{"id":"https://openalex.org/W4400114720","doi":"https://doi.org/10.1109/i2mtc60896.2024.10561217","title":"Including Measurement Uncertainty to Improve the Reliability of Classification ANN","display_name":"Including Measurement Uncertainty to Improve the Reliability of Classification ANN","publication_year":2024,"publication_date":"2024-05-20","ids":{"openalex":"https://openalex.org/W4400114720","doi":"https://doi.org/10.1109/i2mtc60896.2024.10561217"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc60896.2024.10561217","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc60896.2024.10561217","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014275270","display_name":"Marco Carrat\u00f9","orcid":"https://orcid.org/0000-0001-8146-6088"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Marco Carrat\u00f9","raw_affiliation_strings":["University of Salerno,Department of Industrial Engineering,Fisciano,SA,ITALY"],"affiliations":[{"raw_affiliation_string":"University of Salerno,Department of Industrial Engineering,Fisciano,SA,ITALY","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034503288","display_name":"Vincenzo Gallo","orcid":"https://orcid.org/0000-0002-9873-3784"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Vincenzo Gallo","raw_affiliation_strings":["University of Salerno,Department of Industrial Engineering,Fisciano,SA,ITALY"],"affiliations":[{"raw_affiliation_string":"University of Salerno,Department of Industrial Engineering,Fisciano,SA,ITALY","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093272654","display_name":"Valter Laino","orcid":"https://orcid.org/0009-0007-6784-9737"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Valter Laino","raw_affiliation_strings":["University of Salerno,Department of Industrial Engineering,Fisciano,SA,ITALY"],"affiliations":[{"raw_affiliation_string":"University of Salerno,Department of Industrial Engineering,Fisciano,SA,ITALY","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062085198","display_name":"Consolatina Liguori","orcid":"https://orcid.org/0000-0003-3254-2069"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Consolatina Liguori","raw_affiliation_strings":["University of Salerno,Department of Industrial Engineering,Fisciano,SA,ITALY"],"affiliations":[{"raw_affiliation_string":"University of Salerno,Department of Industrial Engineering,Fisciano,SA,ITALY","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071580146","display_name":"Antonio Pietrosanto","orcid":"https://orcid.org/0000-0001-5593-7325"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Pietrosanto","raw_affiliation_strings":["University of Salerno,Department of Industrial Engineering,Fisciano,SA,ITALY"],"affiliations":[{"raw_affiliation_string":"University of Salerno,Department of Industrial Engineering,Fisciano,SA,ITALY","institution_ids":["https://openalex.org/I131729948"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5014275270"],"corresponding_institution_ids":["https://openalex.org/I131729948"],"apc_list":null,"apc_paid":null,"fwci":1.4305,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.81005093,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.2401999980211258,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.2401999980211258,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.714289665222168},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6503473520278931},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5331361293792725},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5241827368736267},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5115240812301636},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3961612582206726},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3521732985973358},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3026106357574463},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15052103996276855},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14563408493995667}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.714289665222168},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6503473520278931},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5331361293792725},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5241827368736267},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5115240812301636},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3961612582206726},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3521732985973358},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3026106357574463},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15052103996276855},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14563408493995667},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc60896.2024.10561217","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc60896.2024.10561217","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W30674699","https://openalex.org/W123295786","https://openalex.org/W1566736496","https://openalex.org/W1969069964","https://openalex.org/W1979930226","https://openalex.org/W1989804777","https://openalex.org/W2058151634","https://openalex.org/W2058739717","https://openalex.org/W2071311441","https://openalex.org/W2149354205","https://openalex.org/W2162517115","https://openalex.org/W2292751103","https://openalex.org/W2512840713","https://openalex.org/W2560806961","https://openalex.org/W2605991300","https://openalex.org/W2766732246","https://openalex.org/W2883771917","https://openalex.org/W2886679501","https://openalex.org/W2927635891","https://openalex.org/W2963855167","https://openalex.org/W2997626223","https://openalex.org/W3132968835","https://openalex.org/W3152288279","https://openalex.org/W4324116476","https://openalex.org/W4384158692","https://openalex.org/W4388720408","https://openalex.org/W4388952492","https://openalex.org/W4391423117","https://openalex.org/W6696429117","https://openalex.org/W6697042369","https://openalex.org/W6697147029","https://openalex.org/W6704286305","https://openalex.org/W6728817311"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"The":[0],"widespread":[1],"application":[2],"of":[3,23,36,39,42,54,57,67,117,141],"Artificial":[4],"Neural":[5],"Networks":[6],"in":[7,63,84,119,132],"various":[8],"fields":[9],"that":[10],"can":[11],"be":[12,164],"potentially":[13],"life-threatening":[14],"has":[15,28],"raised":[16],"questions":[17],"about":[18],"the":[19,34,37,40,55,58,64,73,87,129,133,142,148,156,160],"quality":[20,56],"and":[21,78,98,114,124,137],"reliability":[22],"their":[24],"results.":[25],"Consequently,":[26,155],"it":[27],"become":[29],"increasingly":[30],"important":[31],"to":[32,93,128,151,163],"investigate":[33],"contribution":[35],"uncertainty":[38,65,83,118,153],"outputs":[41],"such":[43],"systems.":[44],"Their":[45],"employment":[46],"for":[47,75,81,89,122,144],"classification":[48,125],"problems":[49],"lacks":[50],"a":[51,90,95,111],"thorough":[52],"evaluation":[53],"results,":[59],"revealing":[60],"significant":[61],"shortcomings":[62],"management":[66],"these":[68,102],"methodologies.":[69],"These":[70],"limitations":[71],"highlight":[72],"need":[74,88],"more":[76,112],"comprehensive":[77,113],"accurate":[79],"methodologies":[80],"estimating":[82],"classifiers,":[85],"underscoring":[86],"novel":[91],"approach":[92,158],"develop":[94],"robust,":[96],"accurate,":[97],"repeatable":[99],"methodology.":[100],"Despite":[101],"obstacles,":[103],"some":[104],"techniques":[105],"provide":[106],"valuable":[107],"methodological":[108],"insights,":[109],"enabling":[110],"general":[115],"treatment":[116],"neural":[120],"networks":[121],"recognition":[123],"applications.":[126],"Adhering":[127],"principles":[130],"outlined":[131],"ISO":[134],"GUM":[135],"standard":[136],"incorporating":[138],"appropriate":[139],"linearization":[140],"model":[143],"direct":[145],"processing":[146],"makes":[147],"authors":[149],"propose":[150],"evaluate":[152],"analytically.":[154],"proposed":[157],"allows":[159],"network":[161],"output":[162],"evaluated":[165],"by":[166],"quantifying":[167],"its":[168],"reliability.":[169]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2}],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}