":"https://openalex.org/I4880106","display_name":"Feng Chia University","ror":"https://ror.org/05vhczg54","country_code":"TW","type":"education","lineage":["https://openalex.org/I4880106"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"PoWei Huang","raw_affiliation_strings":["Feng-Chia University, Taiwan"],"affiliations":[{"raw_affiliation_string":"Feng-Chia University, Taiwan","institution_ids":["https://openalex.org/I4880106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087250153","display_name":"Shih\u2010Yi Yuan","orcid":"https://orcid.org/0000-0002-3704-0917"},"institutions":[{"id":"https://openalex.org/I4880106","display_name":"Feng Chia University","ror":"https://ror.org/05vhczg54","country_code":"TW","type":"education","lineage":["https://openalex.org/I4880106"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shih-Yi Yuan","raw_affiliation_strings":["Feng-Chia University, Taiwan"],"affiliations":[{"raw_affiliation_string":"Feng-Chia University, Taiwan","institution_ids":["https://openalex.org/I4880106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048296139","display_name":"Cheng-You Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I4880106","display_name":"Feng Chia University","ror":"https://ror.org/05vhczg54","country_code":"TW","type":"education","lineage":["https://openalex.org/I4880106"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Cheng-You Chang","raw_affiliation_strings":["Feng-Chia University, Taiwan"],"affiliations":[{"raw_affiliation_string":"Feng-Chia University, Taiwan","institution_ids":["https://openalex.org/I4880106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110945562","display_name":"Bo-Yu Zhu","orcid":null},"institutions":[{"id":"https://openalex.org/I4880106","display_name":"Feng Chia University","ror":"https://ror.org/05vhczg54","country_code":"TW","type":"education","lineage":["https://openalex.org/I4880106"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Bo-Yu Zhu","raw_affiliation_strings":["Feng-Chia University, Taiwan"],"affiliations":[{"raw_affiliation_string":"Feng-Chia University, Taiwan","institution_ids":["https://openalex.org/I4880106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027003247","display_name":"Shu-Yao Hsuan","orcid":null},"institutions":[{"id":"https://openalex.org/I4880106","display_name":"Feng Chia University","ror":"https://ror.org/05vhczg54","country_code":"TW","type":"education","lineage":["https://openalex.org/I4880106"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shu-Yao Hsuan","raw_affiliation_strings":["Feng-Chia University, Taiwan"],"affiliations":[{"raw_affiliation_string":"Feng-Chia University, Taiwan","institution_ids":["https://openalex.org/I4880106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004222945","display_name":"Chia\u2010Hung Su","orcid":"https://orcid.org/0000-0002-4203-5143"},"institutions":[{"id":"https://openalex.org/I4210122797","display_name":"Electronics Testing Center","ror":"https://ror.org/034rqbg02","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210122797"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chia-Hung Su","raw_affiliation_strings":["Electron Testing Center, Taiwan"],"affiliations":[{"raw_affiliation_string":"Electron Testing Center, Taiwan","institution_ids":["https://openalex.org/I4210122797"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061056958","display_name":"Jian-Li Dong","orcid":null},"institutions":[{"id":"https://openalex.org/I4387155658","display_name":"Bureau of Standards, Metrology and Inspection","ror":"https://ror.org/05wjmdd46","country_code":null,"type":"government","lineage":["https://openalex.org/I4387155658"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jian-Li Dong","raw_affiliation_strings":["Bureau of Standard Metrology and Inspection (BSMI), Taiwan"],"affiliations":[{"raw_affiliation_string":"Bureau of Standard Metrology and Inspection (BSMI), Taiwan","institution_ids":["https://openalex.org/I4387155658"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5101637848"],"corresponding_institution_ids":["https://openalex.org/I4880106"],"apc_list":null,"apc_paid":null,"fwci":0.411,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.6215946,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.9064406156539917},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.8159928917884827},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.7332099676132202},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5991455316543579},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.5621953010559082},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5599011182785034},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.552500307559967},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.542531430721283},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.49944400787353516},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.4993271827697754},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.491595596075058},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.42853933572769165},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32541608810424805},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.17109471559524536},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.07333734631538391}],"concepts":[{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.9064406156539917},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.8159928917884827},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.7332099676132202},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5991455316543579},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.5621953010559082},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5599011182785034},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.552500307559967},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.542531430721283},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.49944400787353516},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4993271827697754},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.491595596075058},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.42853933572769165},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32541608810424805},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.17109471559524536},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.07333734631538391},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce-taiwan49838.2020.9258018","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce-taiwan49838.2020.9258018","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.46000000834465027,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2493081126","https://openalex.org/W2984278903","https://openalex.org/W2989204880"],"related_works":["https://openalex.org/W1921091955","https://openalex.org/W2041511579","https://openalex.org/W1986241886","https://openalex.org/W2124450871","https://openalex.org/W2160921373","https://openalex.org/W2077896430","https://openalex.org/W2071764837","https://openalex.org/W2076345965","https://openalex.org/W2170868587","https://openalex.org/W2535925839"],"abstract_inverted_index":{"Most":[0],"of":[1,23,85],"the":[2,9,14,21,24],"IC-electromagnetic":[3],"interference":[4,16],"researches":[5],"get":[6],"information":[7,40],"in":[8,13],"frequency":[10],"domain.":[11],"However,":[12],"electromagnetic":[15],"(EMI)":[17],"leakage":[18,41],"research":[19],"field,":[20],"measurement":[22,47,55],"time":[25],"domain":[26],"is":[27,48],"crucial.":[28],"We":[29],"have":[30],"already":[31],"proposed":[32,73],"a":[33,44,63,83],"single":[34,45],"point":[35,46],"time-domain":[36,64],"EMI":[37,67],"signal":[38],"for":[39],"analysis,":[42],"but":[43],"incompetent.":[49],"This":[50,72],"paper":[51],"proposes":[52],"an":[53],"automated":[54],"platform":[56],"that":[57],"can":[58,76],"measure,":[59],"visualize,":[60],"and":[61,80],"plot":[62],"two-dimensional":[65],"(muti-point)":[66],"data":[68],"on":[69],"Microchip":[70],"dsPIC33EP512MC202.":[71],"automation":[74],"process":[75],"be":[77],"conveniently":[78],"extended":[79],"applied":[81],"to":[82],"variety":[84],"different":[86],"devices":[87],"under":[88],"test.":[89]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}