{"id":"https://openalex.org/W2070621991","doi":"https://doi.org/10.1109/iccd.2010.5647648","title":"Efficient test response compaction for robust BIST using parity sequences","display_name":"Efficient test response compaction for robust BIST using parity sequences","publication_year":2010,"publication_date":"2010-10-01","ids":{"openalex":"https://openalex.org/W2070621991","doi":"https://doi.org/10.1109/iccd.2010.5647648","mag":"2070621991"},"language":"en","primary_location":{"id":"doi:10.1109/iccd.2010.5647648","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2010.5647648","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Conference on Computer Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040371851","display_name":"Thomas Indlekofer","orcid":"https://orcid.org/0000-0002-3090-978X"},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Thomas Indlekofer","raw_affiliation_strings":["Computer Engineering Group, University of Paderborn, Germany"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Group, University of Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009604821","display_name":"Michael Schnittger","orcid":null},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Schnittger","raw_affiliation_strings":["Computer Engineering Group, University of Paderborn, Germany"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Group, University of Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051549317","display_name":"Sybille Hellebrand","orcid":"https://orcid.org/0000-0002-3717-3939"},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sybille Hellebrand","raw_affiliation_strings":["Computer Engineering Group, University of Paderborn, Germany"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Group, University of Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5040371851"],"corresponding_institution_ids":["https://openalex.org/I206945453"],"apc_list":null,"apc_paid":null,"fwci":0.2497,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.5694324,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"480","last_page":"485"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/compaction","display_name":"Compaction","score":0.7794528007507324},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4668005108833313},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4560433030128479},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.42948147654533386},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2384326159954071},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23030081391334534},{"id":"https://openalex.org/keywords/geotechnical-engineering","display_name":"Geotechnical engineering","score":0.11309242248535156},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.05896177887916565}],"concepts":[{"id":"https://openalex.org/C196715460","wikidata":"https://www.wikidata.org/wiki/Q1414356","display_name":"Compaction","level":2,"score":0.7794528007507324},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4668005108833313},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4560433030128479},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.42948147654533386},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2384326159954071},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23030081391334534},{"id":"https://openalex.org/C187320778","wikidata":"https://www.wikidata.org/wiki/Q1349130","display_name":"Geotechnical engineering","level":1,"score":0.11309242248535156},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.05896177887916565},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccd.2010.5647648","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2010.5647648","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Conference on Computer Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W141121412","https://openalex.org/W197391467","https://openalex.org/W612784192","https://openalex.org/W1541483005","https://openalex.org/W1572287951","https://openalex.org/W1957023732","https://openalex.org/W2043318181","https://openalex.org/W2098695358","https://openalex.org/W2099971661","https://openalex.org/W2102587899","https://openalex.org/W2104309038","https://openalex.org/W2104955033","https://openalex.org/W2108785072","https://openalex.org/W2110578688","https://openalex.org/W2125169487","https://openalex.org/W2128456472","https://openalex.org/W2145136265","https://openalex.org/W2147814275","https://openalex.org/W2152406824","https://openalex.org/W2152652532","https://openalex.org/W2162465831","https://openalex.org/W2163094833","https://openalex.org/W2164754947","https://openalex.org/W3144226148","https://openalex.org/W3147093959","https://openalex.org/W3150572018","https://openalex.org/W4251708180","https://openalex.org/W4299639710","https://openalex.org/W6607990715"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W3013719031","https://openalex.org/W3140187064","https://openalex.org/W2028550458","https://openalex.org/W2378755530","https://openalex.org/W585895904","https://openalex.org/W2004528270","https://openalex.org/W2485606874","https://openalex.org/W2087846525"],"abstract_inverted_index":{"Nano-electronic":[0],"circuits":[1,75],"and":[2,10,21,64,91,114,154],"systems":[3],"are":[4],"affected":[5],"by":[6,11,61,139,155],"increasing":[7,13],"parameter":[8],"variations":[9],"an":[12,67],"susceptibility":[14],"to":[15,22,31,66,99],"soft":[16,62],"errors.":[17],"To":[18],"improve":[19],"yield":[20,69,116],"compensate":[23],"errors":[24,63],"online,":[25],"fault":[26],"tolerance":[27],"must":[28],"be":[29,43,59],"added":[30],"the":[32,36,86,111,115,120,126],"design.":[33],"Observing":[34],"only":[35],"input/output":[37],"behavior":[38],"during":[39],"manufacturing":[40],"test":[41,54,87,112,123],"would":[42],"too":[44],"optimistic":[45],"for":[46,74],"such":[47],"robust":[48],"designs,":[49],"whereas":[50],"a":[51,72,93,96,133],"purely":[52],"structural":[53],"relying":[55],"on":[56],"DFT":[57],"can":[58],"disturbed":[60],"lead":[65],"unnecessary":[68],"loss.":[70],"As":[71],"solution":[73,134],"with":[76,119,135,143],"time":[77,113],"redundancy,":[78],"\u201csignature":[79],"rollback\u201d":[80],"has":[81,106],"been":[82,107],"proposed,":[83],"which":[84],"partitions":[85],"into":[88],"shorter":[89],"sessions":[90],"triggers":[92],"rollback":[94,142],"after":[95],"faulty":[97],"session":[98],"distinguish":[100],"permanent":[101],"from":[102],"transient":[103],"faults.":[104],"It":[105],"shown":[108],"that":[109],"both":[110,152],"loss":[117],"decrease":[118],"number":[121],"of":[122],"sessions,":[124],"but":[125],"hardware":[127,137],"overhead":[128,138],"increases.":[129],"This":[130],"paper":[131],"proposes":[132],"reduced":[136],"combining":[140],"signature":[141],"extreme":[144],"space":[145],"compaction.":[146],"The":[147],"new":[148],"scheme":[149],"is":[150],"validated":[151],"analytically":[153],"simulation":[156],"experiments.":[157]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}