{"id":"https://openalex.org/W3175870467","doi":"https://doi.org/10.1109/i2mtc50364.2021.9459890","title":"An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation","display_name":"An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation","publication_year":2021,"publication_date":"2021-05-17","ids":{"openalex":"https://openalex.org/W3175870467","doi":"https://doi.org/10.1109/i2mtc50364.2021.9459890","mag":"3175870467"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc50364.2021.9459890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc50364.2021.9459890","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101589279","display_name":"Yun Yang","orcid":"https://orcid.org/0000-0002-6989-7560"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yun Yang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Harbin Institute of Technology,Harbin,China","School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology,Harbin,China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100622589","display_name":"Cen Chen","orcid":"https://orcid.org/0000-0002-5115-4929"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cen Chen","raw_affiliation_strings":["School of Electrical Engineering and Automation, Harbin Institute of Technology,Harbin,China","School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology,Harbin,China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048812154","display_name":"Xuerong Ye","orcid":"https://orcid.org/0000-0002-5258-2474"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuerong Ye","raw_affiliation_strings":["School of Electrical Engineering and Automation, Harbin Institute of Technology,Harbin,China","School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology,Harbin,China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089010791","display_name":"Chengzhi Sun","orcid":"https://orcid.org/0000-0002-6302-8006"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengzhi Sun","raw_affiliation_strings":["School of Electrical Engineering and Automation, Harbin Institute of Technology,Harbin,China","School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology,Harbin,China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101589279"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0597381,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/excitation","display_name":"Excitation","score":0.7801458835601807},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5244146585464478},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.517379641532898},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49226275086402893},{"id":"https://openalex.org/keywords/miniaturization","display_name":"Miniaturization","score":0.44318053126335144},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.42553576827049255},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.35766875743865967},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29487088322639465},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28260764479637146}],"concepts":[{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.7801458835601807},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5244146585464478},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.517379641532898},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49226275086402893},{"id":"https://openalex.org/C57528182","wikidata":"https://www.wikidata.org/wiki/Q1271842","display_name":"Miniaturization","level":2,"score":0.44318053126335144},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.42553576827049255},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.35766875743865967},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29487088322639465},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28260764479637146},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc50364.2021.9459890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc50364.2021.9459890","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5799999833106995,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1973466307","https://openalex.org/W2023285254","https://openalex.org/W2108449055","https://openalex.org/W2150705456","https://openalex.org/W2151527553","https://openalex.org/W2161093625","https://openalex.org/W2166048468","https://openalex.org/W2167320299","https://openalex.org/W2284778013","https://openalex.org/W2790116484"],"related_works":["https://openalex.org/W2348807422","https://openalex.org/W2361025757","https://openalex.org/W2050837474","https://openalex.org/W2926730772","https://openalex.org/W1532462972","https://openalex.org/W2784209563","https://openalex.org/W2049043962","https://openalex.org/W1985414612","https://openalex.org/W1655828763","https://openalex.org/W2998102766"],"abstract_inverted_index":{"Direct":[0],"Current-Alternating":[1],"Current":[2],"(DC-AC)":[3],"converter":[4,52],"plays":[5],"a":[6],"key":[7,96],"role":[8],"in":[9],"modern":[10],"industry.":[11],"Due":[12],"to":[13,26,41,58,103,116],"the":[14,28,60,68,77,80,87,93,108,118],"trend":[15],"of":[16,20,31,70,76,95,107,120],"miniaturization":[17],"and":[18,73,86,91],"integration":[19],"converter,":[21],"it":[22],"is":[23,53,83,114],"much":[24],"harder":[25],"measure":[27],"internal":[29],"signal":[30],"converter.":[32,78],"This":[33],"paper":[34],"presents":[35],"an":[36,56,111],"excitation":[37,63,112],"method,":[38],"which":[39],"contributes":[40],"obtain":[42,104],"more":[43],"fault":[44,81],"features":[45],"from":[46],"output":[47,71,88,119],"characteristics.":[48],"A":[49],"three-phase":[50],"DC-AC":[51],"taken":[54],"as":[55],"example":[57],"illustrate":[59],"method.":[61],"Available":[62],"forms":[64],"are":[65,101],"discussed":[66],"on":[67],"basis":[69],"characteristics":[72,89],"test":[74],"conditions":[75],"Then":[79],"simulation":[82],"carried":[84],"out,":[85],"before":[90],"after":[92],"degradation":[94],"components":[97],"under":[98],"different":[99],"excitations":[100],"analyzed":[102],"appropriate":[105],"parameters":[106],"excitation.":[109,121],"Finally,":[110],"platform":[113],"designed":[115],"realize":[117]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}