{"id":"https://openalex.org/W3177071834","doi":"https://doi.org/10.1109/i2mtc50364.2021.9459923","title":"Supershape augmented reconstruction method for electrical impedance tomography","display_name":"Supershape augmented reconstruction method for electrical impedance tomography","publication_year":2021,"publication_date":"2021-05-17","ids":{"openalex":"https://openalex.org/W3177071834","doi":"https://doi.org/10.1109/i2mtc50364.2021.9459923","mag":"3177071834"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc50364.2021.9459923","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc50364.2021.9459923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010752501","display_name":"Danping Gu","orcid":"https://orcid.org/0000-0002-4098-8573"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Danping Gu","raw_affiliation_strings":["School of Mathematical Sciences, University of Science and Technology of China, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Mathematical Sciences, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100407498","display_name":"Dong Liu","orcid":"https://orcid.org/0000-0002-9645-7683"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210103894","display_name":"Hefei National Center for Physical Sciences at Nanoscale","ror":"https://ror.org/01jeedh73","country_code":"CN","type":"facility","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366","https://openalex.org/I4210103894"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dong Liu","raw_affiliation_strings":["Hefei National Laboratory for Physical Sciences, University of Science and Technology of China, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Hefei National Laboratory for Physical Sciences, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I4210103894","https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100604592","display_name":"Jiansong Deng","orcid":"https://orcid.org/0000-0003-4093-373X"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiansong Deng","raw_affiliation_strings":["School of Mathematical Sciences, University of Science and Technology of China, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Mathematical Sciences, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100636978","display_name":"Jiangfeng Du","orcid":"https://orcid.org/0000-0001-8085-8012"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210103894","display_name":"Hefei National Center for Physical Sciences at Nanoscale","ror":"https://ror.org/01jeedh73","country_code":"CN","type":"facility","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366","https://openalex.org/I4210103894"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangfeng Du","raw_affiliation_strings":["Hefei National Laboratory for Physical Sciences, University of Science and Technology of China, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Hefei National Laboratory for Physical Sciences, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I4210103894","https://openalex.org/I126520041"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5010752501"],"corresponding_institution_ids":["https://openalex.org/I126520041"],"apc_list":null,"apc_paid":null,"fwci":0.2005,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.49831365,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.9279946088790894},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6075126528739929},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5753223896026611},{"id":"https://openalex.org/keywords/boundary","display_name":"Boundary (topology)","score":0.5593725442886353},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.5503619313240051},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.5201847553253174},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5090996623039246},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4678381681442261},{"id":"https://openalex.org/keywords/reconstruction-algorithm","display_name":"Reconstruction algorithm","score":0.42523738741874695},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.40883028507232666},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.29170525074005127},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23299577832221985},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.1691635549068451},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11142963171005249},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10272672772407532}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.9279946088790894},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6075126528739929},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5753223896026611},{"id":"https://openalex.org/C62354387","wikidata":"https://www.wikidata.org/wiki/Q875399","display_name":"Boundary (topology)","level":2,"score":0.5593725442886353},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.5503619313240051},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.5201847553253174},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5090996623039246},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4678381681442261},{"id":"https://openalex.org/C2779898584","wikidata":"https://www.wikidata.org/wiki/Q7820109","display_name":"Reconstruction algorithm","level":3,"score":0.42523738741874695},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.40883028507232666},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.29170525074005127},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23299577832221985},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.1691635549068451},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11142963171005249},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10272672772407532},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc50364.2021.9459923","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc50364.2021.9459923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Clean water and sanitation","score":0.6600000262260437,"id":"https://metadata.un.org/sdg/6"}],"awards":[{"id":"https://openalex.org/G5444154489","display_name":null,"funder_award_id":"61871356,81788101,11771420","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7421931469","display_name":null,"funder_award_id":"XDC07040200,GJJSTD20170001,QYZDY-SSW-SLH004","funder_id":"https://openalex.org/F4320321133","funder_display_name":"Chinese Academy of Sciences"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1248442178","https://openalex.org/W1971508657","https://openalex.org/W2088013354","https://openalex.org/W2128648870","https://openalex.org/W2133665775","https://openalex.org/W2141002303","https://openalex.org/W2141270723","https://openalex.org/W2342572800","https://openalex.org/W2396273044","https://openalex.org/W2759764994","https://openalex.org/W2920929174","https://openalex.org/W2946763030","https://openalex.org/W2990925740","https://openalex.org/W2998105502","https://openalex.org/W3013193552","https://openalex.org/W3037817844","https://openalex.org/W3083407674","https://openalex.org/W3092368201","https://openalex.org/W3100101641","https://openalex.org/W3134674350"],"related_works":["https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W3160616384","https://openalex.org/W2905540725","https://openalex.org/W4376629886","https://openalex.org/W2000128178","https://openalex.org/W2537891456","https://openalex.org/W2902419700","https://openalex.org/W2089974647","https://openalex.org/W2093495347"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,32,36,44],"shape":[4,27,75],"reconstruction":[5],"framework":[6,118],"for":[7],"electrical":[8],"impedance":[9],"tomography":[10],"(EIT)":[11],"based":[12],"on":[13],"the":[14,22,25,62,69,73,91,109,116,131],"concept":[15],"of":[16,46,90,121,124],"supershape":[17,37],"and":[18,81,101,111,126,134],"Boolean":[19,64],"operation.":[20],"In":[21,56],"proposed":[23,92,117],"framework,":[24],"basic":[26,74],"primitives":[28,76],"are":[29,66],"estimated":[30],"through":[31],"boundary":[33],"description":[34],"using":[35],"formula.":[38],"The":[39,88],"super-shape":[40],"formula":[41],"allows":[42],"representing":[43],"variety":[45],"shapes":[47,49],"including":[48],"with":[50,96,138],"smooth":[51],"boundaries":[52],"and/or":[53],"sharp":[54],"properties.":[55],"addition,":[57],"to":[58,68,83,129],"obtain":[59],"topology":[60],"optimization,":[61],"so-called":[63],"operations":[65],"applied":[67],"reconstruction,":[70],"such":[71],"that":[72,115],"can":[77],"be":[78],"overlapped,":[79],"merged,":[80],"separated":[82],"form":[84],"various":[85],"complex":[86],"shapes.":[87],"performance":[89],"approach":[93],"is":[94,119],"tested":[95],"experimental":[97,112],"water":[98],"tank":[99],"data":[100,103],"simulated":[102],"considering":[104],"EIT":[105],"lung":[106],"imaging.":[107],"Both":[108],"simulation":[110],"results":[113],"show":[114],"capable":[120],"preserving":[122],"features":[123],"inclusions":[125],"providing":[127],"estimates":[128],"both":[130],"interface":[132],"locations":[133],"unknown":[135],"conductivity":[136],"values":[137],"reliable":[139],"accuracy.":[140]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}