{"id":"https://openalex.org/W4400114867","doi":"https://doi.org/10.1109/i2mtc60896.2024.10560642","title":"SEC-UNet: Squeeze-and-Excitation Vision Transformer and Cross Attention Enhanced UNet for Electrical Impedance Tomography","display_name":"SEC-UNet: Squeeze-and-Excitation Vision Transformer and Cross Attention Enhanced UNet for Electrical Impedance Tomography","publication_year":2024,"publication_date":"2024-05-20","ids":{"openalex":"https://openalex.org/W4400114867","doi":"https://doi.org/10.1109/i2mtc60896.2024.10560642"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc60896.2024.10560642","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc60896.2024.10560642","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100784335","display_name":"Zichen Wang","orcid":"https://orcid.org/0000-0001-8940-6792"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zichen Wang","raw_affiliation_strings":["School of Electronic and Information Engineering, Tiangong University,Tianjin,China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Tiangong University,Tianjin,China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100375777","display_name":"Tao Zhang","orcid":"https://orcid.org/0000-0002-1535-4309"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tao Zhang","raw_affiliation_strings":["School of Electronic and Information Engineering, Tiangong University,Tianjin,China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Tiangong University,Tianjin,China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061867895","display_name":"Qi Wang","orcid":"https://orcid.org/0000-0002-5339-5427"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Wang","raw_affiliation_strings":["School of Electronic and Information Engineering, Tiangong University,Tianjin,China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Tiangong University,Tianjin,China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100739594","display_name":"Ronghua Zhang","orcid":"https://orcid.org/0000-0001-5977-1713"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ronghua Zhang","raw_affiliation_strings":["School of Electronic and Information Engineering, Tiangong University,Tianjin,China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Tiangong University,Tianjin,China","institution_ids":["https://openalex.org/I198091727"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100784335"],"corresponding_institution_ids":["https://openalex.org/I198091727"],"apc_list":null,"apc_paid":null,"fwci":0.8878,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.73500746,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9632999897003174,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9632999897003174,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.6712243556976318},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6095861196517944},{"id":"https://openalex.org/keywords/excitation","display_name":"Excitation","score":0.5642910003662109},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.54375159740448},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3286655843257904},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1982191503047943},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16849413514137268},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08602598309516907}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.6712243556976318},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6095861196517944},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.5642910003662109},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.54375159740448},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3286655843257904},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1982191503047943},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16849413514137268},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08602598309516907}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc60896.2024.10560642","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc60896.2024.10560642","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5899999737739563,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2083927153","https://openalex.org/W2574952845","https://openalex.org/W2594988164","https://openalex.org/W2941524667","https://openalex.org/W2990050904","https://openalex.org/W3017690115","https://openalex.org/W3112965401","https://openalex.org/W3127751679","https://openalex.org/W3147057447","https://openalex.org/W3160733781","https://openalex.org/W3209987414","https://openalex.org/W4214614164","https://openalex.org/W4223429060","https://openalex.org/W4283717811","https://openalex.org/W4286561520","https://openalex.org/W4311331221","https://openalex.org/W4362714483","https://openalex.org/W4379984029","https://openalex.org/W4386283456","https://openalex.org/W6790275670"],"related_works":["https://openalex.org/W2359871536","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W1979972895","https://openalex.org/W2944246511","https://openalex.org/W4285180073","https://openalex.org/W4235437594","https://openalex.org/W3097371773","https://openalex.org/W2362037466","https://openalex.org/W2752613076"],"abstract_inverted_index":{"Electrical":[0],"Impedance":[1],"Tomography":[2],"(EIT),":[3],"recognized":[4],"for":[5,79],"its":[6,21],"visualization":[7],"and":[8,17,24,37,64,85,101,113,120,129,140],"non-invasive":[9],"characteristics,":[10],"holds":[11],"broad":[12],"application":[13],"prospects":[14],"in":[15,26,41,149],"industrial":[16],"biomedical":[18],"fields.":[19],"However,":[20],"inherent":[22],"ill-posedness":[23],"nonlinearity":[25],"the":[27,137,143,146],"inverse":[28],"problem":[29],"led":[30],"to":[31,55,68],"low":[32],"spatial":[33],"resolution,":[34],"boundary":[35,127],"distortion,":[36],"inaccurate":[38],"conductivity":[39],"representation":[40],"current":[42],"imaging":[43,52,151],"methods.":[44,122],"This":[45],"paper":[46],"introduces":[47],"an":[48],"enhanced":[49,138],"U-shaped":[50],"deep":[51],"approach,":[53],"referred":[54],"SEC-UNet,":[56],"which":[57],"optimizes":[58],"skip":[59],"connections":[60],"using":[61],"SE":[62],"attention":[63],"Vision":[65],"Transformer":[66,147],"(ViT)":[67],"build":[69],"global":[70],"information":[71,82],"features.":[72],"Moreover,":[73],"a":[74,93,102],"cross-attention":[75],"module":[76],"is":[77],"introduced":[78],"fusing":[80],"multi-scale":[81],"between":[83],"encoder":[84],"decoder.":[86],"The":[87,123,134],"experiments":[88],"show":[89],"that":[90],"SEC-UNet":[91],"achieves":[92],"Root":[94],"Mean":[95],"Square":[96],"Error":[97],"(RMSE)":[98],"of":[99,107,145],"2.5067":[100],"Structural":[103],"Similarity":[104],"Index":[105],"(SSIM)":[106],"0.9282,":[108],"improving":[109],"RMSE":[110],"by":[111,115],"31.01%":[112],"SSIM":[114],"1.25%":[116],"over":[117,152],"state-of-the-art":[118],"Transformer-based":[119],"ConvNets-based":[121],"visualizations":[124],"demonstrate":[125],"better":[126],"preservation":[128],"consistency":[130],"with":[131],"actual":[132],"distributions.":[133],"results":[135],"confirm":[136],"robustness":[139],"generalizability,":[141],"indicating":[142],"superiority":[144],"framework":[148],"soft-field":[150],"ConvNets.":[153]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}