{"id":"https://openalex.org/W4283723384","doi":"https://doi.org/10.1109/i2mtc48687.2022.9806659","title":"Research on a Novel Calibration Method of Broadband Shunt","display_name":"Research on a Novel Calibration Method of Broadband Shunt","publication_year":2022,"publication_date":"2022-05-16","ids":{"openalex":"https://openalex.org/W4283723384","doi":"https://doi.org/10.1109/i2mtc48687.2022.9806659"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc48687.2022.9806659","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc48687.2022.9806659","pdf_url":null,"source":{"id":"https://openalex.org/S4363607934","display_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100566295","display_name":"Ziyue Yang","orcid":"https://orcid.org/0009-0000-3035-4107"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ziyue Yang","raw_affiliation_strings":["Beijing University of Aeronautics and Astronautics,School of Automation Science and Electrical Engineering,Beijing,P. R. China","School of Automation Science and Electrical Engineering, Beijing University of Aeronautics and Astronautics, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Beijing University of Aeronautics and Astronautics,School of Automation Science and Electrical Engineering,Beijing,P. R. China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beijing University of Aeronautics and Astronautics, Beijing, P. R. China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101747724","display_name":"Jing Wu","orcid":"https://orcid.org/0000-0003-1713-7495"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Wu","raw_affiliation_strings":["Beijing University of Aeronautics and Astronautics,School of Automation Science and Electrical Engineering,Beijing,P. R. China","School of Automation Science and Electrical Engineering, Beijing University of Aeronautics and Astronautics, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Beijing University of Aeronautics and Astronautics,School of Automation Science and Electrical Engineering,Beijing,P. R. China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beijing University of Aeronautics and Astronautics, Beijing, P. R. China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001452215","display_name":"Haiming Shao","orcid":"https://orcid.org/0000-0002-3305-4190"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiming Shao","raw_affiliation_strings":["Institute of Metrology,Division of Electrical and Magnetic Metrology National,Beijing,P. R. China","Division of Electrical and Magnetic Metrology National, Institute of Metrology, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Metrology,Division of Electrical and Magnetic Metrology National,Beijing,P. R. China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":"Division of Electrical and Magnetic Metrology National, Institute of Metrology, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100765811","display_name":"Jiafu Wang","orcid":"https://orcid.org/0000-0003-1092-5712"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiafu Wang","raw_affiliation_strings":["Institute of Metrology,Division of Electrical and Magnetic Metrology National,Beijing,P. R. China","Division of Electrical and Magnetic Metrology National, Institute of Metrology, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Metrology,Division of Electrical and Magnetic Metrology National,Beijing,P. R. China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":"Division of Electrical and Magnetic Metrology National, Institute of Metrology, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100331160","display_name":"Lixin Wang","orcid":"https://orcid.org/0000-0002-9497-461X"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lixin Wang","raw_affiliation_strings":["Institute of Metrology,Division of Electrical and Magnetic Metrology National,Beijing,P. R. China","Division of Electrical and Magnetic Metrology National, Institute of Metrology, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Metrology,Division of Electrical and Magnetic Metrology National,Beijing,P. R. China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":"Division of Electrical and Magnetic Metrology National, Institute of Metrology, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210162136"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100566295"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.9673,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.67482151,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/broadband","display_name":"Broadband","score":0.8094279766082764},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.650475263595581},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6140674352645874},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5616487264633179},{"id":"https://openalex.org/keywords/shunt","display_name":"Shunt (medical)","score":0.4518331289291382},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.42565464973449707},{"id":"https://openalex.org/keywords/phase-difference","display_name":"Phase difference","score":0.41186168789863586},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.3550526201725006},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2299824357032776},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1859285831451416},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1754431128501892}],"concepts":[{"id":"https://openalex.org/C509933004","wikidata":"https://www.wikidata.org/wiki/Q194163","display_name":"Broadband","level":2,"score":0.8094279766082764},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.650475263595581},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6140674352645874},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5616487264633179},{"id":"https://openalex.org/C2780968331","wikidata":"https://www.wikidata.org/wiki/Q1890115","display_name":"Shunt (medical)","level":2,"score":0.4518331289291382},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.42565464973449707},{"id":"https://openalex.org/C3017413879","wikidata":"https://www.wikidata.org/wiki/Q185553","display_name":"Phase difference","level":3,"score":0.41186168789863586},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.3550526201725006},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2299824357032776},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1859285831451416},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1754431128501892},{"id":"https://openalex.org/C164705383","wikidata":"https://www.wikidata.org/wiki/Q10379","display_name":"Cardiology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc48687.2022.9806659","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc48687.2022.9806659","pdf_url":null,"source":{"id":"https://openalex.org/S4363607934","display_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1994367844","https://openalex.org/W2105560431","https://openalex.org/W2137352037","https://openalex.org/W2137596884","https://openalex.org/W2145967769","https://openalex.org/W2148251246","https://openalex.org/W2151940577","https://openalex.org/W2178540438","https://openalex.org/W2508144081","https://openalex.org/W2913951818"],"related_works":["https://openalex.org/W2391061712","https://openalex.org/W2094171095","https://openalex.org/W4231462422","https://openalex.org/W2018394392","https://openalex.org/W2360439310","https://openalex.org/W1979303977","https://openalex.org/W2546380746","https://openalex.org/W1972873205","https://openalex.org/W2527699603","https://openalex.org/W1990949930"],"abstract_inverted_index":{"Broadband":[0],"and":[1,23,55,61,81],"wide-range":[2],"shunts":[3],"have":[4],"been":[5],"widely":[6],"used":[7],"in":[8,32,104],"current":[9],"measurement":[10],"field.":[11],"The":[12],"existing":[13],"shunt":[14],"calibration":[15,44],"methods":[16],"based":[17],"on":[18],"thermal":[19],"conversion,":[20],"direct":[21],"comparison":[22],"vector":[24,52],"network":[25,53],"analyzer":[26,54],"cannot":[27],"satisfy":[28],"the":[29,47,51,67,72,82,89],"accuracy":[30],"requirement":[31],"a":[33,42],"broader":[34],"band":[35,94],"of":[36,50],"(>1":[37],"kHz).":[38],"This":[39],"paper":[40],"presents":[41],"novel":[43,68],"method":[45,69],"using":[46],"gain-phase":[48],"port":[49],"discusses":[56],"its":[57],"main":[58],"error":[59,62],"sources":[60],"correction":[63],"measures.":[64],"At":[65],"100kHz,":[66],"can":[70,95],"calibrate":[71],"AC-DC":[73],"difference":[74],"with":[75],"an":[76],"uncertainty":[77],"within":[78,85],"120":[79],"ppm":[80,87],"phase":[83],"angle":[84],"171":[86],"at":[88],"same":[90],"time.":[91],"Its":[92],"application":[93],"be":[96],"extended":[97],"to":[98],"100":[99],"kHz":[100],"~":[101],"1":[102],"MHz":[103],"future.":[105]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}