{"id":"https://openalex.org/W4283716111","doi":"https://doi.org/10.1109/i2mtc48687.2022.9806670","title":"An Optimization Design of the Iron-core Coil Sensor for High-frequency Current Signals","display_name":"An Optimization Design of the Iron-core Coil Sensor for High-frequency Current Signals","publication_year":2022,"publication_date":"2022-05-16","ids":{"openalex":"https://openalex.org/W4283716111","doi":"https://doi.org/10.1109/i2mtc48687.2022.9806670"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc48687.2022.9806670","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc48687.2022.9806670","pdf_url":null,"source":{"id":"https://openalex.org/S4363607934","display_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061618095","display_name":"Lei Zhou","orcid":"https://orcid.org/0000-0003-0894-675X"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lei Zhou","raw_affiliation_strings":["Huazhong University of Science & Technology (HUST),School of Electrical & Electronic Engineering (SEEE),Wuhan,China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science & Technology (HUST),School of Electrical & Electronic Engineering (SEEE),Wuhan,China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088748090","display_name":"Yang Jiao","orcid":"https://orcid.org/0000-0002-1046-682X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yang Jiao","raw_affiliation_strings":["SEEE HUST,Wuhan,China","SEEE HUST, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"SEEE HUST,Wuhan,China","institution_ids":[]},{"raw_affiliation_string":"SEEE HUST, Wuhan, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100629271","display_name":"Hui Gong","orcid":"https://orcid.org/0000-0002-7833-433X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hui Gong","raw_affiliation_strings":["China Electrical Power Research Institute,Electric Equipment Test Center,Wuhan,China","Electric Equipment Test Center, China Electrical Power Research Institute, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"China Electrical Power Research Institute,Electric Equipment Test Center,Wuhan,China","institution_ids":[]},{"raw_affiliation_string":"Electric Equipment Test Center, China Electrical Power Research Institute, Wuhan, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100365819","display_name":"Hongbin Li","orcid":"https://orcid.org/0000-0003-3483-1307"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hongbin Li","raw_affiliation_strings":["SEEE HUST,Wuhan,China","SEEE HUST, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"SEEE HUST,Wuhan,China","institution_ids":[]},{"raw_affiliation_string":"SEEE HUST, Wuhan, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020013878","display_name":"Chaojun Ma","orcid":"https://orcid.org/0000-0002-9052-9172"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chaojun Ma","raw_affiliation_strings":["SEEE HUST,Wuhan,China","SEEE HUST, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"SEEE HUST,Wuhan,China","institution_ids":[]},{"raw_affiliation_string":"SEEE HUST, Wuhan, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075235514","display_name":"Chuanji Zhang","orcid":"https://orcid.org/0000-0002-3821-5467"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chuanji Zhang","raw_affiliation_strings":["SEEE HUST,Wuhan,China","SEEE HUST, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"SEEE HUST,Wuhan,China","institution_ids":[]},{"raw_affiliation_string":"SEEE HUST, Wuhan, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5061618095"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05711479,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"24","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.7267442941665649},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.6733744144439697},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5601938962936401},{"id":"https://openalex.org/keywords/magnetic-core","display_name":"Magnetic core","score":0.5339120030403137},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5049222111701965},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43450629711151123},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.43427127599716187},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.4298320412635803},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.42103540897369385},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3965400159358978},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3287971019744873},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32156074047088623},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15227064490318298},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1516144573688507}],"concepts":[{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.7267442941665649},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.6733744144439697},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5601938962936401},{"id":"https://openalex.org/C23832930","wikidata":"https://www.wikidata.org/wiki/Q1088161","display_name":"Magnetic core","level":3,"score":0.5339120030403137},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5049222111701965},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43450629711151123},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.43427127599716187},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.4298320412635803},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.42103540897369385},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3965400159358978},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3287971019744873},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32156074047088623},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15227064490318298},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1516144573688507}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc48687.2022.9806670","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc48687.2022.9806670","pdf_url":null,"source":{"id":"https://openalex.org/S4363607934","display_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7900000214576721,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2019249569","https://openalex.org/W2021038552","https://openalex.org/W2085934699","https://openalex.org/W2117411556","https://openalex.org/W2129890926","https://openalex.org/W2129952065","https://openalex.org/W2166028527","https://openalex.org/W2167131092","https://openalex.org/W3038969194"],"related_works":["https://openalex.org/W2387913980","https://openalex.org/W1975610155","https://openalex.org/W3006431574","https://openalex.org/W2086714986","https://openalex.org/W4223494749","https://openalex.org/W4386066121","https://openalex.org/W2772529342","https://openalex.org/W2377887547","https://openalex.org/W2025475783","https://openalex.org/W1957025633"],"abstract_inverted_index":{"In":[0],"a":[1],"wide":[2],"range":[3],"of":[4,10,31,84],"electrical":[5],"applications,":[6],"an":[7,53],"accurate":[8],"measurement":[9,30],"the":[11,29,36,51,67,102,105],"high-frequency":[12,32,47],"current":[13,33],"signal":[14],"is":[15,56],"urgently":[16],"required.":[17],"Owing":[18],"to":[19,28,81],"inherent":[20],"superiorities,":[21],"iron-core":[22],"coils":[23],"have":[24,44],"been":[25],"widely":[26],"applied":[27],"signals.":[34],"Nevertheless,":[35],"uneven":[37],"winding,":[38,73,85],"bandwidth-sensitivity":[39],"exclusion,":[40],"and":[41,61,74,89,97,101],"partial":[42,93],"resonances":[43],"restrict":[45],"better":[46,82],"characteristics.":[48],"To":[49],"address":[50],"issues,":[52],"optimization":[54],"design":[55],"proposed":[57],"in":[58],"this":[59],"paper,":[60],"it":[62],"includes":[63],"three":[64],"key":[65],"improvements:":[66],"Core-PCB":[68],"hybrid":[69],"structure,":[70],"staggered":[71],"secondary":[72],"distributed":[75],"sampling":[76],"resistances,":[77],"which":[78],"respectively":[79],"contribute":[80],"uniformity":[83],"smaller":[86],"stray":[87],"capacitances,":[88],"effective":[90],"suppression":[91],"on":[92],"resonances.":[94],"Moreover,":[95],"simulations":[96],"tests":[98],"are":[99],"conducted,":[100],"results":[103],"verify":[104],"validity.":[106]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}