{"id":"https://openalex.org/W4412964267","doi":"https://doi.org/10.1109/i2mtc62753.2025.11079216","title":"Real-Time FPGA Estimation of Eddy Currents and Hysteresis in Axisymmetric Inductors","display_name":"Real-Time FPGA Estimation of Eddy Currents and Hysteresis in Axisymmetric Inductors","publication_year":2025,"publication_date":"2025-05-19","ids":{"openalex":"https://openalex.org/W4412964267","doi":"https://doi.org/10.1109/i2mtc62753.2025.11079216"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc62753.2025.11079216","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc62753.2025.11079216","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029545256","display_name":"Oliver Munroe","orcid":"https://orcid.org/0000-0001-6385-5290"},"institutions":[{"id":"https://openalex.org/I63341726","display_name":"Universit\u00e9 du Qu\u00e9bec \u00e0 Trois-Rivi\u00e8res","ror":"https://ror.org/02xrw9r68","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I63341726"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Oliver Munroe","raw_affiliation_strings":["Universit&#x00E9; du Qu&#x00E9;bec &#x00E0; Trois-Rivi&#x00E8;res,Electrical and Computer Engineering Department,Trois-Rivi&#x00E8;res, Qu&#x00E9;bec,Canada,3351"],"affiliations":[{"raw_affiliation_string":"Universit&#x00E9; du Qu&#x00E9;bec &#x00E0; Trois-Rivi&#x00E8;res,Electrical and Computer Engineering Department,Trois-Rivi&#x00E8;res, Qu&#x00E9;bec,Canada,3351","institution_ids":["https://openalex.org/I63341726"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077915387","display_name":"Michel Lemaire","orcid":null},"institutions":[{"id":"https://openalex.org/I63341726","display_name":"Universit\u00e9 du Qu\u00e9bec \u00e0 Trois-Rivi\u00e8res","ror":"https://ror.org/02xrw9r68","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I63341726"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Michel Lemaire","raw_affiliation_strings":["Universit&#x00E9; du Qu&#x00E9;bec &#x00E0; Trois-Rivi&#x00E8;res,Electrical and Computer Engineering Department,Trois-Rivi&#x00E8;res, Qu&#x00E9;bec,Canada,3351"],"affiliations":[{"raw_affiliation_string":"Universit&#x00E9; du Qu&#x00E9;bec &#x00E0; Trois-Rivi&#x00E8;res,Electrical and Computer Engineering Department,Trois-Rivi&#x00E8;res, Qu&#x00E9;bec,Canada,3351","institution_ids":["https://openalex.org/I63341726"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012046735","display_name":"Daniel Massicotte","orcid":"https://orcid.org/0000-0002-7807-7919"},"institutions":[{"id":"https://openalex.org/I63341726","display_name":"Universit\u00e9 du Qu\u00e9bec \u00e0 Trois-Rivi\u00e8res","ror":"https://ror.org/02xrw9r68","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I63341726"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Daniel Massicotte","raw_affiliation_strings":["Universit&#x00E9; du Qu&#x00E9;bec &#x00E0; Trois-Rivi&#x00E8;res,Electrical and Computer Engineering Department,Trois-Rivi&#x00E8;res, Qu&#x00E9;bec,Canada,3351"],"affiliations":[{"raw_affiliation_string":"Universit&#x00E9; du Qu&#x00E9;bec &#x00E0; Trois-Rivi&#x00E8;res,Electrical and Computer Engineering Department,Trois-Rivi&#x00E8;res, Qu&#x00E9;bec,Canada,3351","institution_ids":["https://openalex.org/I63341726"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5029545256"],"corresponding_institution_ids":["https://openalex.org/I63341726"],"apc_list":null,"apc_paid":null,"fwci":0.4383,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.63191566,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.8089787364006042},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.7975452542304993},{"id":"https://openalex.org/keywords/rotational-symmetry","display_name":"Rotational symmetry","score":0.6629042625427246},{"id":"https://openalex.org/keywords/hysteresis","display_name":"Hysteresis","score":0.6576655507087708},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.43463659286499023},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.40711402893066406},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.3652094602584839},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3263121247291565},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3141764998435974},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28970128297805786},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23352161049842834},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15499550104141235},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.12323984503746033},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.09293892979621887}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.8089787364006042},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.7975452542304993},{"id":"https://openalex.org/C33026886","wikidata":"https://www.wikidata.org/wiki/Q593950","display_name":"Rotational