{"id":"https://openalex.org/W4400114567","doi":"https://doi.org/10.1109/i2mtc60896.2024.10560641","title":"Development of a Multiple HFCT-Based Reflectometry System for Live Cable Diagnosis","display_name":"Development of a Multiple HFCT-Based Reflectometry System for Live Cable Diagnosis","publication_year":2024,"publication_date":"2024-05-20","ids":{"openalex":"https://openalex.org/W4400114567","doi":"https://doi.org/10.1109/i2mtc60896.2024.10560641"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc60896.2024.10560641","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/i2mtc60896.2024.10560641","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113269227","display_name":"Chang Hyeon Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I145808223","display_name":"Hanbat National University","ror":"https://ror.org/00x514t95","country_code":"KR","type":"education","lineage":["https://openalex.org/I145808223"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Chang Hyeon Hong","raw_affiliation_strings":["Hanbat National University,dept.Electrical Engineering,Daejeon,South Korea"],"affiliations":[{"raw_affiliation_string":"Hanbat National University,dept.Electrical Engineering,Daejeon,South Korea","institution_ids":["https://openalex.org/I145808223"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051014046","display_name":"Yeon-Sub Sim","orcid":"https://orcid.org/0000-0002-6282-9581"},"institutions":[{"id":"https://openalex.org/I145808223","display_name":"Hanbat National University","ror":"https://ror.org/00x514t95","country_code":"KR","type":"education","lineage":["https://openalex.org/I145808223"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yeon-Sub Sim","raw_affiliation_strings":["Hanbat National University,dept.Electrical Engineering,Daejeon,South Korea"],"affiliations":[{"raw_affiliation_string":"Hanbat National University,dept.Electrical Engineering,Daejeon,South Korea","institution_ids":["https://openalex.org/I145808223"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113101561","display_name":"Hyun-Mo Seong","orcid":"https://orcid.org/0009-0009-1369-4164"},"institutions":[{"id":"https://openalex.org/I145808223","display_name":"Hanbat National University","ror":"https://ror.org/00x514t95","country_code":"KR","type":"education","lineage":["https://openalex.org/I145808223"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyun-Mo Seong","raw_affiliation_strings":["Hanbat National University,dept.Electrical Engineering,Daejeon,South Korea"],"affiliations":[{"raw_affiliation_string":"Hanbat National University,dept.Electrical Engineering,Daejeon,South Korea","institution_ids":["https://openalex.org/I145808223"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074116168","display_name":"Gu-Young Kwon","orcid":"https://orcid.org/0000-0002-1512-3068"},"institutions":[{"id":"https://openalex.org/I205490536","display_name":"Dongguk University","ror":"https://ror.org/057q6n778","country_code":"KR","type":"education","lineage":["https://openalex.org/I205490536"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gu-Young Kwon","raw_affiliation_strings":["Technology Engineering Dongguk University,dept.Smart Information,Gyeongju,South Korea"],"affiliations":[{"raw_affiliation_string":"Technology Engineering Dongguk University,dept.Smart Information,Gyeongju,South Korea","institution_ids":["https://openalex.org/I205490536"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011452143","display_name":"Chun-Kwon Lee","orcid":"https://orcid.org/0000-0002-6711-4817"},"institutions":[{"id":"https://openalex.org/I8991828","display_name":"Pukyong National University","ror":"https://ror.org/0433kqc49","country_code":"KR","type":"education","lineage":["https://openalex.org/I8991828"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chun-Kwon Lee","raw_affiliation_strings":["Pukyong National University,dept.Control and Instrumentation Engineering,Busan,South Korea"],"affiliations":[{"raw_affiliation_string":"Pukyong National University,dept.Control and Instrumentation Engineering,Busan,South Korea","institution_ids":["https://openalex.org/I8991828"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003732404","display_name":"Seung Jin Chang","orcid":"https://orcid.org/0000-0003-2819-7506"},"institutions":[{"id":"https://openalex.org/I145808223","display_name":"Hanbat National University","ror":"https://ror.org/00x514t95","country_code":"KR","type":"education","lineage":["https://openalex.org/I145808223"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung Jin