symmetry","level":2,"score":0.6629042625427246},{"id":"https://openalex.org/C123299182","wikidata":"https://www.wikidata.org/wiki/Q190837","display_name":"Hysteresis","level":2,"score":0.6576655507087708},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.43463659286499023},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.40711402893066406},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.3652094602584839},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3263121247291565},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3141764998435974},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28970128297805786},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23352161049842834},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15499550104141235},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.12323984503746033},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.09293892979621887},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc62753.2025.11079216","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc62753.2025.11079216","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320334593","display_name":"Natural Sciences and Engineering Research Council of Canada","ror":"https://ror.org/01h531d29"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W325120581","https://openalex.org/W1558562786","https://openalex.org/W2058970031","https://openalex.org/W2075315063","https://openalex.org/W2101697338","https://openalex.org/W2133675877","https://openalex.org/W2141224504","https://openalex.org/W2148408344","https://openalex.org/W2245500324","https://openalex.org/W2255859285","https://openalex.org/W2292293750","https://openalex.org/W2535255545","https://openalex.org/W3129070382","https://openalex.org/W4221058967","https://openalex.org/W4254402395","https://openalex.org/W4289519575","https://openalex.org/W4382007658","https://openalex.org/W4388251874","https://openalex.org/W4406354650","https://openalex.org/W6633377834","https://openalex.org/W6696743548","https://openalex.org/W6745261694","https://openalex.org/W6861936927"],"related_works":["https://openalex.org/W2027630214","https://openalex.org/W4405446272","https://openalex.org/W2798896958","https://openalex.org/W2080420513","https://openalex.org/W2168095168","https://openalex.org/W2165645320","https://openalex.org/W2118835423","https://openalex.org/W2100925189","https://openalex.org/W4309226938","https://openalex.org/W2155838675"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,7,14,27,73,131],"FPGA":[4,59],"application":[5],"of":[6,13,20,67,76,83,92,120],"finite":[8],"difference":[9],"white":[10],"box":[11],"model":[12,33,50,60,124],"electromagnetic":[15],"device":[16],"including":[17],"the":[18,38,49,58,81,84,96,101,107,118],"effects":[19],"eddy":[21],"currents":[22],"and":[23,30,42,48,54,64,106],"hysteresis,":[24],"applied":[25],"to":[26,80,89,126],"loudspeaker":[28],"motor":[29],"coil.":[31],"The":[32,123],"parameters":[34],"are":[35],"derived":[36],"from":[37],"measured":[39,53],"coil":[40],"voltage":[41],"current":[43,109],"using":[44],"an":[45],"offline":[46],"algorithm,":[47],"compared":[51],"against":[52],"simulated":[55],"data.":[56],"Overall,":[57],"shows":[61],"acceptable":[62],"accuracy,":[63],"is":[65,87],"capable":[66],"running":[68],"in":[69,114],"real":[70,115],"time":[71],"at":[72],"sampling":[74],"rate":[75],"1":[77],"MHz.":[78],"Due":[79],"nature":[82],"model,":[85],"it":[86],"possible":[88],"access":[90],"estimates":[91],"quantities":[93],"such":[94],"as":[95],"magnetic":[97,102],"flux":[98],"density":[99,110],"B,":[100],"field":[103],"strength":[104],"H":[105],"free":[108],"J<inf":[111],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[112],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">f</inf>":[113],"time,":[116],"allowing":[117,135],"possibility":[119],"virtual":[121],"instrumentation.":[122],"proves":[125],"be":[127],"relatively":[128],"accurate":[129],"across":[130],"wide":[132],"frequency":[133],"range":[134],"its":[136],"use":[137],"inside":[138],"various":[139],"control":[140],"systems.":[141]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-21T23:12:01.093139","created_date":"2025-10-10T00:00:00"}