Chang","raw_affiliation_strings":["Hanbat National University,dept.Electrical Engineering,Daejeon,South Korea"],"affiliations":[{"raw_affiliation_string":"Hanbat National University,dept.Electrical Engineering,Daejeon,South Korea","institution_ids":["https://openalex.org/I145808223"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5113269227"],"corresponding_institution_ids":["https://openalex.org/I145808223"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.070807,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9886999726295471,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9702000021934509,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reflectometry","display_name":"Reflectometry","score":0.890700101852417},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4014829397201538},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3420991897583008},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.3395976722240448},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.18954965472221375},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.0754874050617218}],"concepts":[{"id":"https://openalex.org/C2778925768","wikidata":"https://www.wikidata.org/wiki/Q3454718","display_name":"Reflectometry","level":3,"score":0.890700101852417},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4014829397201538},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3420991897583008},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.3395976722240448},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.18954965472221375},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0754874050617218},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc60896.2024.10560641","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/i2mtc60896.2024.10560641","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5}],"awards":[{"id":"https://openalex.org/G5465623336","display_name":null,"funder_award_id":"R22XO05-03","funder_id":"https://openalex.org/F4320326258","funder_display_name":"Korea Electric Power Corporation"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320326258","display_name":"Korea Electric Power Corporation","ror":"https://ror.org/04fperw70"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1983638645","https://openalex.org/W2090484961","https://openalex.org/W2126072094","https://openalex.org/W2158937277","https://openalex.org/W2158988067","https://openalex.org/W2166252671","https://openalex.org/W2494955277","https://openalex.org/W2593191789","https://openalex.org/W2749700529","https://openalex.org/W2803244048","https://openalex.org/W2809370667","https://openalex.org/W2921183390","https://openalex.org/W3005680279","https://openalex.org/W3204912027"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2140036717","https://openalex.org/W2091193607","https://openalex.org/W2035752977","https://openalex.org/W2597922112","https://openalex.org/W2084512058","https://openalex.org/W2022839116","https://openalex.org/W2249658485"],"abstract_inverted_index":{"To":[0,99],"maintain":[1],"a":[2,27,70],"reliable":[3],"power":[4,43],"system,":[5],"it":[6],"is":[7,50],"necessary":[8],"to":[9,24,53,63,90],"assess":[10],"their":[11],"live":[12,40],"condition":[13],"or":[14],"utilize":[15],"non-destructive":[16,28],"diagnostics.":[17],"Applying":[18],"the":[19,87,91,101],"High-Frequency":[20],"Current":[21],"Transformer":[22],"(HFCT)":[23],"reflectometry":[25,71],"enables":[26],"testing":[29],"of":[30,79],"target":[31,92],"cables":[32],"and":[33,58,109],"allows":[34],"for":[35],"localized":[36],"fault":[37,96,114],"diagnosis":[38,47],"under":[39],"conditions":[41],"without":[42],"off.":[44],"However,":[45],"cable":[46],"through":[48],"HFCT":[49,76,83,103],"challenging":[51],"due":[52],"significant":[54],"signal":[55,88],"attenuation,":[56],"dispersion,":[57],"nonlinear":[59],"behavior":[60],"with":[61],"respect":[62],"frequency.":[64],"In":[65],"this":[66],"paper,":[67],"we":[68],"propose":[69],"system":[72],"based":[73],"on":[74],"multiple":[75],"transducers":[77,84],"capable":[78],"live-wire":[80],"diagnosis.":[81],"Multiple":[82],"can":[85],"amplify":[86],"applied":[89],"cable,":[93],"which":[94],"improves":[95],"detection":[97],"performance.":[98],"select":[100],"optimal":[102],"installation,":[104],"two":[105],"experiments":[106],"were":[107],"designed":[108],"performance":[110],"was":[111],"verified:":[112],"(1)":[113],"localization,":[115],"(2)":[116],"propagation":[117],"constant":[118],"estimation.":[119]},"counts_by_year":[],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}